Variable sampling plan for resubmitted lots based on process capability index and Bayesian approach

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• 作者：Sina Seifi ; Mohammad Saber Fallah Nezhad
• 关键词：Process capability index ; Resubmitted lot ; Average sample number (ASN) ; Bayesian approach ; Exact approach
• 刊名：The International Journal of Advanced Manufacturing Technology
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：88
• 期：9-12
• 页码：2547-2555
• 全文大小：
• 刊物类别：Engineering
• 刊物主题：Industrial and Production Engineering; Media Management; Mechanical Engineering; Computer-Aided Engineering (CAD, CAE) and Design;
• 出版者：Springer London
• ISSN：1433-3015
• 卷排序：88

文摘

Acceptance sampling plans are applied for quality inspection of products. Among the design approaches of sampling plan, the most important one is to use process capability indices in order to improve the quality of manufacturing processes and the quality inspection of products. But, selection of estimators of process capability index and their sampling distribution is very important. Bayesian statistical technique can be used to obtain the sampling distribution. In this paper, a variable sampling plan is developed for resubmitted lots based on process capability index and Bayesian approach. In the proposed sampling plan, lots are inspected several times depending on the quality level of the process. In addition, this paper presents an optimization model for determining the decision parameters of developed sampling plan with regards to the constraints related to the risk of consumer and producer. Two comparison studied have been done including: First, the methods of double sapling plan (DSP), multiple dependent state (MDS) sampling plan, and repetitive group sampling (RGS) plan are elaborated, and also in order to comparing developed sampling plans, an expected number of products as average sample number (ASN) is used for different developed plans; second, a comparison study between Bayesian approach and exact probability distribution is carried out and their results are analyzed. It is observed that the ASN values of MDS sampling plan is less than ASN values of other methods, and also the ASN values of different variable sampling plans based on Bayesian approach is less than ASN values obtained using exact approach.