Thickness dependency of field emission in amorphous and nanostructured carbon thin films

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• 作者：Maziar Shakerzadeh (1)
  Edwin Hang Tong Teo (2)
  Beng Kang Tay (1) (3)
  
• 关键词：Carbon films ; Preferred orientation ; Field emission
• 刊名：Nanoscale Research Letters
• 出版年：2012
• 出版时间：December 2012
• 年：2012
• 卷：7
• 期：1
• 全文大小：320KB
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• 作者单位：Maziar Shakerzadeh (1)
  Edwin Hang Tong Teo (2)
  Beng Kang Tay (1) (3)
  
  1. School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore
  2. Temasek Laboratories, Nanyang Technological University, 50 Nanyang Avenue, Singapore, 639798, Singapore
  3. CINTRA, CNRS/NTU/THALES, UMI 3288, Research Techno Plaza, 50 Nanyang Drive, Border X Block, Level 6, Singapore, 637553, Singapore
  
• ISSN：1556-276X

文摘

Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp 2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp 2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp 2-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission.