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Fast and reliable identification of atomically thin layers of TaSe2 crystals
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  • 作者:Andres Castellanos-Gomez (1295)
    Efrén Navarro-Moratalla (2295)
    Guillermo Mokry (3295)
    Jorge Quereda (3295)
    Elena Pinilla-Cienfuegos (2295)
    Nicolás Agra?t (3295) (4295)
    Herre S. J. van der Zant (1295)
    Eugenio Coronado (2295)
    Gary A. Steele (1295)
    Gabino Rubio-Bollinger (3295)
  • 关键词:atomically thin layer ; metal dichalcogenide ; layered superconductor ; TaSe2 ; optical microscopy ; Raman spectroscopy
  • 刊名:Nano Research
  • 出版年:2013
  • 出版时间:March 2013
  • 年:2013
  • 卷:6
  • 期:3
  • 页码:191-199
  • 全文大小:729KB
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  • 作者单位:Andres Castellanos-Gomez (1295)
    Efrén Navarro-Moratalla (2295)
    Guillermo Mokry (3295)
    Jorge Quereda (3295)
    Elena Pinilla-Cienfuegos (2295)
    Nicolás Agra?t (3295) (4295)
    Herre S. J. van der Zant (1295)
    Eugenio Coronado (2295)
    Gary A. Steele (1295)
    Gabino Rubio-Bollinger (3295)

    1295. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ, Delft, The Netherlands
    2295. Instituto Ciencia Molecular (ICMol), Univ. Valencia, C/Catedrático José Beltrán 2, E-46980, Paterna, Spain
    3295. Departamento de Física de la Materia Condensada (C-III), Universidad Autónoma de Madrid, Campus de Cantoblanco, 28049, Madrid, Spain
    4295. Instituto Madrile?o de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, E-28049, Madrid, Spain
  • ISSN:1998-0000
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