参考文献:1. E. Ozbay, Science 311(5758), 189 (2006) CrossRef 2. H. Raether, / Surface Plasmons on Smooth and Rough Surfaces and on Gratings, 1st edn. (Springer, Berlin/Heidelberg, 1988), pp. 4- 3. A. Politano, V. Formoso, G. Chiarello, Plasmonics 3(4), 165 (2008) CrossRef 4. K. Wang, D. Mittleman, Phys. Rev. Lett. 96(15), 157401 (2006) CrossRef 5. G. Schider, J. Krenn, A. Hohenau, H. Ditlbacher, A. Leitner, F. Aussenegg, W. Schaich, I. Puscasu, B. Monacelli, G. Boreman, Phys. Rev. B 68(15), 155427 (2003) CrossRef 6. M. Shibuta, T. Eguchi, A. Nakajima, Plasmonics 8(3), 1411-415 (2013) CrossRef 7. T. Lei?ner, C. Lemke, J. Fiutowski, J.W. Radke, A. Klick, L. Tavares, J. Kjelstrup-Hansen, H.G. Rubahn, M. Bauer, Phys. Rev. Lett. 111(4), 46802 (2013) CrossRef 8. T. Lei?ner, C. Lemke, S. Jauernik, M. Müller, J. Fiutowski, L. Tavares, K. Thilsing-Hansen, J. Kjelstrup-Hansen, O. Magnussen, H.G. Rubahn, M. Bauer, Opt. Express 21(7), 8251 (2013) CrossRef 9. I.P. Radko, J. Fiutowski, L. Tavares, H.G. Rubahn, S.I. Bozhevolnyi, Opt. Express 19(16), 15155 (2011) CrossRef 10. F. Balzer, V. Bordo, A. Simonsen, H.G. Rubahn, Phys. Rev. B 67(11), 115408 (2003) CrossRef 11. W. Swiech, G. Fecher, C. Ziethen, O. Schmidt, G. Sch?nhense, K. Grzelakowski, C.M. Schneider, R. Fr?mter, H. Oepen, J. Kirschner, J. Electron Spectros. Relat. Phenomena. 84(1-), 171 (1997) CrossRef 12. O. Schmidt, M. Bauer, C. Wiemann, R. Porath, M. Scharte, O. Andreyev, G. Sch?nhense, M. Aeschlimann, Appl. Phys. B Lasers Opt. 74(3), 223 (2002) CrossRef 13. L. Douillard, F. Charra, Z. Korczak, R. Bachelot, S. Kostcheev, G. Lerondel, P.M. Adam, P. Royer, Nano Lett. 8(3), 935 (2008) CrossRef 14. M. Cinchetti, A. Gloskovskii, S. Nepjiko, G. Sch?nhense, H. Rochholz, M. Kreiter, Phys. Rev. Lett. 95(4), 47601 (2005) CrossRef 15. C. Lemke, T. Lei?ner, S. Jauernik, A. Klick, J. Fiutowski, J. Kjelstrup-Hansen, H.G. Rubahn, M. Bauer, Opt. Express 20(12), 12877 (2012) CrossRef 16. F. Meyerzu Heringdorf, N. Buckanie, Microsc. Microanal. 16(S2), 502 (2010) CrossRef 17. T. Lei?ner, K. Thilsing-Hansen, C. Lemke, S. Jauernik, J. Kjelstrup-Hansen, M. Bauer, H.G. Rubahn, Plasmonics 7(2), 253 (2011) CrossRef 18. A. Kubo, N. Pontius, H. Petek, Nano Lett. 7(2), 470 (2007) CrossRef 19. R. Olmon, B. Slovick, T. Johnson, D. Shelton, S.H. Oh, G. Boreman, M. Raschke, Phys. Rev. B 86(23), 235147 (2012) CrossRef 20. P.B. Johnson, R.W. Christy, Phys. Rev. B 6(12), 4370 (1972) CrossRef 21. L. Zhang, A. Kubo, L. Wang, H. Petek, T. Seideman, Phys. Rev. B 84(24), 245442 (2011) CrossRef 22. C. Lemke, C. Schneider, T. Lei?ner, D. Bayer, J.W. Radke, A. Fischer, P. Melchior, A.B. Evlyukhin, B.N. Chichkov, C. Reinhardt, M. Bauer, M. Aeschlimann, Nano Lett. 13(3), 1053 (2013) CrossRef 23. S.A. Nepijko, N.N. Sedov, G. Sch?nhense, M. Escher, X. Bao, W. Huang, Annalen Der Physik 9(6), 441 (2000) CrossRef 24. P. Lalanne, Surf. Sci. Rep. 64(10), 453 (2009) 25. T. Holmgaard, S. Bozhevolnyi, Phys. Rev. B 75(24), 245405 (2007) CrossRef 26. A. Niko, S. Tasch, F. Meghdadi, C. Brandstatter, G. Leising, C. Brandst?tter, J. Appl. Phys. 82(9), 4177 (1997) CrossRef 27. V. Bordo, Phys. Rev. B 73(20), 205117 (2006) CrossRef 28. R.M. de Oliveira Hansen, J. Kjelstrup-Hansen, H.G. Rubahn, Nanoscale 2(1), 134 (2010) CrossRef 29. E. Zojer, M. Knupfer, R. Resel, F. Meghdadi, G. Leising, J. Fink, Phys. Rev. B 56(16), 10138 (1997) CrossRef 30. F. Tr?ger (ed.), / Springer Handbook of Lasers and Optics (Springer, New York, 2007) 31. R.F. Egerton, P. Li, M. Malac, Micron (Oxford, England, 1993) 35(6), 399 (2004)
作者单位:Christoph Lemke (1) Till Lei?ner (1) Alwin Klick (1) Jacek Fiutowski (2) J?rn Willers Radke (1) Martin Thomaschewski (1) Jakob Kjelstrup-Hansen (2) Horst-Günter Rubahn (2) Michael Bauer (1)
1. IEAP, University of Kiel, Leibnizstr. 19, 24118, Kiel, Germany 2. Mads Clausen Institute, University of Southern Denmark, NanoSYD Alsion 2, 6400, S?nderborg, Denmark
ISSN:1432-0649
文摘
Two-photon photoemission electron microscopy (2P-PEEM) is used to measure the real and imaginary part of the dispersion relation of surface plasmon polaritons at different interface systems. A comparison of calculated and measured dispersion data for a gold/vacuum interface demonstrates the capability of the presented experimental approach. A systematic 2P-PEEM study on the dispersion relation of dielectric-loaded gold surfaces shows how effective the propagation of surface plasmon polaritons at a gold/para-hexaphenylene interface can be tuned by adjustment of the dielectric film thickness. Deviations of the experimental results from effective index calculations indicate the relevance of thin film peculiarities arising from the details of the growth process and corroborate the need of experimental analysis techniques for dispersion relation measurements.