Influence of Zr/Ti Ratio on the Microwave Dielectric Behavior of xZrO2-0.4(Zn1/3Nb2/3)O2-
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- 作者：Zhiyuan Cui ; Chunying Shen ; Tai Qiu
- 关键词：Zr/Ti ratio ; xZrO2 ; 0.4(Zn1/3Nb2/3)O2 ; yTiO2 ceramics ; dielectric properties ; quality factor
- 刊名：Journal of Electronic Materials
- 出版年：2015
- 出版时间：January 2015
- 年：2015
- 卷：44
- 期：1
- 页码：320-325
- 全文大小：1,224 KB
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文摘
xZrO2-0.4(Zn1/3Nb2/3)O2-yTiO2 (x + y + 0.4 = 2, x/y = 7/9, 8/8, 9/7, and 10/6, denoted as Z7T9, Z8T8, Z9T7, and Z10T6, respectively) ceramics were prepared by the conventional solid-state ceramic route. The objective of the present work is to determine an excellent Zr/Ti ratio for the xZrO2-0.4(Zn1/3Nb2/3)O2-yTiO2 system. The microstructure and microwave dielectric properties have been investigated as functions of the Zr/Ti ratio and sintering temperature. The crystalline phases of the (Zn1/3Nb2/3)4+-doped ZrO2-TiO2 ceramics depended greatly on the Zr/Ti ratio. The samples with Zr/Ti ratio of 7/9 and 8/8 crystallized as columbite-type-structured ZrTi2O6 phase, while the samples with Zr/Ti ratio of 9/7 and 10/6 crystallized in orthorhombic α-PbO2 ZrTiO4 structure. Secondary phase of monoclinic ZrO2 appeared when the Zr/Ti ratio was high at 10/6. Scanning electron microscopy (SEM) analysis demonstrated that dense ceramics were obtained, with increasing average grain size as the Zr/Ti ratio was increased. The microwave dielectric properties, especially the quality factor (Q×f) and temperature coefficient of resonance frequency(τ f ) values, were sensitive to the Zr/Ti ratio. The 0.8ZrO2-0.4(Zn1/3Nb2/3)O2-0.8TiO2 ceramic sintered at 1320°C for 3 h exhibited an excellent combination of microwave dielectric properties with dielectric constant (ε r) of 40.89, Q×f of 43,300 GHz, and τ f of ?.8 ppm/°C.