Combinatory use of time-of-flight secondary ion mass spectrometry (SIMS) and sector-field SIMS for estimating elemental and isotopic compositions of nuclear forensic samples

详细信息    查看全文

• 作者：Jinkyu Park ; Tae Hee Kim ; Chi-Gyu Lee…
• 关键词：Nuclear forensics ; Secondary ion mass spectrometry ; Uranium ; Elemental composition ; Isotope ratio ; Isobaric interference
• 刊名：Journal of Radioanalytical and Nuclear Chemistry
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：311
• 期：2
• 页码：1535-1544
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Nuclear Chemistry; Physical Chemistry; Nuclear Physics, Heavy Ions, Hadrons; Diagnostic Radiology; Inorganic Chemistry;
• 出版者：Springer Netherlands
• ISSN：1588-2780
• 卷排序：311

文摘

This paper describes an alternative approach to nuclear forensic analysis by employing time-of-flight (TOF) SIMS and sector-field (SF) SIMS collaboratively. A set of synthetic samples consisting of UO₂ and other metal (Gd, Mo or Zr) oxide was analyzed by the both instruments. With TOF–SIMS, qualitative elemental analysis was possible in U-dominant or low-U samples. TOF–SIMS was also useful for investigating potential isobars for U isotopes induced by the other metals. To avoid the isobaric interferences, particle search and major U isotope analysis using SF–SIMS were performed by measuring UO₂+ instead of U+, and thus the effects of interference were reduced.