Down-conversion luminescence and its temperature-sensing properties from Er3+-doped sodium bismuth titanate ferroelectric thin films

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• 作者：Shanshan Wang ; Shanshan Zheng ; Hong Zhou ; Anlian Pan ; Guangheng Wu…
• 刊名：Applied Physics A: Materials Science & Processing
• 出版年：2015
• 出版时间：November 2015
• 年：2015
• 卷：121
• 期：2
• 页码：773-777
• 全文大小：1,473 KB
• 参考文献：1.Y.B. Wei, Z. Wu, Y.M. Jia, J. Wu, Y.C. Shen, H.S. Luo, Appl. Phys. Lett. 105, 042902 (2014)CrossRef ADS
  2.P. Molina, H. Loro, S. Alvarez-Garcia, L.E. Bausa, E.M. Rodriguez, O. Guillot-Noel, P. Goldner, M. Bettinelli, P. Ghigna, J.G. Sole, Phys. Rev. B 80, 05411 (2009)CrossRef
  3.J. Hao, Y. Zhang, X. Wei, Angew Chem. Int. Ed. 50, 6876-880 (2011)CrossRef
  4.F. Gao, G.J. Ding, H. Zhou, G.H. Wu, N. Qin, D.H. Bao, J. Electrochem. Soc. 158, G128–G131 (2011)CrossRef
  5.H. Zhou, X.M. Chen, G.H. Wu, F. Gao, N. Qin, D.H. Bao, J. Am. Chem. Soc. 132, 1790-791 (2010)CrossRef
  6.R.C. Lima, J.W.M. Espinosa, M.F.C. Gurgel, E.C. Paris, E.R. Leite, M.R. Joya, P.S. Pizani, J.A. Varela, E. Longo, J. Appl. Phys. 100, 034917 (2006)CrossRef ADS
  7.Z. Wu, Y. Zhang, G. Bai, W. Tang, J. Gao, J. Hao, Opt. Express 22, 29014-9019 (2014)CrossRef ADS
  8.R. Reshmi, M.K. Jayaraj, K. Jithesh, M.T. Sebastian, J. Electrochem. Soc. 157, H783–H786 (2010)CrossRef
  9.X. Liu, H. Zhou, G.H. Wu, D.H. Bao, Appl. Phys. Express 4, 032103 (2011)CrossRef ADS
  10.H. Zhou, G.H. Wu, N. Qin, D.H. Bao, J. Am. Ceram. Soc. 93, 2109-112 (2010)CrossRef
  11.H. Zhou, X. Liu, N. Qin, D.H. Bao, J. Appl. Phys. 110, 034102 (2011)CrossRef ADS
  12.X.Y. Huang, X.H. Ji, Q.Y. Zhang, J. Am. Ceram. Soc. 94, 833-37 (2011)CrossRef
  13.B. Xu, G. Bai, J. Wang, Q. Guo, D. Tan, W. Chen, X. Liu, S. Zhou, J. Hao, J. Qiu, Opt. Lett. 39, 3022-025 (2014)CrossRef ADS
  14.B.N. Rao, R. Ranjan, Phys. Rev. B 86, 134103 (2012)CrossRef ADS
  15.D. Schütz, M. Deluca, W. Krauss, A. Feteira, T. Jackson, K. Reichmann, Adv. Funct. Mater. 22, 2285-294 (2012)CrossRef
  16.H. Zhou, G.H. Wu, N. Qin, D.H. Bao, J. Am. Ceram. Soc. 95, 483-86 (2012)CrossRef
  17.J.-C. Zhang, X. Wang, X. Yao, C.-N. Xu, H. Yamada, J. Electrochem. Soc. 157, G269–G273 (2010)CrossRef
  18.X.S. Wang, C.N. Xu, H. Yamada, K. Nishikubo, X.G. Zheng, Adv. Mater. 17, 1254-258 (2005)CrossRef
  19.P. Zhang, M. Shen, L. Fang, F. Zheng, X. Wu, J. Shen, H. Chen, Appl. Phys. Lett. 92, 222903-22908 (2008)CrossRef ADS
  20.P. Du, L.H. Luo, W.P. Li, Q.Y. Yue, J. Appl. Phys. 116, 014102 (2014)CrossRef ADS
  21.H. Zhou, S.S. Wang, G.H. Wu, X.L. Zhu, X.X. Wang, A.L. Pan, Appl. Phys. A 119, 937-40 (2015)CrossRef ADS
  22.N. Niu, F. He, S. Gai, C. Li, X. Zhang, S. Huang, P. Yang, J. Mater. Chem. 22, 21613-1623 (2012)CrossRef
  23.T. Huang, Z.G. Hu, G.S. Xu, X.L. Zhang, J.Z. Zhang, J.H. Chu, Appl. Phys. Lett. 104, 111908 (2014)CrossRef ADS
  24.M. Otoni?ar, S.D. ?kapin, B. Jan?ar, D. Suvorov, J. Appl. Phys. 113, 024106 (2013)CrossRef ADS
  25.H.B. Zhang, S.L. Jiang, K. Kajiyoshi, J.Z. Xiao, J. Am. Ceram. Soc. 93, 750-57 (2010)CrossRef
  26.K.B. Ruan, X.M. Chen, T. Liang, G.H. Wu, D.H. Bao, J. Appl. Phys. 103, 086104 (2008)CrossRef ADS
  27.F. Gao, G.J. Ding, H. Zhou, G.H. Wu, N. Qin, D.H. Bao, J. Appl. Phys. 109, 043106 (2011)CrossRef ADS
  28.F. Vetrone, R. Naccache, A. Zamarron, A.J.D.L. Fuente, F. Sanz-Rodriguez, L. Martinez Maestro, E. Martin Rodriguez, D. Jaque, J. Garcia Sole, J.A. Capobianco, ACS Nano 4, 3254-258 (2010)CrossRef
  29.E. Maurice, G. Monnom, B. Dussardier, A. Sa?ssy, D.B. Ostrowsky, G.W. Baxter, Appl. Opt. 34, 8019-025 (1995)CrossRef ADS
  30.S.Y. Gong, M. Li, Z.H. Ren, X. Yang, X. Li, G. Shen, G.R. Han, J. Phys. Chem. C 119, 17326-7333 (2015)CrossRef
  
• 作者单位：Shanshan Wang (1)
  Shanshan Zheng (1)
  Hong Zhou (1)
  Anlian Pan (1)
  Guangheng Wu (2)
  Jun-ming Liu (2)
  
  1. School of Physics and Electronics, Hunan University, Changsha, 410082, China
  2. State Key Laboratory for Solid State Microstructures, Nanjing University, Nanjing, 210093, China
  
• 刊物类别：Physics and Astronomy
• 刊物主题：Physics
  Condensed Matter
  Optical and Electronic Materials
  Nanotechnology
  Characterization and Evaluation Materials
  Surfaces and Interfaces and Thin Films
  Operating Procedures and Materials Treatment
  
• 出版者：Springer Berlin / Heidelberg
• ISSN：1432-0630

文摘

Here, we demonstrate outstanding temperature-sensing properties from Na_0.5Bi_0.49Er_0.01TiO₃ (NBT:Er) thin films. The perovskite phase for them is stable in the temperature range from 80 to 440 K. Interestingly, the Er doping enhances the ferroelectric polarization and introduces local dipolar, which are positive for temperature sensing. Pumped by a 488-nm laser, the NBT:Er thin films show strong green luminescence with two bands around 525 and 548 nm. The intensity ratio I ₅₂₅/I ₅₄₈ can be used for temperature sensing, and the maximum sensitivity is about 2.3 × 10? K?, higher than that from Er-doped silicon oxide. These suggest NBT:Er thin film is a promising candidate for temperature sensor.