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Stable self-polarization in Nd and Ti codoped BiFeOplus-plus">3 films
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  • 作者:P. P. Lv ; X. M. Jiang ; J. Yan ; G. D. Hu
  • 刊名:Journal of Materials Science: Materials in Electronics
  • 出版年:2017
  • 出版时间:January 2017
  • 年:2017
  • 卷:28
  • 期:2
  • 页码:2233-2240
  • 全文大小:
  • 刊物类别:Chemistry and Materials Science
  • 刊物主题:Optical and Electronic Materials; Characterization and Evaluation of Materials;
  • 出版者:Springer US
  • ISSN:1573-482X
  • 卷排序:28
文摘
Nd (3 %) and Ti (2 %) codoped BiFeO3 (BNFTO) films with different layer and film thicknesses were deposited on LaNiO3(100)/Si substrates using a metal organic decomposition method. The BNFTO films show a highly (100)-preferred orientation. The hysteresis loops of both films are asymmetric with negatively imprinted polarizations, suggesting that both samples are self-polarized regardless of the layer and film thicknesses. More importantly, the P–phasisTypeItalic ">E hysteresis loops for both films can recover to their asymmetric shapes after high-field measurements, indicating the self-polarizations are quite stable. These results are explained based on the stabilization of the defect complexes. The effects of the self-polarization on the leakage, dielectric and piezoelectric properties of the BNFTO films are investigated.

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