Multi-objective optimal design of high frequency probe for scanning ion conductance microscopy
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- 作者：Renfei Guo ; Jian Zhuang ; Li Ma ; Fei Li…
- 关键词：scanning ion conductance microscopy(SICM) ; multi ; objective optimization ; high frequency probe ; finite element analysis ; imaging quality
- 刊名：Chinese Journal of Mechanical Engineering
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：29
- 期：1
- 页码：195-203
- 全文大小：1,956 KB
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Jian Zhuang (1)
Li Ma (2) (3)
Fei Li (2) (3)
Dehong Yu (1)
1. School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049, China
2. School of Science, Xi’an Jiaotong University, Xi’an, 710049, China
3. Bioinspired Engineering and Biomechanics Center(BEBC), Xi’an Jiaotong University, Xi’an, 710049, China - 刊物主题：Mechanical Engineering; Theoretical and Applied Mechanics; Manufacturing, Machines, Tools; Engineering Thermodynamics, Heat and Mass Transfer; Power Electronics, Electrical Machines and Networks; Electronics and Microelectronics, Instrumentation;
- 出版者：Springer Berlin Heidelberg
- ISSN：2192-8258
文摘
Scanning ion conductance microscopy(SICM) is an emerging non-destructive surface topography characterization apparatus with nanoscale resolution. However, the low regulating frequency of probe in most existing modulated current based SICM systems increases the system noise, and has difficulty in imaging sample surface with steep height changes. In order to enable SICM to have the capability of imaging surfaces with steep height changes, a novel probe that can be used in the modulated current based hopping mode is designed. The design relies on two piezoelectric ceramics with different travels to separate position adjustment and probe frequency regulation in the Z direction. To further improve the resonant frequency of the probe, the material and the key dimensions for each component of the probe are optimized based on the multi-objective optimization method and the finite element analysis. The optimal design has a resonant frequency of above 10 kHz. To validate the rationality of the designed probe, microstructured grating samples are imaged using the homebuilt modulated current based SICM system. The experimental results indicate that the designed high frequency probe can effectively reduce the spike noise by 26% in the average number of spike noise. The proposed design provides a feasible solution for improving the imaging quality of the existing SICM systems which normally use ordinary probes with relatively low regulating frequency. Keywords scanning ion conductance microscopy(SICM) multi-objective optimization high frequency probe finite element analysis imaging quality