Interfacial characteristic of (Ba,Sr)TiO₃ thin films deposited on different bottom electrodes

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• 作者：Jinzhao Wang ; Tianjin Zhang ; Baishun Zhang ; Juan Jiang ; Ruikun Pan and Zhijun Ma
• 刊名：Journal of Materials Science: Materials in Electronics
• 出版年：2009
• 出版时间：December, 2009
• 年：2009
• 卷：20
• 期：12
• 页码：1208-1213
• 全文大小：359.1 KB

文摘

Barium strontium titanate (Ba_1−x Sr _x )TiO₃ (BST) thin films were deposited on Pt, Ru, RuO₂, and Pt/RuO₂ electrodes by radio frequency magnetron sputtering. The interfacial structure characteristic of the BST films deposited on various electrodes was investigated. X-ray photoelectron spectroscopy investigations showed that the interfacial diffusion layer in BST/Pt and BST/Ru are approximately 6 and 10 nm, respectively. The BST films are short of Ba and O elements comparing with the stoichiometry Ba_0.65Sr_0.35TiO₃ in the interface region. Dielectric measurement of the BST films with thickness ranging from 70 to 400 nm revealed that the BST films deposited on Pt and Pt/RuO₂ bottom electrodes have similar dielectric property, the BST films deposited on Ru have the highest bulk dielectric constant, and the thickness dependence of dielectric constant on the BST film deposited on RuO₂ electrode can be neglected. The interfacial layer dielectric constant of BST films deposited on Pt and Ru electrodes are estimated to be about 34.5 and 157.1, respectively. The effect of interfacial dead-layer on the dielectric constant could be eliminated through selecting appropriate bottom electrodes.