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Studies of Interfacial Layer and Its Effect on Magnetic Properties of Glass-Coated Microwires
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  • 作者:Arcady Zhukov ; Evgenia Shuvaeva ; Sergei Kaloshkin…
  • 关键词:Magnetic glass ; coated microwires ; amorphous materials ; nanocrystallization ; giant magnetoimpedance effect ; soft magnetic properties ; Taylor–Ulitovsky technique
  • 刊名:Journal of Electronic Materials
  • 出版年:2016
  • 出版时间:May 2016
  • 年:2016
  • 卷:45
  • 期:5
  • 页码:2381-2387
  • 全文大小:1,158 KB
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  • 作者单位:Arcady Zhukov (1) (2) (3)
    Evgenia Shuvaeva (4)
    Sergei Kaloshkin (4)
    Margarita Churyukanova (4)
    Elena Kostitsyna (4)
    Margarita Zhdanova (4)
    Ahmed Talaat (1) (2)
    Mihail Ipatov (1) (2)
    Valentina Zhukova (1) (2)

    1. Department of Physics of Materials, Basque Country University, UPV/EHU, San Sebastián, Spain
    2. Dpto. de Física Aplicada, EUPDS, UPV/EHU, 20018, San Sebastián, Spain
    3. IKERBASQUE, Basque Foundation for Science, 48011, Bilbao, Spain
    4. National University of Science and Technology «MISIS», Moscow, Russia, 119049
  • 刊物类别:Chemistry and Materials Science
  • 刊物主题:Chemistry
    Optical and Electronic Materials
    Characterization and Evaluation Materials
    Electronics, Microelectronics and Instrumentation
    Solid State Physics and Spectroscopy
  • 出版者:Springer Boston
  • ISSN:1543-186X
文摘
We present studies of the interfacial layer between the metallic nucleus and glass coating in ferromagnetic Fe- and Co-rich microwires. Using a scanning electron microscope, we obtained the image of the interfacial layer and the elements distribution within the glass coating and metallic nucleus. This allowed us to estimate the thickness of the interfacial layer (t il). For both Fe- and Co-rich microwires, t il ≈ 0.5 μm. We measured the frequency dependence of the giant magnetoimpedance ratio in Fe and Co-rich microwires, estimated the minimum penetration depth, and discussed the optimum frequency for different microwires considering the difference of the magnetic structure and the magnetic anisotropy inside the microwire and near the surface.

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