Interplay Between Microscopic Structure and Intermolecular Charge-Transfer Processes in Polymer–Fullerene Bulk Heterojunctions

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• 关键词：AFM ; Atomic force microscopy ; Bulk heterojunction ; Charge ; transfer states ; CTS ; Depth profiling ; EPR ; Nanomechanical properties ; ODMR ; OPV ; Organic photovoltaics ; Polymer surfaces ; Triplet excitons ; Volume imaging
• 刊名：Advances in Polymer Science
• 出版年：2017
• 出版时间：2017
• 年：2017
• 卷：272
• 期：1
• 页码：139-155
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• 作者单位：Vladimir Dyakonov (20)
  Hannes Kraus (20)
  Andreas Sperlich (20)
  Robert Magerle (21)
  Mario Zerson (21)
  Martin Dehnert (21)
  
  20. Fakultät für Physik und Astronomie, Julius-Maximilian Universität Würzburg, Am Hubland, 97074, Würzburg, Germany
  21. Fakultät für Naturwissenschaften, Technische Universität Chemnitz, Reichenhainer Straße 70, 09126, Chemnitz, Germany
  
• 丛书名：Elementary Processes in Organic Photovoltaics
• ISBN：978-3-319-28338-8
• 卷排序：272

文摘

We provide an overview of the development and application of nonconventional techniques that allowed us to probe the molecular excited states in conjugated polymers with respect to their molecular orientation and the nanomechanical properties of the topmost surface layer. To probe triplet and charge-transfer excited states and their fate, we applied the optically detected magnetic resonance technique extended for angular resolution. The surface morphology and three-dimensional depth profiles of the topmost surface layer were obtained with multi-set point intermittent contact mode atomic force microscopy. These studies were performed on model systems such as poly(3-hexylthiophene) as well as on the novel, low-bandgap copolymer poly[(4,8-bis-(2-ethylhexyloxy)-benzo(1,2-b:4,5-b9)dithiophene)-2,6-diyl-alt-(4-(2-ethylhexyl)-3-fluorothieno[3,4-b]thiophene-)-2-carboxylate-2-6-diyl)].