Effects of Al, Pr additions on the wettability and interfacial reaction of Zn–25Sn solder on Cu substrate

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• 作者：Xi Niu ; Kwang-Lung Lin
• 刊名：Journal of Materials Science: Materials in Electronics
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：28
• 期：1
• 页码：105-113
• 全文大小：
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Optical and Electronic Materials; Characterization and Evaluation of Materials;
• 出版者：Springer US
• ISSN：1573-482X
• 卷排序：28

文摘

Zn–25Sn alloy suffers from easy oxidation during soldering. This study investigated the feasibility of Al and rare earth Pr addition for enhancing the wettability of the Zn–25Sn solder. The wettability and interfacial reaction of Zn–25Sn, Zn–25Sn–0.05Al, Zn–25Sn–0.05Al–XPr (X = 0.01, 0.05, 0.08, 0.15 wt%) on Cu substrate were investigated. The additions of 0.05 wt% Al in Zn–25Sn and 0.01, 0.05 wt% Pr in Zn–25Sn–0.05Al enhanced the wettability of solders and depressed the growth of intermetallic compounds. However, the additions of 0.08, 0.15 wt% Pr in Zn–25Sn–0.05Al degraded the wettability and enhanced the growth of the intermetallic compound. Pr and Al were shown to accumulate at the surface of solders and the interfaces between solder and substrate by the Secondary Ion Mass Spectroscopy, Scanning Electron Microscope and Transmission Electron Microscopy. The phases PrZn₃, Pr₃Sn₅ and (Cu, Al)₄Zn were formed at the solder/substrate interface.