Varied absorption peaks of dual-band metamaterial absorber analysis by using reflection theory

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• 作者：Han Xiong ; Yan-Tao Yu ; Ming-Chun Tang ; Shi-Yong Chen ; Dan-Ping Liu…
• 刊名：Applied Physics A: Materials Science & Processing
• 出版年：2016
• 出版时间：March 2016
• 年：2016
• 卷：122
• 期：3
• 全文大小：830 KB
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• 作者单位：Han Xiong (1)
  Yan-Tao Yu (1)
  Ming-Chun Tang (1)
  Shi-Yong Chen (1)
  Dan-Ping Liu (1)
  Xiang Ou (1)
  Hao Zeng (1)
  
  1. College of Communication Engineering, Chongqing University, Chongqing, 400044, China
  
• 刊物类别：Physics and Astronomy
• 刊物主题：Physics
  Condensed Matter
  Optical and Electronic Materials
  Nanotechnology
  Characterization and Evaluation Materials
  Surfaces and Interfaces and Thin Films
  Operating Procedures and Materials Treatment
  
• 出版者：Springer Berlin / Heidelberg
• ISSN：1432-0630

文摘

Cross-resonator metamaterial absorbers (MMA) have been widely investigated from microwave to optical frequencies. However, only part of the factors influencing the absorption properties were analyzed in previous works at the same time. In order to completely understand how the spacer thickness, dielectric parameter and incidence angle affect the absorption properties of the dual-band MMA, two sets of simulation were performed. It was found that with increasing incident angles, the low-frequency absorption peak showed a blue shift, while the high-frequency absorption peaks showed a red shift. However, with the increase in spacer thickness, both of the absorption peaks showed a red shift. By using the reflection theory expressions, the physical mechanism of the cross-resonator MMA was well explained. This method provides an effective way to analyze multi-band absorber in technology.