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Precursor state of oxygen molecules on the Si(001) surface during the initial room-temperature adsorption
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  • 作者:Eunkyung Hwang (1)
    Yun Hee Chang (1)
    Yong-Sung Kim (1)
    Ja-Yong Koo (1)
    Hanchul Kim (2)
  • 关键词:Silicon surface ; Oxygen molecule ; Precursor ; Initial adsorption ; Sticking Coefficient ; Room temperature
  • 刊名:Journal of the Korean Physical Society
  • 出版年:2012
  • 出版时间:October 2012
  • 年:2012
  • 卷:61
  • 期:7
  • 页码:1046-1050
  • 全文大小:245KB
  • 参考文献:1. M. P. D’evelyn, M. M. Nelson and T. Engel, Surf. Sci. 186, 75 (1987). CrossRef
    2. T. Miyake, S. Soeki, H. Kato, T. Nakamura, A. Namiki, H. Kamba and T. Suzaki, Phys. Rev. B 42, 11801 (1990). CrossRef
    3. E. R. Behringer, H. C. Flaum, D. J. D. Sullivan, D. P. Masson, E. J. Lanzendorf and A. C. Kemmel, J. Phys. Chem. 99, 12863 (1995). CrossRef
    4. B. A. Ferguson, C. T. Reeves and C. B. Mullins, J. Chem. Phys. 110, 11574 (1999). CrossRef
    5. Y. J. Chabal, K. Raghavachari, X. Zhang and E. Garfunkel, Phys. Rev. B 66, 161315(R) (2002). CrossRef
    6. M. L. Yu and B. N. Eldridge, Phys. Rev. Lett. 58, 1691 (1987). CrossRef
    7. T. Miyake, S. Soeki, H. Kato, T. Nakamura, A. Namiki, H. Kamba and T. Suzaki, Surf. Sci. 242, 386 (1991). CrossRef
    8. U. Memmert and M. L. Yu, Surf. Sci. 245, L185 (1991). CrossRef
    9. T. Engel, Surf. Sci. Rep. 18, 91 (1993). CrossRef
    10. C. Silvestre and M. Shayegan, Solid State Commun. 77, 735 (1991). CrossRef
    11. G. Comtet, K. Bobrov, L. Hellner and G. Dujardin, Phys. Rev. B 69, 155315 (2004). CrossRef
    12. T. Hoshino, M. Tsuda, S. Oikawa and I. Ohdomari, Surf. Sci. 291, L763 (1993). CrossRef
    13. T. Hoshino, M. Tsuda, S. Oikawa and I. Ohdomari, Phys. Rev. B 50, 14999 (1994). CrossRef
    14. Y. Widjaja and C. B. Musgrave, J. Chem. Phys. 116, 5774 (2002). CrossRef
    15. X. L. Fan, Y. F. Zhang, W. M. Lau and Z. F. Liu, Phys. Rev. Lett. 94, 016101 (2005). CrossRef
    16. A. Hemeryck, A. J. Mayne, N. Richard, A. Esteve, Y. J. Chabal, M. D. Rouhani, G. Dujardin and G. Comtet, J. Chem. Phys. 126, 114707 (2007). CrossRef
    17. H. Watanabe, K. Kato, T. Uda, K. Fujita, M. Ichikawa, T. Kawamura and K. Terakura, Phys. Rev. Lett. 80, 345 (1998). CrossRef
    18. K. Kato, T. Uda and K. Terakura, Phys. Rev. Lett. 80, 2000 (1998). CrossRef
    19. K. Kato and T. Uda, Phys. Rev. B 62, 15978 (2000). CrossRef
    20. L. C. Ciacchi and M. C. Payne, Phys. Rev. Lett. 95, 196101 (2005). CrossRef
    21. Ph. Avouris and D. Cahill, Ultramicroscopy 42, 838 (1992). CrossRef
    22. D. G. Cahill and Ph. Avouris, Appl. Phys. Lett. 60, 326 (1992). CrossRef
    23. Ph. Avouris and I.-W. Lyo, Appl. Surf. Sci. 60-1, 426 (1992). CrossRef
    24. M. Udagawa, Y. Umetani, H. Tanaka, M. Itoh, T. Uchiyama, Y. Watanabe, T. Yokotsuka and I. Sumita, Ultramicroscopy 42, 946 (1992). CrossRef
    25. B. D. Yu, Y. J. Kim, J. Jeon, H. Kim, H. W. Yeom, I. W. Lyo, K.-J. Kong, Y. Miyamoto, O. Sugino and T. Ohno, Phys. Rev. B 70, 033307 (2004). CrossRef
    26. R. J. Hamers and U. K. K?hler, J. Vac. Sci. Technol., A 7, 2854 (1989). CrossRef
    27. S.-Y. Yu, H. Kim and J.-Y. Koo, Phys. Rev. Lett. 100, 036107 (2008). CrossRef
    28. C.-H. Chung, H. W. Yeom, B. D. Yu and I.-W. Lyo, Phys. Rev. Lett. 97, 036103 (2006). CrossRef
    29. J.-N. Yeo, G. M. Jee, B. D. Yu, H. Kim, C.-H. Chung, H. W. Yeom, I.-W. Lyo, K.-J. Kong, Y. Miyamoto, O. Sugino and T. Ohno, Phys. Rev. B 76, 115317 (2007). CrossRef
    30. J.-Y. Koo, J.-Y. Yi, C. Hwang, D.-H. Kim, S. Lee and D.-H. Shin, Phys. Rev. B 52, 17269 (1995). CrossRef
    31. J.-Y. Koo, J.-Y. Yi, C. Hwang, D.-H. Kim, G. Lee and S. Lee, Phys. Rev. B 57, 8782 (1998). CrossRef
    32. Y.-S. Kim, J.-Y. Koo and H. Kim, Phys. Rev. Lett. 100, 256105 (2008). CrossRef
    33. S.-H. Lee and M.-H. Kang, Phys. Rev. Lett. 82, 968 (1999). CrossRef
  • 作者单位:Eunkyung Hwang (1)
    Yun Hee Chang (1)
    Yong-Sung Kim (1)
    Ja-Yong Koo (1)
    Hanchul Kim (2)

    1. Korea Research Institute of Standards and Science, Daejeon, 305-600, Korea
    2. Department of Physics, Sookmyung Women’s University, Seoul, 140-742, Korea
  • ISSN:1976-8524
文摘
The initial adsorption of oxygen molecules on Si(001) is investigated at room temperature. The scanning tunneling microscopy images reveal a unique bright O2-induced feature. The very initial sticking coefficient of O2 below 0.04 Langmuir is measured to be ?.16. Upon thermal annealing at 250-00 °C, the bright O2-induced feature is destroyed, and the Si(001) surface is covered with dark depressions that seem to be oxidized structures with -Si-O-Si- bonds. This suggests that the observed bright O2-induced feature is an intermediate precursor state that may be either a silanone species or a molecular adsorption structure.

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