Orientation noise in EBSD data gathered adjacent to low angle grain boundaries

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• 作者：WANG WeiAndrew GODFREY
• 会议时间：2007-08-20
• 关键词：EBSD ; angularr esolution ; orientation noise
• 母体文献：第二届全国电子背散射衍射技术及其应用会议论文集
• 会议名称：第二届全国电子背散射衍射技术及其应用会议
• 会议地点：内蒙古包头
• 主办单位：中国体视学学会
• 语种：chi

摘要

The difference in orientation noise between regions near low angle boundaries and grain interiors has been investigated. Orientation measurements were made on samples of high purity nickel (99.999%) cold-rolled to a reduction of 98% and then annealed at 800℃ to give a strong cube texture. A pattern quality type parameter shows lower pattern qualities from volumes near the low angle boundaries. However, despite these differences the orientation noise in near-boundary regions was not found to be significantly worse than that in grain interiors. A significant variation was observed in the orientation noise for grains of different orientation.