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金属化薄膜电容器噪声产生的机理分析
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  • 英文篇名:Analysis on Noise Generation Mechanism of Metallized Film Capacitor
  • 作者:陈才明 ; 凌慧
  • 英文作者:CHEN Caiming;LING Hui;Ningbo Shine Electrical Technologies Co.,Ltd;
  • 关键词:金属化薄膜电容器 ; 噪声 ; 气泡 ; 热定型
  • 英文关键词:metallized film capacitors;;noise;;bubble;;thermal setting
  • 中文刊名:DLDY
  • 英文刊名:Power Capacitor & Reactive Power Compensation
  • 机构:宁波新容电器科技有限公司;
  • 出版日期:2019-04-25
  • 出版单位:电力电容器与无功补偿
  • 年:2019
  • 期:v.40;No.182
  • 语种:中文;
  • 页:DLDY201902011
  • 页数:6
  • CN:02
  • ISSN:61-1468/TM
  • 分类号:64-69
摘要
金属化薄膜电容器的噪声是薄膜在交流电场下振动引起,如何消除至今在电容器行业中仍是一个技术难题。通过对有噪声产品解剖观测和对噪声现象特点的分析研究,提出了揭示噪声产生原因和噪声与温度关系的"气泡噪声"机理,认为热定型工序的高温生成薄膜层间的气泡是产生噪声的根本原因。材料筛选、工艺改进能改善噪声强度和发生概率,但只要热定型工序存在要杜绝噪声的产生就是十分困难的。
        The noise of metallized film capacitors is caused by the vibration of thin film in AC electric field and how to eliminate it is still a technical problem in the present capacitor industry. The mechanism of the reason of noise generation and the "bubble noise" between noise and temperature are revealed through anatomy of the noisy product and analysis of noise feature, affirming that the bubble between the film layers due to high temperature of the heat setting process is the root cause of the noise. The noise strength and occurrence probability can be improved by material selection and process modification. However, it is very difficult to eliminate the noise by only thermal setting process.
引文
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