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银纳米线网筛柔性导电薄膜的光电性能研究
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摘要
研究银纳米线导电薄膜的光电性能。采用液相还原法,制备了由银纳米线网筛组成的导电薄膜。推导了导电薄膜的透光率T、表面电阻R_s的计算公式。发展了Mie光散射理论,导出透光率T是纳米线的直径D以及表面覆盖率φ_s的函数。采用渗透理论,得到了表面电阻R_s与纳米线直径D、长径比L/D以及表面覆盖率φ_s的关系;对于表面电阻R_s,其临界指数τ=1.23,与二维无规则网络模型计算值τ=1.3相符;计算表明直径分布D和长径比其透光率与导电性能具有同样重要的影响。最后,理论预测了银纳米线/聚合物复合材料折射率的实部和虚部,给出了Maxwell-Garnett模型及Van De Hulst模型。采用Mie理论,导出透光率T与纳米线的直径D以及表面覆盖率φ_s的关系。利用渗滤理论,结合表面覆盖率φ_s推到了R_s的半经验公式。理论预测φ_s与R_s以及T的关系与实验符合较好。纳米线直径D是影响透光率的最重要因素,而导电性能主要由D以及φ_c来决定。对于渗滤理论,实验临界指数与理论计算值相符。最后,理论预测了Ag纳米线/聚合物复合材料折射率的实部和虚部,给出了Maxwell-Garnett模型及Van De Hulst模型。
We have characterized the optoelectrical properties of networks of silver nanowires.We have developed a kind of high-yield synthesis strategy for silver nanowires by a polyol process.Mie light scattering theory of nanowires is developed to predict T as a function of diameter D and the surface fraction φ_s covered by the AgNWs.Percolation theory is used to derive an equation for Rs in terms of D,the aspect ratio of wires D/L and φ_s.The critical exponent t for percolation of R_s is found to be 1.23 in agreement with theoretical results for 2D random resistive networks(τ=1.23).These results show the importance of both the distributions of D and D/L of the AgNWs to predict the optoelectrical properties.At last,we present theoretical and experimental results of the real and imaginary refractive indices of nanocomposites using the Maxwell model the Van De Hulst mode.We have presented an analysis of the optoelectrical properties of silver nanowires Mesh films based on Mie light scattering and electrical percolation theory.The Mie theory was used to calculate the transmission diameter and the surface fraction φ_s.We used the φ_s as a key parameter to formulate the theoretical expressions for T.We also developed a semi empirical expression for the R_s based on percolation theory.We present theoretical and experimental results of the real and imaginary refractive indices of nanocomposites using the Maxwell model the Van De Hulst mode.
引文
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