物参共路干涉显微理论和实验研究
|
摘要
干涉显微(Interference microscopy)是利用光波干涉和显微放大原理对微小物体表面或厚度分布进行非接触测量的光学手段。它为半导体芯片检测、光学微加工、光学检测、生物医学研究等领域提供了一种高分辨率、快速、非接触测量手段。本论文旨在探索抗振动性好、测量精度高、可以用于实时测量的干涉显微光路及方法,同时开展相应的相位再现算法的研究。本论文主要完成了以下工作：
1.提出了一种物参共路的点衍射干涉显微光路。该光路利用一衍射光栅将物光分成两份,其中一份经过频谱面上的针孔滤波后变成参考光,另外一份仍被用作物光。当这两束光经过第二个光栅衍射后变成平行光束一同进入CCD。通过沿光栅矢量方向移动两个光栅中的其中一个可以实现相移。该光路具有以下优点：物参共路的光学结构降低了环境振动对干涉测量的影响；采用同轴光路提高了测量的空间分辨率。
2.将相移技术与泽尼克相衬干涉显微相结合,实现了对微小物体相位的定量测量。采用一系列点状光源照明代替环状光源照明,并采用点状相位台阶来改变零频分量的相位。该方法降低了原来泽尼克相衬成像中的“光晕”现象。通过改变相位台阶的厚度来实现相移,可以对物体的相位进行定量测量。该方法具有稳定性好、横向分辨率高、相干噪声低的优点。
3.提出了基于“平行分光+偏振相移”的同步相移方法。分别利用光栅和分光棱镜进行平行分光,结合偏振相移实现了同步相移。将构建的同步相移单元应用于干涉显微,通过单次曝光获得两幅或更多幅相移干涉图样,从而实现了对运动物体或动态过程的实时测量。
4.提出了基于两个分光棱镜和针孔滤波实现同步相移点衍射干涉显微方法和装置。由于点衍射干涉显微装置具有物参共路的特点,该装置对环境振动不敏感。利用该光路进行了同步相移低载频离轴干涉显微实验,降低了离轴光路对CCD分辨率的要求。可以对运动物体或动态过程进行实时测量。
5.提出了基于梯度积分的相位解包裹算法。该算法可以从单幅载频干涉图样或三幅相移干涉图样中直接解出被测相位的偏导数分布。然后通过对这两个相位偏导数积分从而得到“未包裹的”三维相位分布。该方法具有计算速度快、与干涉图样边缘无关等优点。
6.提出了一种从相移干涉图样中直接获取相移量的计算方法。该方法首先利用衍射光波的统计特性,直接从三幅相移干涉图中计算出实验中的相移量,然后采用迭代算法使得再现出来的参考光不断均匀化,来进一步提高相移量的获取精度。该方法直接从干涉图样中获取相移量,无需额外测量；具有计算速度快,精度高等优点。
Interference microscopy, which combines optical interferometry and microscopy,is a whole-field optical technique for measuring profile, thickness or refractive indexdistribution of microscopic specimen. It has the advantages of nondestructive,high-resolution, high measurement speed, requiring no extra preparation on specimen.Thus, it has been widely used in biology, medical science, micro-fabrication industry,and so on. In this thesis, high-performance interference microscopy based oncommon-path configuration and parallel phase-shifting mechanism, as well as thecorresponding phase reconstruction algorithm are investigated. For these purposes, thefollowing works have been completed:
1. A new common-path and in-line point-diffraction interferometer for quantitativephase microscopy is proposed. The magnified tested wave is split by a diffractiongrating into two copies. One copy is recast for reference wave through pin-holefiltered in the Fourier plane; the other one is still used as object wave. Afterdiffracted by the second grating, the two waves propagate on-axis into the CCDcamera. Achromatic phase-shifting is implemented by linearly moving one of thetwo gratings in grating vector direction. The setup has advantages of lesssensitive to environmental vibration due to the common-path configuration.
2. Zernike phase contrast microscopy is extended to perform quantitative phasemeasurement for microscopic object by combining with the phase-shiftingtechnique. The extended microscopy uses dozens of periodic point-like lightsources on a ring for illumination, and corresponding point-like phase-shifters forphase retardering the undiffracted component of object wave. By shifting thephase shifters with different height (to cover the undiffracted components), thephase shifting can be performed. The method has low coherent noise level due tothe partially-coherent illumination. Besides, it has higher lateral resolutionbecause of the Synthetic-Aperture of the oblique illumination.
3. The methods for simultaneous phase-shifting interferometry, which is based onparallel-beam-splitting and polarization phase-shifting, have been investigated. A diffraction grating pair or cube beam splitters are employed to perform theparallel-beam-splitting. Combined with polarization phase-shifting technique, theparallel phase-shifting unit is constructed. The unit has been incorporated intointerference microscopy. Two or more phase-shifting interferograms are obtainedthrough single exposure, thus moving object or dynamic process can be measuredwith this technique..
4. A common-path and parallel phase-shifting point-diffraction interferencemicroscopy is proposed based on a cube beamsplitter pair. Together with theparallel phase-shifting scheme, slightly-off-axis interferometry for microscopy isperformed, which suppresses dc term by subtracting the two phase-shiftingholograms from each other. The setup is stable due to its common-pathconfiguration, and can be used for measuring moving object or dynamic process.
5. A novel algorithm of phase reconstruction based on integral of phase gradient ispresent. The algorithm directly derives two real-valued partial derivatives fromthree phase-shifted interferograms. Through integrating the phase derivatives, thedesired phase is reconstructed. This algorithm is fast and easy to implement, andinsensitive to the nonuniformity of the intensity distribution of the interferogram.
6. A simple algorithm for blind extraction of phase-shifts is proposed for from onlythree interferograms. Based on the statistical property of object wave, thealgorithm calculates approximately the involved phase-shifts as initial values.Then, the extraction is further improved by an iterative method, considering thefact that the closer the phase-shifts approach to their real values, the moreuniform the reconstructed reference wave will become. This method has theadvantages of fast extraction, no extra measurement, and high-precision.
1.提出了一种物参共路的点衍射干涉显微光路。该光路利用一衍射光栅将物光分成两份,其中一份经过频谱面上的针孔滤波后变成参考光,另外一份仍被用作物光。当这两束光经过第二个光栅衍射后变成平行光束一同进入CCD。通过沿光栅矢量方向移动两个光栅中的其中一个可以实现相移。该光路具有以下优点：物参共路的光学结构降低了环境振动对干涉测量的影响；采用同轴光路提高了测量的空间分辨率。
2.将相移技术与泽尼克相衬干涉显微相结合,实现了对微小物体相位的定量测量。采用一系列点状光源照明代替环状光源照明,并采用点状相位台阶来改变零频分量的相位。该方法降低了原来泽尼克相衬成像中的“光晕”现象。通过改变相位台阶的厚度来实现相移,可以对物体的相位进行定量测量。该方法具有稳定性好、横向分辨率高、相干噪声低的优点。
3.提出了基于“平行分光+偏振相移”的同步相移方法。分别利用光栅和分光棱镜进行平行分光,结合偏振相移实现了同步相移。将构建的同步相移单元应用于干涉显微,通过单次曝光获得两幅或更多幅相移干涉图样,从而实现了对运动物体或动态过程的实时测量。
4.提出了基于两个分光棱镜和针孔滤波实现同步相移点衍射干涉显微方法和装置。由于点衍射干涉显微装置具有物参共路的特点,该装置对环境振动不敏感。利用该光路进行了同步相移低载频离轴干涉显微实验,降低了离轴光路对CCD分辨率的要求。可以对运动物体或动态过程进行实时测量。
5.提出了基于梯度积分的相位解包裹算法。该算法可以从单幅载频干涉图样或三幅相移干涉图样中直接解出被测相位的偏导数分布。然后通过对这两个相位偏导数积分从而得到“未包裹的”三维相位分布。该方法具有计算速度快、与干涉图样边缘无关等优点。
6.提出了一种从相移干涉图样中直接获取相移量的计算方法。该方法首先利用衍射光波的统计特性,直接从三幅相移干涉图中计算出实验中的相移量,然后采用迭代算法使得再现出来的参考光不断均匀化,来进一步提高相移量的获取精度。该方法直接从干涉图样中获取相移量,无需额外测量；具有计算速度快,精度高等优点。
Interference microscopy, which combines optical interferometry and microscopy,is a whole-field optical technique for measuring profile, thickness or refractive indexdistribution of microscopic specimen. It has the advantages of nondestructive,high-resolution, high measurement speed, requiring no extra preparation on specimen.Thus, it has been widely used in biology, medical science, micro-fabrication industry,and so on. In this thesis, high-performance interference microscopy based oncommon-path configuration and parallel phase-shifting mechanism, as well as thecorresponding phase reconstruction algorithm are investigated. For these purposes, thefollowing works have been completed:
1. A new common-path and in-line point-diffraction interferometer for quantitativephase microscopy is proposed. The magnified tested wave is split by a diffractiongrating into two copies. One copy is recast for reference wave through pin-holefiltered in the Fourier plane; the other one is still used as object wave. Afterdiffracted by the second grating, the two waves propagate on-axis into the CCDcamera. Achromatic phase-shifting is implemented by linearly moving one of thetwo gratings in grating vector direction. The setup has advantages of lesssensitive to environmental vibration due to the common-path configuration.
2. Zernike phase contrast microscopy is extended to perform quantitative phasemeasurement for microscopic object by combining with the phase-shiftingtechnique. The extended microscopy uses dozens of periodic point-like lightsources on a ring for illumination, and corresponding point-like phase-shifters forphase retardering the undiffracted component of object wave. By shifting thephase shifters with different height (to cover the undiffracted components), thephase shifting can be performed. The method has low coherent noise level due tothe partially-coherent illumination. Besides, it has higher lateral resolutionbecause of the Synthetic-Aperture of the oblique illumination.
3. The methods for simultaneous phase-shifting interferometry, which is based onparallel-beam-splitting and polarization phase-shifting, have been investigated. A diffraction grating pair or cube beam splitters are employed to perform theparallel-beam-splitting. Combined with polarization phase-shifting technique, theparallel phase-shifting unit is constructed. The unit has been incorporated intointerference microscopy. Two or more phase-shifting interferograms are obtainedthrough single exposure, thus moving object or dynamic process can be measuredwith this technique..
4. A common-path and parallel phase-shifting point-diffraction interferencemicroscopy is proposed based on a cube beamsplitter pair. Together with theparallel phase-shifting scheme, slightly-off-axis interferometry for microscopy isperformed, which suppresses dc term by subtracting the two phase-shiftingholograms from each other. The setup is stable due to its common-pathconfiguration, and can be used for measuring moving object or dynamic process.
5. A novel algorithm of phase reconstruction based on integral of phase gradient ispresent. The algorithm directly derives two real-valued partial derivatives fromthree phase-shifted interferograms. Through integrating the phase derivatives, thedesired phase is reconstructed. This algorithm is fast and easy to implement, andinsensitive to the nonuniformity of the intensity distribution of the interferogram.
6. A simple algorithm for blind extraction of phase-shifts is proposed for from onlythree interferograms. Based on the statistical property of object wave, thealgorithm calculates approximately the involved phase-shifts as initial values.Then, the extraction is further improved by an iterative method, considering thefact that the closer the phase-shifts approach to their real values, the moreuniform the reconstructed reference wave will become. This method has theadvantages of fast extraction, no extra measurement, and high-precision.
引文
[1].谭卫军,陈桂林,“旋转棱镜在主动式几何光学测量法中的应用,”光学精密工程,5,112-118(1997)
[2]. T. H. Barnes,"Heterodyne Fizeau interferometer for testing flat surfaces," Appl. Opt.26,2804-2809(1987).
[3]. B. W. Bell and C. L. Koliopoulos,"Moire topography, sampling theory charged-coupled devices," Opt. Lett.9,171-173(1984).
[4]. D. A. Bone, H. A. Bachor, and R. J. Sandeman,"Fringe pattern analysis using a2-D Fourier transform," Appl. Opt.25,1653-1660(1986).
[5]. C. P. Brophy,"Effect of intensity error correlation on the computed phase of phase-shifting interferometry," JOSA A7,537-541(1990).
[6].陈洪芳,谭久彬,钟志,“外差干涉仪中偏振分光镜对测量精度的影响,”计量学报,29,15-18(2008)
[7]. F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge,"Characterization of microlenses by digital holographic microscopy," Appl. Opt.45,829-835(2006).
[8]. B. Kemper and G. Bally,"Digital holographic microscopy for live cell applications and technical inspection," Appl. Opt.47, A52-A61(2008).
[9]. P. Ferraro, G. Coppola, S. D. Nicola, A. Finizio, and G. Pierattini,"Digital holographic microscope with automatic focus tracking by detecting sample displacement in real time," Opt. Lett.28,1257-1259(2003).
[10].钱晓凡,董可平,张磊,张永安,“反射式数字全息显微术对细胞的研究,”光子学报36(7),1318-1321(2007).
[11]. P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, M. Lei,"Phase and amplitude reconstruction from a single carrier-frequency interferogram without phase unwrapping," Appl Opt.47,2760-2766(2008).
[12]. N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,"Two-step only phase-shifting interferometry with optimized camera bandwidth for microscopy of live cells," Opt. Express17,15585-15591(2009).
[13]. N. T. Shaked, M. T. Rinehart, and A. Wax,"Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[14]. I. Yamaguchi and T. Zhang,"Phase-shifting digital holography," Opt. Lett.22,1268-1270(1997).
[15]. Z. Ma, H. Li, and X. Lü,“Complex amplitude reconstruction and phaseaberrations compensation in phase-shifting in-line image digital holographicmicroscopy,” Chin. Opt. Lett.7,1076-1078(2009).
[16]. G. Páez and M. Strojnik,“Phase-shifted interferometry without phaseunwrapping: reconstruction of a decentered wave front,” J. Opt. Soc. Am. A16,475-480(1999).
[17]. G. Lai and T. Yatagai,“Generalized phase-shifting interferometry,” J. Opt. Soc.Am. A8,822-827(1991).
[18]. J. Garcia-Sucerquia, W. Xu, S. K. Jericho, P. Klages, M. H. Jericho, and H. J.Kreuzer,“Digital in-line holographic microscopy,” Appl. Opt.45,836-850(2006)
[19]. M. Stedman, and K. Lindsey,“Limits of surface measurement by stylusinstruments,” Proc. SPIE,1009,56-61(1988).
[20]. J. M. Bennett and J. H. Dancy,“Stylus profiling instrument for measuringstatistical properties of smooth optical surfaces,” Appl. Opt.,20,1785-1802(1981).
[21]. J. F. Song and T. V. Vorburger,“Stylus profiling at high resolution and lowforce,” Appl. Opt.,30,42-50(1991).
[22]. R. J. Whitefield,"Noncontact optical profilometer," Appl. Opt.14,2480-2485(1975)
[23]. M. Stedman,“Limits of surface measurement by optical probes,” Proc SPIE.,1009,62-67(1988).
[24]. G. Binning, H. Rohrer, C. Gerber, and E. Weibei,“Surface studies by scanningtunneling microscope,” Phys. Rev. Lett.,4957-61(1982).
[25]. G. Binning, C. F. Quate, and C. Gerbeer,“Atomic force microscopy,” Phys. ReV.Lett.,56,930-933(1986).
[26]. D. W. Pohl, W. Denk,a) and M. Lanz,"Optical stethoscopy:Image recording with resolution λ/20," Appl. Phys. Lett.44,651-653(1984).
[27].邓江东,张春平,李增发,张光寅,张彦东,“扫描近场光学显微镜原理及其应用,”激光与光电子进展,3-8,(1997)
[28].王晓秋筒国树王克逸,“光子扫描隧道显微镜成像原理的数值研究,”激光杂志,24,55-56(2003)
[29].《Scanning Electron Microscopy and X-ray Microanalysis》, Third Edition, by Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, and Joseph Michael, Kluwer Academic/Plenum Publishers,2003ISBN:0306472929
[30]. A. H. Mirau, Interferometer, US Patent2612074(1952).
[31]. D. M. Gale, M. I. Pether, and J. C. Dainty,"Linnik microscope imaging of integrated circuit structures," Appl. Opt.35,131-148(1996).
[32].《The Principles of Physical Optics》, Ernst Mach, ISBN0-486-49559-0.170-175(2003).
[33]. P. Groot,"Phase-shift calibration errors in interferometers with spherical Fizeau cavities," Appl. Opt.34,2856-2863(1995).
[34]. J. Schwider,"Fizeau-type Multi-Pass Shack-Hartmann-Test," Opt. Express16,362-372(2008)
[35]. A. Dobroiu, H. Sakai, H. Ootaki, M. Sato, and N. Tanno,"Coaxial Mirau interferometer," Opt. Lett.27,1153-1155(2002).
[36]. B. Bhushan, J. C. Wyant, and C. L. Koliopoulos,"Measurement of surface topography of magnetic tapes by Mirau interferometry," Appl. Opt.24,1489-1497(1985).
[37]. M. P. Rimmer and J. C. Wyant,"Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear," Appl. Opt.14,142-150(1975).
[38].刘晓军,高咏生,“显微剪切干涉表面粗糙度轮廓测量,”中国测试技术,3-5(2004).
[39]. F. Zernike,"Phase contrast, a new method for the microscopic observation of transparent objects," Physica9, Part I,686-698, Part Ⅱ,974-986(1942).
[40]. G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari, and M. S. Feld,"Fourier phase microscopy for investigation of biological structures and dynamics," Opt. Lett.29,2503-2505(2004).
[41]. Chris S. Anderson,"Fringe visibility, irradiance, and accuracy in common path interferometers for visualization of phase disturbances," Appl. Opt.34,7474.7485(1995)
[42]. H. Kadono, M. Ogusu, S. Toyooka,"Phase shifting common path interferometer using a liquid-crystal phase modulator," Opt. Commun.,110,391-400(1994).
[43]. G. Popescu, T. Ikeda, K. Goda, C. Best-Popescu, M. Laposata, S. Manley, R. R. Dasari, K. Badizadegan, M. S. Feld,"Optical measurement of cell membrane tension,"phys. Rev. Lett.90,228101(2003).
[44]. F. Charriere, N. Pavillon, T. Colomb, C. Depeursinge, T. J. Heger, E. A. D. Mitchell, P. Marquet, and B. Rappaz,"Living specimen tomography by digital holographic microscopy:morphometry of testate amoeba," Opt. Express14,7005-7013(2006).
[45]. F. Charriere, A. Marian, F. Montfort, J. Kuehn, T. Colomb, E. Cuche, P. Marquet, and C. Depeursinge,"Cell refractive index tomography by digital holographic microscopy," Opt. Lett.31,178-180(2006).
[46]. K. Jeong, J. J. Turek, and D. D. Nolte,"Fourier-domain digital holographic optical coherence imaging of living tissue," Appl. Opt.46,4999-5008(2007).
[47]. B. Das and C. S. Yelleswarapu,"Dual plane in-line digital holographic microscopy," Opt. Lett.35,3426-3428(2010).
[48].陈磊,仇智“干涉显微镜测量小球面曲率半径,”红外和激光工程,35,67-71(2006)。
[49].丁志华,王桂英,包正康,“相移干涉显微镜的研制和光盘预刻槽形的测量,”计量学报,20,81-86(1999)。
[50].陈志清,吕如寿,“全息干涉显微术测量光纤折射率分布,”光学工程,5,21-23(1989)
[51]. J. Millerd, N. Brock, J. Hayes, M. Morris, M. Novak and J. Wyant,"Pixelated Phase-Mask Dynamic Interferometer," Interferometry Ⅻ:Techniques and Analysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).
[52]. M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,"Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer," Appl. Opt.44,6861-6868(2005).
[53].张越,俞刚,“激光M—Z干涉法应用于超音速燃烧流场测量,”推进技术,18,111-116(1997)
[54].刘文杰,俞刚,“用数字化M—Z干涉仪对低密度混合流场测量的实验研究,气动实验与测量控制,5,60-66(1991)。
[55]. P. A. J. de Korte and R. Laine,"Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy," Appl. Opt.18,236-242(1979).
[56]. J. M. Bennett,"Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer," Appl. Opt.15,2705-2721(1976).
[57]. E. B. Aleksandrov and A. M. Bonch-Bruevich,"Investigation of surface strains by the hologram technique," Sov. Phys.-Tech. Phys.12,258-265(1967).
[58]. A. E. Ennos,"Measurement of in-plane surface strain by hologram interferometry," Journ. Phys. E:Scient. Instr.1,731-734(1968).
[59]. E. Cuche, P. Marquet, and C. Depeursinge,"Spatial Filtering for Zero-Order and Twin-Image Elimination in Digital Off-Axis Holography," Appl. Opt.39,4070-4075(2000).
[60]. E. Cuche, P. Marquet, and C. Depeursinge,"Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms," Appl. Opt.38,6994-7001(1999).
[61]. G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,"Diffraction phase microscopy for quantifying cell structure and dynamics," Opt. Lett.31,775-777(2006).
[62]. G. Popescu, Y. Park, W. Choi, R. R. Dasari, M. S. Feld, K. Badizadegan,“Imaging red blood cell dynamics by quantitative phase microscopy,” BloodCells, Molecules, and Diseases,41,10-16(2008).
[63]. B. Kouskousis, D. J. Kitcher, S. Collins, A. Roberts, and G. W. Baxter,“Quantitative phase and refractive index analysis of optical fibers usingdifferential interference contrast microscopy,” Appl. Opt.47,5182-5189(1981).
[64]. C. Preza,“Rotational-diversity phase estimation from differentialinterference-contrast microscopy images,” J. Opt. Soc. Am. A,17,415-424(2000).
[65]. J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[66]. S. Wolfling, E. Lanzmann, M. Israeli, N. Ben-Yosef, and Y. Arieli,“Spatialphase-shift interferometry—a wavefront analysis technique forthree-dimensional topometry,” J. Opt. Soc. Am. A22,2498-2509(2005).
[67]. C. S. Yelleswarapu, M. Tipping, S.-R. Kothapalli, A. Veraksa, and D. V. G. L. N.Rao,“Common-path multimodal optical microscopy,” Opt. Lett.34,1243-1245(2009).
[68]. J. H. Brunning,“Optical shop testing,” edited by D Malacara, wiley, New York(2007).
[69]. J. H. Bruning,“Fringe scanning interferometers,” in optical shop testing, D.Malacara Ed.,1st Edition, Wiley, New York,1978.
[70]. Johannes Schwider, Oliver Falkenst rfer, Horst Schreiber, Andreas Z ller,Norbert Streibl,“New compensating four-phase algorithm for phase-shiftinterferometry,” Opt., Eng.,32,1883-1885(1993).
[71]. J. Schmit and K. Creath,“Extended averaging technique for derivation oferror-compensating algorithms in phase-shifting interferometry,” Appl. Opt.34,3610-3619(1995).
[72]. L. Cai, Q. Liu, and X. Yang,“Phase-shift extraction and wave-frontreconstruction in phase-shifting interferometry with arbitrary phase steps,” Opt.Lett.28,1808-1810(2003).
[73]. D. C. Ghiglia and L. A. Romero,"Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A11,107-117(1994).
[74]. M. D. Pritt, J. S. Shipman,"Least-Squares Two-Dimensional Phase Unwrapping Using FFT's [J]," IEEE Trans, on GRS32:706-708(1994).
[75]. R. M. Goldstein, H. A. Zehker, and C. L. Werner,"Satellite radar interferometry: Synthetic aperture radar observations," Radio Science,23,713-720(1988).
[76]. J. M. Huntley,"Noise-immune phase unwrapping algorithm," Appl. Opt.28,3268-3270(1989).
[77]. Ching N. H., D. Rosenfeld, and M. Braun,"Two Dimensional Phase Unwrapping Using a Miminum Spanning Tree Algorithm," IEEE Transaction on Image Processing,1,355-365(1992).
[78]. Herraez M. A., D. R. Burton, M. J. Lalor, and D. B. Clegg,"Robust Unwrapper for Twodimensional Images," Proc. SPIE,2784,106(1996).
[79]. R. Smythe and R. Moore,"Instantaneous phase measuring interferometry," Opt. Eng.23,361-364(1984).
[80]. Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba,"Parallel two-step phase-shifting digital holography," Appl. Opt.47, D183-D189(2008).
[81].左芬,陈磊,徐春生,“基于二维光栅分光的同步移相干涉测量技术,”光学学报27(4),663-667(2007).
[82]. V. Mico, Z. Zalevsky, and J. Garcia,"Superresolution optical system by common-path interferometry," Opt. Express14,5168-5177(2006).
[83]. V. Mico, Z. Zalevsky, and J. Garcia,"Common-path phase-shifting digital holographic microscopy:A way to quantitative phase imaging and superresolution," Opt. Commn.281(17),4273-4281(2008).
[84]. C. J. Schwarz, Y. Kuznetsova, and S. R. J. Brueck,"Imaging interferometric microscopy," Opt. Lett.28,1424-1426(2003).
[85]. P. Almoro, G. Pedrini, and W. Osten,"Aperture synthesis in phase retrieval using a volume-speckle field," Opt. Lett.32,733-735(2007).
[86]. J. Zhao, X. Yan, W. Sun, and J. Di,"Resolution improvement of digitalholographic images based on angular multiplexing with incoherent beams inorthogonal polarization states," Opt. Lett.35,3519-3521(2010)
[87]. S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168-102(2006).
[88]. T. R. Hillman, T. Gutzler, S. A. Alexandrov, and D. D. Sampson,“High-resolution, wide-field object reconstruction with synthetic apertureFourier holographic optical microscopy,” Opt. Express17,7873-7892(2009).
[89]. J. Maycock, B. M. Hennelly, J. B. McDonald, Y. Frauel, A. Castro, B. Javidi,and T. J. Naughton,“Reduction of speckle in digital holography by discreteFourier filtering,” J. Opt. Soc. Am. A24,1617-1622(2007).
[90]. J. Garcia-Sucerquia, J. H. Ramírez, and R. Castaneda,“Incoherent recovering ofthe spatial resolution in digital holography,” Opt. Commun.260,62–67(2006).
[91]. D. Kim,“Reduction of coherent artifacts in dynamic holographicthree-dimensional displays by diffractionspecific pseudorandom diffusion,” Opt.Lett.29,611–613(2004).
[92]. N. Bertaux, Y. Frauel, P. Réfrégier, and B. Javidi,“Speckle removal using amaximum-likelihood technique with isoline gray-level regularization,” J. Opt.Soc. Am. A21,2283–2291(2004).
[93]. J. C. Dainty and W. T. Welford,“Reduction of speckle in image plane hologramreconstruction by use of a moving pupil,” Opt. Commun.3,289–294(1971).
[94]. P. Hariharan and Z. S. Hegedus,“Reduction of speckle in coherent imaging byspatial frequency sampling,” Opt. Acta21,345–356(1974).
[95]. P. Ferraro, G. Coppola, S. D. Nicola, A. Finizio, and G. Pierattini,“Digitalholographic microscope with automatic focus tracking by detecting sampledisplacement in real time,” Opt. Lett.28,1257-1259(2003).
[96]. P. Langehanenberg, B. Kemper, D. Dirksen, and G. Bally,“Autofocusing indigital holographic phase contrast microscopy on pure phase objects for live cellimaging,” Appl. Opt.47, D176-D182(2008).
[97]. F. Dubois, C. Schockaert, N. Callens, and C. Yourassowsky,"Focus plane detection criteria in digital holography microscopy by amplitude analysis," Opt. Express14,5895-5908(2006).
[98]. M. Antkowiak, N. Callens, C. Yourassowsky, and F. Dubois,"Extended focused imaging of a microparticle field with digital holographic microscopy," Opt. Lett.33,1626-1628(2008).
[99].王华英,刘景波,王大勇,赵洁,“显微数字全息数值再现中的自动聚焦,”光学学报28,343-347(2008).
[100]. J. Kuhn, T. Colomb, F. Montfort, F. Charriere, Y. Emery, E. Cuche, P. Marquet and C. Depeursinge,"Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition," Opt. Express15,7231-7242(2007).
[101]. M. T. Rinehart, N. T. Shaked, N. J. Jenness, R. L. Clark, and A. Wax,"Simultaneous two-wavelength transmission quantitative phase microscopy with a color camera," Opt. Lett.35,2612-2614(2010).
[102]. A. Wada, M. Kato, and Y. Ishii,"Multiple-wavelength digital holographic interferometry using tunable laser diodes," Appl. Opt.47,2053-2060(2008).
[103]. S. Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro,"Recovering correct phase information in multiwavelength digital holographic microscopy by compensation for chromatic aberrations," Opt. Lett.30,2706-2708(2005).
[104]. T. Colomb, F. Montfort, J. Kuhn, N. Aspert, E. Cuche, A. Marian, F. Charriere, S. Bourquin, P. Marquet, and C. Depeursinge,"Numerical parametric lens for shifting, magnification, and complete aberration compensation in digital holographic microscopy," J. Opt. Soc. Am. A.23,3177-3190(2006).
[1] T. H. Barnes,“Heterodyne Fizeau interferometer for testing flat surfaces,” Appl.Opt.26,2804-2809(1987).
[2] B. W. Bell and C. L. Koliopoulos,“Moire topography, sampling theorycharged-coupled devices,” Opt. Lett.9,171-173(1984).
[3] D. A. Bone, H. A. Bachor, and R. J. Sandeman,“Fringe pattern analysis using a2-D Fourier transform,” Appl. Opt.25,1653-1660(1986).
[4] C. P. Brophy,“Effect of intensity error correlation on the computed phase ofphase-shifting interferometry, JOSA A7,537-541(1990).
[5] M. Takeda, H. Ina, and S. Kobayashi,"Fourier-transform method offringe-pattern analysis for computer-based topography and interferometry," J.Opt. Soc. Am.72,156-160(1982).
[6] D. J. Bone, H.-A. Bachor, and R. J. Sandeman,"Fringe-pattern analysis using a2-D Fourier transform," Appl. Opt.25,1653-1660(1986).
[7] J. A. Ferrari and E. M. Frins,“Multiple phase-shifted interferograms obtainedfrom a single interferogarm with linear carrier,” Opt. commun.271,59-64(2007).
[8] P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,“Phase and amplitudereconstruction from a single carrier-frequency interferogram,” Appl. Opt.47,2760-2766(2008).
[9] P. Carre′“Installation et utilisation du comparateur photoe′lectrigue etInterferentiel du Bureau International des Poids ek Measures,” Metrologia,1,13-23(1966).
[10] R. Crane.,‘‘Interference Phase Measurement,’’ Appl. Opt.,8,538(1969).
[11] J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, andD. J. Brangaccio,‘‘Digital wavefront measuring interferometer for testingoptical surfaces, lenses,’’ Appl. Opt.,13,2693(1974).
[12] J. C. Wyant,“Use of an ac heterodyne lateral shear interferometer with real-timewavefront correction systems,” Appl. Opt.,14,2622(1975).
[13] Johannes Schwider, Oliver Falkenst rfer, Horst Schreiber, Andreas Z ller,Norbert Streibl,“New compensating four-phase algorithm for phase-shiftinterferometry,” Opt., Eng.,32,1883-1885(1993)
[14] J. Schmit and K. Creath,“Extended averaging technique for derivation oferror-compensating algorithms in phase-shifting interferometry,” Appl. Opt.34,3610-3619(1995).
[15] H. Bi, Y. Zhang, K. V. Link, and C. Wen,“Class of4+1phase algorithum witherror compensation,”Appl. Opt.43,4199-4207(2004).
[16]N. T. Shaked, M. T. Rinehart, and A. Wax,“Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[17] N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,“Two-step onlyphase-shifting interferometry with optimized camera bandwidth for microscopyof live cells,” Opt. Express17,15585–15591(2009).
[18] N. Pavillon, C. Arfire, I. Bergo nd, and C. Depeursinge,"Iterative method forzero-order suppression in off-axis digital holography," Opt. Express18,15318-15331(2010)
[19] X. Meng, L. Cai, X.Xu, X. Yang, X. Shen, G. Dong, and Y. Wang,“Two-stepphase-shifting interferometry and its application in image encryption,” Opt. Lett.31,1414-1416(2006).
[20]Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, andO. Matoba,“Parallel two-step phase-shifting digital holography,” Appl. Opt.47,D183-D189(2008).
[21]T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,“Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography,” Opt. Express18,9555-9560(2010).
[22]J. Liu and T. Poon,“Two-step-only quadrature phase-shifting digitalholography,” Opt. Lett.34,250-252(2009).
[23] J. E. Greivenkamp,“Generalized Data Reduction for HeterodyneInterferometry,” Opt. Eng.,23,350(1984).
[24] J. Schwider, R. Burow, K. E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel,“Digital wave-front measuring interferometry: some systematic error sources,”Appl. Opt.,22,3421-3432(1983).
[25] Z. Wang and B. Han,"Advancediterative algorithm for phase extraction ofrandomly phase-shifted interferograms," Opt. Lett.29,1671-1673(2004).
[26] C. Guo, L. Zhang, H. Wang, J. Liao, and Y. Y. Zhu,"Phase-shifting error and itselimination in phase-shifting digital holography," Opt. Lett.27,1687-1689(2002).
[27] X. F. Xu, L. Z. Cai, X. F. Meng, G. Y. Dong, and X. X. Shen,"Fast blindextraction of arbitrary unknown phase shifts by an iterative tangent approach ingeneralized phase-shifting interferometry," Opt. Lett.31,1966-1968(2006).
[28]L. Z. Cai, Q. Liu, and X. L. Yang,“Generalized phase-shifting interferometrywith arbitrary unknown phase steps for diffraction objects,” Opt. Lett.29,183-185(2004).
[29] X. Xu, L. Cai, Y. Wang, X. Meng, W. Sun, H. Zhang, X. Cheng, G. Dong, andX. Shen,“Simple direct extraction of unknown phase shift and wavefrontreconstruction in generalized phase-shifting interferometry: algorithm andexperiments,” Opt. Lett.33,776-778(2008).
[30] X. Xu, L. Cai, Y. Wang, X. Yang, X. Meng,G. Dong, X. Shen, and H. Zhang,“Generalized phase-shifting interferometry with arbitrary unknown phase shifts:Direct wave-front reconstruction by blind phase shift extraction and itsexperimental verification”Appl. Phys. Lett.90,121-124(2007).
[31] Peng Gao, Baoli Yao, Norbert Lindlein, Klaus Mantel, Irina Harder, and EduardGeist,"Phase-shift extraction for generalized phase-shifting interferometry," Opt.Lett.34,3553-3555(2009).
[32]F. Charrière, J. Kühn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P.Marquet, and C. Depeursinge,“Characterization of microlenses by digitalholographic microscopy,” Appl. Opt.45,829-835(2006).
[33]P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,"Phase reconstruction from three interferograms based on integral of phase gradient," J. Mod. Opt.55,2233-2242(2008).
[34]C. Dennis. and A. R. Louis "Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A11,107-117(1994).
[35]A. Baldi,"Two-dimensional phase unwrapping by quad-tree decomposition," Appl. Opt.40,1187-1194(2001).
[36]Y. Shi,"Robust phase unwrapping by spinning iteration," Opt. Express15,8059-8064(2007).
[37]K. Itoh,"Analysis of the Phase Unwrapping Algorithm," Appl. Opt.1982,21,2470-2470.
[38]L. Aiello, D. Riccio, P. Ferraro, S. Grilli, L. Sansone, G. Coppola, S. Nicola, and A.Finizio,"Green's formulation for robust phase unwrapping in digital holography," Opt. commun.45,750-755(2007).
[39]G. Abdul-Rahman, M. deisat, D. R. Burton, M. J. Lalor, F. Lilley, and C. J. Moore,"Fast and robust three-dimentional best path phase unwrapping algorithm," Appl. Opt.46,6623-6635(2007).
[40]G. Paez, and M. Strojnik,"Fringe Analysis and Phase Reconstruction from Modulated Intensity Patterns," Opt. Lett.22,1969-1971(1997).
[41]G. Paez, and M. Strojnik,"Phase-Shifted Interferometry Without Phase Unwrapping:Reconstruction of a Decent Wave Front," J. Opt. Soc, Am. A16,475-480(1999).
[42]D. C. Ghiglia and L. A. Romero,"Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A,11,107-117(1994).
[43]M. D. Pritt, J. S. Shipman,"Least-Squares Two-Dimensional Phase Unwrapping Using FFT's," IEEE Trans, on GRS32(3):706-708(1994)
[44]惠梅,王东生等,“基于离散泊松方程解的相位展开方法[J],”光学学报23(10),1245-1249(2003).
[45]钱克矛,伍小平.“基于调制度分析的加权最小二乘相位展开方法[J],”光子学报,30(5),585-588(2001).
[46]钱晓凡,张永安,李新宇,马惠.“基于掩膜和最小二乘迭代的相位解包裹方法,”光学学报30(2),440-444(2010).
[47]Junhe Han, Baoli Yao, Peng Gao, Liju Chen, Yingli Wang, Ming Lei, Application of bacteriorhodopsin film for polarization phase-shifting interferometry, J. Mod. Opt.2008,55:2215-2222.
[48]Peng Gao, Baoli Yao, Junhe Han, Liju Chen, Yingli Wang, Ming Lei,"Phase reconstruction from three interferograms based on integral of phase gradient," J. Mod. Opt.,2008,55(14)2233-2242.
[1] K. Bhattacharya,“Generation of Phase-Modulated Periodic Optical Signals by useof a Polarization Interferometer,” Appl. Opt.40,261-267(2001).
[2] Q. Kemao, W. Xiaoping, and A. Asundi,“Grating-based real-time polarizationphase-shifting interferometry: error analysis,” Appl. Opt.41,2448-2453(2002).
[3] R. Smythe and R. Moore,“Instantaneous phase measuring interferometry,” Opt.Eng.23,361–364(1984).
[4] C. Koliopoulos,“Simultaneous phase shift interferometer,” Proc. SPIE.1531,119–127(1991).
[5] N. R. Sivakumar, W. K. Hui, K. Venkatakrishnan, and B. K. A. Ngoi,“Largesurface profile measurement with instantaneous phase-shifting intferometry,” Opt.Eng.42,367-372(2003).
[6] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysisof a micropolarizer array-based simultaneous phase-shifting interferometer,” Appl.Opt.44,6861-6868(2005).
[7] Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O.Matoba,“Parallel two-step phase-shifting digital holography,” Appl. Opt.47,D183-D189(2008).
[8] Y. Awatsuji, A. Fujii, T. Kubota, and O. Matoba,"Parallel three-step phase-shiftingdigital holography," Appl. Opt.45,2995-3002(2006)
[9] T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,“Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography,” Opt. Express18,9555-9560(2010).
[10] T. Kakue, T. Tahara, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T. Kubota,and O. Matoba,"Parallel phase-shifting color digital holography using two phaseshifts," Appl. Opt.48, H244-H250(2009).
[11] G. Rodriguez-Zurita, C. Meneses-Fabian, N. Toto-Arellano, J. Vazquez-Castillo, C.Robledo-Sánchez,“One-shot phase-shifting phase-grating interferometry withmodulation of polarization: case of four interferograms,” Opt. Express16,7806-7817(2008).
[12] G. Rodriguez-Zurita, C. Meneses-Fabian, N.-I. Toto-Arellano, J. F.Vázquez-Castillo, and C. Robledo-Sánchez,“One-Shot Phase-ShiftingPhase-Grating Interferometry with Modulation of Polarization: case of fourinterferograms,” Opt. Express16,7806-7817(2008).
[13] N.-I. Toto-Arellano, G. Rodriguez-Zurita, C. Meneses-Fabian, and J.Vazquez-Castillo,"Phase shifts in the Fourier spectra of phase gratings and phasegrids: an application for one-shot phase-shifting interferometry," Opt. Express16,19330-19341(2008).
[14] C. Meneses-Fabian, G. Rodriguez-Zurita, M. Encarnacion-Gutierrez, N.-I.Toto-Arellano,“Phase-shifting interferometry with four interferograms using linearpolarization modulation and a Ronchi grating displaced by only a small unknownamount,” Opt. Commun.28230633068(2009).
[15] G. Rodriguez-Zurita, N.-I. Toto-Arellano, C. Meneses-Fabian, and J. F.Vázquez-Castillo,“One-shot phase-shifting interferometry: five, seven, and nineinterferograms,” Opt. Lett.33,2788-2790(2008).
[16] Cruz Meneses-Fabian and Gustavo Rodriguez-Zurita,“Optical tomography oftransparent objects with phase-shifting interferometry and stepwise-shifted Ronchiruling,” J. Opt. Soc. Am. A23,298–305(2006).
[17] N. Toto-Arellano, G. Rodriguez-Zurita, C. Meneses-Fabian, and J. Vazquez-Castillo,“Phase shifts in the Fourier spectra of phase gratings and phase grids: an applicationfor one-shot phase-shifting interferometry,” Opt. Express16,19330-19341(2008).
[18] T. Kiire, S. Nakadate, and M. Shibuya,“Simultaneous formation of four fringes byusing a polarization quadrature phase-shifting interferometer with wave plates and adiffraction grating,” Appl. Opt.47,4787-4792(2008).
[19] N. T. Shaked, M. T. Rinehart, and A. Wax,“Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[20] N. Shaked, T. Newpher, M. Ehlers, and A. Wax,“Parallel on-axis holographic phasemicroscopy of biological cells and unicellular microorganism dynamics,” Appl. Opt.49,2872-2878(2010).
[21] M. Kujawinska and D. Robinson,“Multichannel phase-stepped holographicinterferometry,” Appl. Opt.27,312-320(1988).
[22]L. Chen, S. Yeh, A. Tapilouw, and J. Chang,"3-D surface profilometry using simultaneous phase-shifting interferometry," Opt. Commn.283,3376-3382(2010).
[23]B. Garcia, A. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi,"Transient Deformation Measurement with Electronic Speckle Pattern Interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping," Appl. Opt.38,5944.5947(1999).
[24]左芬,陈磊,徐春生,“基于二维光栅分光的同步移相干涉测量技术,”光学学报27(4),663-667(2007).
[25]E. Ribak and S. Lipson,"Complex spatial coherence function:its measurement by means of a phase-modulated shearing interferometer," Appl. Opt.20,1102-1106(1981).
[26]M. Santarsiero and R. Borghi,"Measuring spatial coherence by using a reversed-wavefront Young interferometer," Opt. Lett.31,861-863(2006).
[27]J. Ferrari and E. Frins,"Single-element interferometer," Opt. Commun.279,235-239(2007).
[28]W. Qu, Y Yu, C. Chee, and A. Asundi,"Digital holographic microscopy with physical phase compensation," Opt. Lett.34,1276-1278(2009).
[29]V. Ronchi,"On the phase grating interferometer,",Appl. Opt.4,1041-1042(1965).
[30]G. Vogl,"A phase grating interferometer,",Appl. Opt.3,1089-1089(1964).
[31]P. Ferraro, S. De Nicola, A. Finizio, G Coppola, S. Grilli, C. Magro, and G Pierattini,"Compensation of the Inherent Wave Front Curvature in Digital Holographic Coherent Microscopy for Quantitative Phase-Contrast Imaging," Appl. Opt.42,1938-1946(2003).
[32]E. Cuche, P. Marquet, and C. Depeursinge,"Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms," Appl. Opt.38,6994-7001(1999).
[33]X. Meng, L. Cai, X. Xu, X. Yang, X. Shen, G Dong, and Y Wang,"Two-step phase-shifting interferometry and its application in image encryption," Opt. Lett.31,1414-1416(2006).
[34]Y Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba,"Parallel two-step phase-shifting digital holography," Appl. Opt.47,D183-D189(2008).
[35] T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,"Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography," Opt. Express18,9555-9560(2010).
[36] J.-P. Liu and T.-C. Poon,“Two-step-only quadrature phase-shifting digitalholography,” Opt. Lett.34,250-252(2009).
[37] N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,“Two-step only phase-shiftinginterferometry with optimized camera bandwidth for microscopy of live cells,” Opt.Express17,15585–15591(2009).
[38] P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao,“Phase-shiftingpoint-diffraction interferometry with common-path and in-line configuration formicroscopy,” Opt. Lett.35,712-714(2010).
[39] P. Gao, B. Yao, J. Min, R. Guo, J. Zheng, T. Ye, I. Harder, V. Nercissian, K. Mantel,“Parallel two-step phase-shifting point-diffraction interferometry for microscopybased on a pair of cube beamsplitters,” Opt. Express,19,1930-1935(2011).
[1] F. Zernike,“Phase contrast, a new method for the microscopic observation oftransparent objects,” Physica9, Part I,686–698, Part II,974–986(1942).
[2] F. Zernike,“Phasecontrast, a new method for the microscopic observation oftransparent objects. Part II.,” Physica (Utrecht)9,974–986(1942).
[3] F. Zernike,“How I discovered phase contrast,” Science121,345–349(1955).
[4] C. S. Anderson,“Fringe visibility, irradiance, and accuracy in common pathinterferometers for visualization of phase disturbances,” Appl. Opt.34,7474-7485(1995).
[5] H. Kadono, M. Ogusu, S. Toyooka,“Phase shifting common path interferometerusing a liquid-crystal phase modulator,” Opt. Commun.110,391-400(1994).
[6] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld,“Fourier phase microscopy for investigation of biologicalstructures and dynamics,” Opt. Lett.29,2503-2505(2004).
[7] N. Lue, W. Choi, G. Popescu, T. Ikeda, R. R. Dasari, K. Badizadegan, and M. S.Feld,“Quantitative phase imaging of live cells using fast Fourier phasemicroscopy,” Appl. Opt.46,1836-1842(2007).
[8] J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[9] V. Daria, J. Glückstad, P. C. Mogensen, R. L. Eriksen, and S. Sinzinger,“Implementing the generalized phase-contrast method in a planar-integratedmicro-optics platform,” Opt. Lett.27,945-947(2002).
[10] M. Teschke and S. Sinzinger,“Phase contrast imaging: a generalizedperspective,” J. Opt. Soc. Am. A26,1015-1021(2009).
[11] S. Wolfling, E. Lanzmann, M. Israeli, N. Ben-Yosef, and Y. Arieli,“Spatialphase-shift interferometry—a wavefront analysis technique forthree-dimensional topometry,” J. Opt. Soc. Am. A22,2498-2509(2005).
[12] R. Liang, J. K. Erwin, and M. Mansuripur,“Variation on Zernike’sphase-contrast microscope,” Appl. Opt.39,2152-2158(2000).
[13] T. Otaki,“Artifact Halo reduction in Phase Contrast microscopy usingApodization,” Opt. Rev.7,119-122(2000).
[14] C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte,“Phase contrastmicroscopy with full numerical aperture illumination,” Opt. Express16,19821-19829(2008).
[15] A. Y. M. NG, C. W. See and M. G. Somekh,“Quantitative optical microscopewith enhanced resolution using a pixelated liquid crystal spatial lightmodulator,” J. Microscopy214,334–340(2004).
[16] H. H. Hopkins and P.M. Barham,“The Influence of the Condenser onMicroscopic Resolution,” Proc. Phys. Soc. London Sect. B63,737-744(1950).
[17] V. Mico, Z. Zalevsky, and J. García,“Superresolution optical system bycommon-path interferometry,” Opt. Express14,5168-5177(2006).
[18] S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168-102(2006).
[19] T. R. Hillman, T. Gutzler, S. A. Alexandrov, and D. D. Sampson,“High-resolution, wide-field object reconstruction with synthetic apertureFourier holographic optical microscopy,” Opt. Express17,7873-7892(2009)
[20] J. W. Goodman,“Speckle Phenomena in Optics,”(Roberts,2007).
[21] G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,“Diffraction phasemicroscopy for quantifying cell structure and dynamics,” Opt. Lett.31,775-777(2006).
[22] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysis of a micropolarizer array-based simultaneous phase-shiftinginterferometer,” Appl. Opt.44,6861-6868(2005).
[1] D. Malacara,“Optical Shop Testing (John Wiley&Sons, Inc,2007).”
[2] W. Linnik,“Simple Interferometer to Test Optical Systems,” Comptes Radnusde l’Acade′mie des Sciences d l’U.R.SS.1,208(1933). Abstract in Z.Instrumentenkd.,54,463(1934).
[3] R. N. Smartt and J. Strong,“Point-Diffraction Interferometer,” J. Opt. Soc. Am.,62,737(1972).
[4] R. N Smartt and W. H. Steel,“Theory and application of point-differenceinterferometers,” Proceedings of the ICO Conference on Optical Methods inScientific and Industrial Measurements, Tokyo,1974; Jpn. J. Appl. Phys.,14,Suppl.1,351(1975).
[5] R. N. Smartt and W. H. Steel,“Point Diffraction Interferometer,” Appl. Opt.,24,1402(1985).
[6] J. Millerd, N. Brock, J. Hayes, M. Morris, M. Novak and J. Wyant,“PixelatedPhase-Mask Dynamic Interferometer,” Interferometry XII: Techniques andAnalysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).
[7] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysis of a micropolarizer array-based simultaneous phase-shiftinginterferometer,” Appl. Opt.44,6861-6868(2005).
[8] J. E. Millerd, N. J. Brock, J. B. Hayes and J. C. Wyant,“Instantaneousphase-shift, point-diffraction interferometer,” Interferometry XII: Techniquesand Analysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIEVol.5531254-272(SPIE, Bellingham, WA,2004).
[9] M. A. Jensen and G.P. Nordin,“Finite-aperture wire grid polarizers,” J. Opt. Soc.Am. A,17,2000.
[10] B. Stenkamp, M. Abraham, W. Ehrfeld, E. Knapek, M. Hintermaier, M.T. Gale,R. Morf,"Grid polarizer for the visible spectral region", SPHi Proc. Vol.2213, p.288-296(1994).
[11] E.-B. Kley, B. Schnabel, H. Hübner, U.-D. Zeitner,"Application of metallicsubwavelength gratings for polarization devices", SPIE Proc. Vol.2863, P.166-174(1996).
[12] V. Ronchi,“On the phase grating interferometer,” Appl. Opt.4,1041(1965).
[13] G. Vogl,“A phase grating interferometer,” Appl. Opt.3,1089(1964).
[14] F. Zernike,“Das Phasenkontrastverfahren bei der mikroskopischenBeobachtung, Z. Techn. Phys.16,454–457(1935).
[15] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld, Fourier phase microscopy for investigation of biologicalstructures and dynamics, Opt. Lett.29,2503-2505(2004).
[16] H. Kadono, M. Ogusu, and S. Toyooka,“Phase-shifting common-pathinterferometer using a liquid-crystal modulator,” Opt. Commun.110,391–400(1994).
[17] N. Lue, W. Choi, G. Popescu, T. Ikeda, R. R. Dasari, K. Badizadegan, and M. S.Feld, Quantitative phase imaging of live cells using fast Fourier phasemicroscopy, Appl. Opt.46,1836-1842(2007).
[18] J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[19] C. S. Yelleswarapu, M. Tipping, S. Kothapalli, A. Veraksa, and D. V. G. L. N.Rao,“Common-path multimodal optical microscopy,” Opt. Lett.34,1243-1245(2009).
[20] G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,“Diffraction phasemicroscopy for quantifying cell structure and dynamics,” Opt. Lett.31,775-777(2006).
[21] Y. Park, G. Popescu, K. Badizadegan, R. R. Dasari, and M. S. Feld,“Diffractionphase and fluorescence microscopy,” Opt. Express14,8263-8268(2006).
[22] P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao,"Phase-shiftingpoint-diffraction interferometry with common-path and in-line configuration formicroscopy," Opt. Lett.35,712-714(2010)
[23] V. Mico, Z. Zalevsky, and J. García,“Superresolution optical system bycommon-path interferometry,” Opt. Express14,5168-5177(2006).
[24] V. Mico, Z. Zalevsky, and J. García,“Common-path phase-shifting digitalholographic microscopy: A way to quantitative phase imaging andsuperresolution,” Opt. Commun.281,4273-4281(2008).
[25] I. Yamaguchi and T. Zhang,“Phase-shifting digital holography,” Opt. Lett.22,1268-1270(1997).
[26] P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,“Phase reconstructionfrom three interferograms based on integral of phase gradient,” J. Mod. Opt.55,2233-2242(2008).
[27] J. Schwider,“Continuous lateral shearing interferometer,” Appl. Opt.23,4403-4409(1984).
[1] F. Zernike,“Phase contrast, a new method for the microscopic observation oftransparent objects,” Physica9, Part I,686–698, Part II,974–986(1942).
[2] C. S. Anderson,“Fringe visibility, irradiance, and accuracy in common pathinterferometers for visualization of phase disturbances,” Appl. Opt.34,7474-7485(1995).
[3] H. Kadono, M. Ogusu, and S. Toyooka,“Phase shifting common pathinterferometer using a liquid-crystal phase modulator,” Opt. Commun.110,391-400(1994).
[4] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld,“Fourier phase microscopy for investigation of biologicalstructures and dynamics,” Opt. Lett.29,2503-2505(2004).
[5] H. Dupoisot, A. Poletaeff, G. Daury and P. de Vernejoul,“Off-axis recording andsynthetic aperture imaging in light microscopy,” Opt. commun.72,42-46(1989).
[6] P. Almoro, G. Pedrini and W. Osten,“Aperture synthesis in phase retrievalusing a volume-speckle field,” Opt. Lett.32,733-735(2007).
[7] G. Maire, F. Drsek, J. Girard, H. Giovannini, A. Talneau, D. Konan, K. Belkebir,P. C. Chaumet, and A. Sentenac,“Experimental Demonstration of QuantitativeImaging beyond Abbe’s Limit with Optical Diffraction Tomography,” Phys. Rev.Lett.102,213905(2009).
[8] S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168102(2006).
[9] J. Zhao, X. Yan, W. Sun, and J. Di,“Resolution improvement of digitalholographic images based on angular multiplexing with incoherent beams inorthogonal polarization states,” Opt. Lett.35,3519-3521(2010).
[10] J. Gass, A. Dakoff, and M. K. Kim,“Phase imaging without2pi ambiguity bymultiwavelength digital holography,” Opt. Lett.28,1141-1143(2003).
[11] J. Kuhn, T. Colomb, F. Montfort, F. Charriere, Y. Emery, E. Cuche, P. Marquetand C. Depeursinge,“Real-time dual-wavelength digital holographicmicroscopy with a single hologram acquisition,” Opt. Express15,7231-7242(2007).
[12] M. T. Rinehart, N. T. Shaked, N. J. Jenness, R. L. Clark, and A. Wax,“Simultaneous two-wavelength transmission quantitative phase microscopy witha color camera,” Opt. Lett.35,2612-2614(2010).
[13] A. Wada, M. Kato, and Y. Ishii,“Multiple-wavelength digital holographicinterferometry using tunable laser diodes,” Appl. Opt.47,2053-2060(2008).
[14] C. J. Mann, P. R. Bingham, V. C. Paquit and K. W. Tobin,“Quantitative phaseimaging by three-wavelength digital holography,” Opt. Express16,9753-9764(2008).
[15] S. Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P.Ferraro,“Recovering correct phase information in multiwavelength digitalholographic microscopy by compensation for chromatic aberrations,” Opt. Lett.30,2706–2708(2005).
[16] T. Colomb, F. Montfort, J. Kühn, N. Aspert, E. Cuche, A. Marian, F. Charrière, S.Bourquin, P. Marquet, and C. Depeursinge,“Numerical parametric lens forshifting, magnification, and complete aberration compensation in digitalholographic microscopy,” J. Opt. Soc. Am. A.23,3177–3190(2006).
[17].K. Choi, H. Kim, and B. Lee,“Full-colour autostereoscopic3D display systemusing colour-dispersion-compensated synthetic phase holograms,” Opt. Express12,5229–5236(2004).
[18] J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak and J. Wyant,“Pixelated Phase-Mask Dynamic Interferometer,” Interferometry XII:Techniques and Analysis, edited by Katherine Creath, Joanna Schmit,Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).
[2]. T. H. Barnes,"Heterodyne Fizeau interferometer for testing flat surfaces," Appl. Opt.26,2804-2809(1987).
[3]. B. W. Bell and C. L. Koliopoulos,"Moire topography, sampling theory charged-coupled devices," Opt. Lett.9,171-173(1984).
[4]. D. A. Bone, H. A. Bachor, and R. J. Sandeman,"Fringe pattern analysis using a2-D Fourier transform," Appl. Opt.25,1653-1660(1986).
[5]. C. P. Brophy,"Effect of intensity error correlation on the computed phase of phase-shifting interferometry," JOSA A7,537-541(1990).
[6].陈洪芳,谭久彬,钟志,“外差干涉仪中偏振分光镜对测量精度的影响,”计量学报,29,15-18(2008)
[7]. F. Charriere, J. Kuhn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P. Marquet, and C. Depeursinge,"Characterization of microlenses by digital holographic microscopy," Appl. Opt.45,829-835(2006).
[8]. B. Kemper and G. Bally,"Digital holographic microscopy for live cell applications and technical inspection," Appl. Opt.47, A52-A61(2008).
[9]. P. Ferraro, G. Coppola, S. D. Nicola, A. Finizio, and G. Pierattini,"Digital holographic microscope with automatic focus tracking by detecting sample displacement in real time," Opt. Lett.28,1257-1259(2003).
[10].钱晓凡,董可平,张磊,张永安,“反射式数字全息显微术对细胞的研究,”光子学报36(7),1318-1321(2007).
[11]. P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, M. Lei,"Phase and amplitude reconstruction from a single carrier-frequency interferogram without phase unwrapping," Appl Opt.47,2760-2766(2008).
[12]. N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,"Two-step only phase-shifting interferometry with optimized camera bandwidth for microscopy of live cells," Opt. Express17,15585-15591(2009).
[13]. N. T. Shaked, M. T. Rinehart, and A. Wax,"Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[14]. I. Yamaguchi and T. Zhang,"Phase-shifting digital holography," Opt. Lett.22,1268-1270(1997).
[15]. Z. Ma, H. Li, and X. Lü,“Complex amplitude reconstruction and phaseaberrations compensation in phase-shifting in-line image digital holographicmicroscopy,” Chin. Opt. Lett.7,1076-1078(2009).
[16]. G. Páez and M. Strojnik,“Phase-shifted interferometry without phaseunwrapping: reconstruction of a decentered wave front,” J. Opt. Soc. Am. A16,475-480(1999).
[17]. G. Lai and T. Yatagai,“Generalized phase-shifting interferometry,” J. Opt. Soc.Am. A8,822-827(1991).
[18]. J. Garcia-Sucerquia, W. Xu, S. K. Jericho, P. Klages, M. H. Jericho, and H. J.Kreuzer,“Digital in-line holographic microscopy,” Appl. Opt.45,836-850(2006)
[19]. M. Stedman, and K. Lindsey,“Limits of surface measurement by stylusinstruments,” Proc. SPIE,1009,56-61(1988).
[20]. J. M. Bennett and J. H. Dancy,“Stylus profiling instrument for measuringstatistical properties of smooth optical surfaces,” Appl. Opt.,20,1785-1802(1981).
[21]. J. F. Song and T. V. Vorburger,“Stylus profiling at high resolution and lowforce,” Appl. Opt.,30,42-50(1991).
[22]. R. J. Whitefield,"Noncontact optical profilometer," Appl. Opt.14,2480-2485(1975)
[23]. M. Stedman,“Limits of surface measurement by optical probes,” Proc SPIE.,1009,62-67(1988).
[24]. G. Binning, H. Rohrer, C. Gerber, and E. Weibei,“Surface studies by scanningtunneling microscope,” Phys. Rev. Lett.,4957-61(1982).
[25]. G. Binning, C. F. Quate, and C. Gerbeer,“Atomic force microscopy,” Phys. ReV.Lett.,56,930-933(1986).
[26]. D. W. Pohl, W. Denk,a) and M. Lanz,"Optical stethoscopy:Image recording with resolution λ/20," Appl. Phys. Lett.44,651-653(1984).
[27].邓江东,张春平,李增发,张光寅,张彦东,“扫描近场光学显微镜原理及其应用,”激光与光电子进展,3-8,(1997)
[28].王晓秋筒国树王克逸,“光子扫描隧道显微镜成像原理的数值研究,”激光杂志,24,55-56(2003)
[29].《Scanning Electron Microscopy and X-ray Microanalysis》, Third Edition, by Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, and Joseph Michael, Kluwer Academic/Plenum Publishers,2003ISBN:0306472929
[30]. A. H. Mirau, Interferometer, US Patent2612074(1952).
[31]. D. M. Gale, M. I. Pether, and J. C. Dainty,"Linnik microscope imaging of integrated circuit structures," Appl. Opt.35,131-148(1996).
[32].《The Principles of Physical Optics》, Ernst Mach, ISBN0-486-49559-0.170-175(2003).
[33]. P. Groot,"Phase-shift calibration errors in interferometers with spherical Fizeau cavities," Appl. Opt.34,2856-2863(1995).
[34]. J. Schwider,"Fizeau-type Multi-Pass Shack-Hartmann-Test," Opt. Express16,362-372(2008)
[35]. A. Dobroiu, H. Sakai, H. Ootaki, M. Sato, and N. Tanno,"Coaxial Mirau interferometer," Opt. Lett.27,1153-1155(2002).
[36]. B. Bhushan, J. C. Wyant, and C. L. Koliopoulos,"Measurement of surface topography of magnetic tapes by Mirau interferometry," Appl. Opt.24,1489-1497(1985).
[37]. M. P. Rimmer and J. C. Wyant,"Evaluation of Large Aberrations Using a Lateral-Shear Interferometer Having Variable Shear," Appl. Opt.14,142-150(1975).
[38].刘晓军,高咏生,“显微剪切干涉表面粗糙度轮廓测量,”中国测试技术,3-5(2004).
[39]. F. Zernike,"Phase contrast, a new method for the microscopic observation of transparent objects," Physica9, Part I,686-698, Part Ⅱ,974-986(1942).
[40]. G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari, and M. S. Feld,"Fourier phase microscopy for investigation of biological structures and dynamics," Opt. Lett.29,2503-2505(2004).
[41]. Chris S. Anderson,"Fringe visibility, irradiance, and accuracy in common path interferometers for visualization of phase disturbances," Appl. Opt.34,7474.7485(1995)
[42]. H. Kadono, M. Ogusu, S. Toyooka,"Phase shifting common path interferometer using a liquid-crystal phase modulator," Opt. Commun.,110,391-400(1994).
[43]. G. Popescu, T. Ikeda, K. Goda, C. Best-Popescu, M. Laposata, S. Manley, R. R. Dasari, K. Badizadegan, M. S. Feld,"Optical measurement of cell membrane tension,"phys. Rev. Lett.90,228101(2003).
[44]. F. Charriere, N. Pavillon, T. Colomb, C. Depeursinge, T. J. Heger, E. A. D. Mitchell, P. Marquet, and B. Rappaz,"Living specimen tomography by digital holographic microscopy:morphometry of testate amoeba," Opt. Express14,7005-7013(2006).
[45]. F. Charriere, A. Marian, F. Montfort, J. Kuehn, T. Colomb, E. Cuche, P. Marquet, and C. Depeursinge,"Cell refractive index tomography by digital holographic microscopy," Opt. Lett.31,178-180(2006).
[46]. K. Jeong, J. J. Turek, and D. D. Nolte,"Fourier-domain digital holographic optical coherence imaging of living tissue," Appl. Opt.46,4999-5008(2007).
[47]. B. Das and C. S. Yelleswarapu,"Dual plane in-line digital holographic microscopy," Opt. Lett.35,3426-3428(2010).
[48].陈磊,仇智“干涉显微镜测量小球面曲率半径,”红外和激光工程,35,67-71(2006)。
[49].丁志华,王桂英,包正康,“相移干涉显微镜的研制和光盘预刻槽形的测量,”计量学报,20,81-86(1999)。
[50].陈志清,吕如寿,“全息干涉显微术测量光纤折射率分布,”光学工程,5,21-23(1989)
[51]. J. Millerd, N. Brock, J. Hayes, M. Morris, M. Novak and J. Wyant,"Pixelated Phase-Mask Dynamic Interferometer," Interferometry Ⅻ:Techniques and Analysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).
[52]. M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,"Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer," Appl. Opt.44,6861-6868(2005).
[53].张越,俞刚,“激光M—Z干涉法应用于超音速燃烧流场测量,”推进技术,18,111-116(1997)
[54].刘文杰,俞刚,“用数字化M—Z干涉仪对低密度混合流场测量的实验研究,气动实验与测量控制,5,60-66(1991)。
[55]. P. A. J. de Korte and R. Laine,"Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy," Appl. Opt.18,236-242(1979).
[56]. J. M. Bennett,"Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer," Appl. Opt.15,2705-2721(1976).
[57]. E. B. Aleksandrov and A. M. Bonch-Bruevich,"Investigation of surface strains by the hologram technique," Sov. Phys.-Tech. Phys.12,258-265(1967).
[58]. A. E. Ennos,"Measurement of in-plane surface strain by hologram interferometry," Journ. Phys. E:Scient. Instr.1,731-734(1968).
[59]. E. Cuche, P. Marquet, and C. Depeursinge,"Spatial Filtering for Zero-Order and Twin-Image Elimination in Digital Off-Axis Holography," Appl. Opt.39,4070-4075(2000).
[60]. E. Cuche, P. Marquet, and C. Depeursinge,"Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms," Appl. Opt.38,6994-7001(1999).
[61]. G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,"Diffraction phase microscopy for quantifying cell structure and dynamics," Opt. Lett.31,775-777(2006).
[62]. G. Popescu, Y. Park, W. Choi, R. R. Dasari, M. S. Feld, K. Badizadegan,“Imaging red blood cell dynamics by quantitative phase microscopy,” BloodCells, Molecules, and Diseases,41,10-16(2008).
[63]. B. Kouskousis, D. J. Kitcher, S. Collins, A. Roberts, and G. W. Baxter,“Quantitative phase and refractive index analysis of optical fibers usingdifferential interference contrast microscopy,” Appl. Opt.47,5182-5189(1981).
[64]. C. Preza,“Rotational-diversity phase estimation from differentialinterference-contrast microscopy images,” J. Opt. Soc. Am. A,17,415-424(2000).
[65]. J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[66]. S. Wolfling, E. Lanzmann, M. Israeli, N. Ben-Yosef, and Y. Arieli,“Spatialphase-shift interferometry—a wavefront analysis technique forthree-dimensional topometry,” J. Opt. Soc. Am. A22,2498-2509(2005).
[67]. C. S. Yelleswarapu, M. Tipping, S.-R. Kothapalli, A. Veraksa, and D. V. G. L. N.Rao,“Common-path multimodal optical microscopy,” Opt. Lett.34,1243-1245(2009).
[68]. J. H. Brunning,“Optical shop testing,” edited by D Malacara, wiley, New York(2007).
[69]. J. H. Bruning,“Fringe scanning interferometers,” in optical shop testing, D.Malacara Ed.,1st Edition, Wiley, New York,1978.
[70]. Johannes Schwider, Oliver Falkenst rfer, Horst Schreiber, Andreas Z ller,Norbert Streibl,“New compensating four-phase algorithm for phase-shiftinterferometry,” Opt., Eng.,32,1883-1885(1993).
[71]. J. Schmit and K. Creath,“Extended averaging technique for derivation oferror-compensating algorithms in phase-shifting interferometry,” Appl. Opt.34,3610-3619(1995).
[72]. L. Cai, Q. Liu, and X. Yang,“Phase-shift extraction and wave-frontreconstruction in phase-shifting interferometry with arbitrary phase steps,” Opt.Lett.28,1808-1810(2003).
[73]. D. C. Ghiglia and L. A. Romero,"Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A11,107-117(1994).
[74]. M. D. Pritt, J. S. Shipman,"Least-Squares Two-Dimensional Phase Unwrapping Using FFT's [J]," IEEE Trans, on GRS32:706-708(1994).
[75]. R. M. Goldstein, H. A. Zehker, and C. L. Werner,"Satellite radar interferometry: Synthetic aperture radar observations," Radio Science,23,713-720(1988).
[76]. J. M. Huntley,"Noise-immune phase unwrapping algorithm," Appl. Opt.28,3268-3270(1989).
[77]. Ching N. H., D. Rosenfeld, and M. Braun,"Two Dimensional Phase Unwrapping Using a Miminum Spanning Tree Algorithm," IEEE Transaction on Image Processing,1,355-365(1992).
[78]. Herraez M. A., D. R. Burton, M. J. Lalor, and D. B. Clegg,"Robust Unwrapper for Twodimensional Images," Proc. SPIE,2784,106(1996).
[79]. R. Smythe and R. Moore,"Instantaneous phase measuring interferometry," Opt. Eng.23,361-364(1984).
[80]. Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba,"Parallel two-step phase-shifting digital holography," Appl. Opt.47, D183-D189(2008).
[81].左芬,陈磊,徐春生,“基于二维光栅分光的同步移相干涉测量技术,”光学学报27(4),663-667(2007).
[82]. V. Mico, Z. Zalevsky, and J. Garcia,"Superresolution optical system by common-path interferometry," Opt. Express14,5168-5177(2006).
[83]. V. Mico, Z. Zalevsky, and J. Garcia,"Common-path phase-shifting digital holographic microscopy:A way to quantitative phase imaging and superresolution," Opt. Commn.281(17),4273-4281(2008).
[84]. C. J. Schwarz, Y. Kuznetsova, and S. R. J. Brueck,"Imaging interferometric microscopy," Opt. Lett.28,1424-1426(2003).
[85]. P. Almoro, G. Pedrini, and W. Osten,"Aperture synthesis in phase retrieval using a volume-speckle field," Opt. Lett.32,733-735(2007).
[86]. J. Zhao, X. Yan, W. Sun, and J. Di,"Resolution improvement of digitalholographic images based on angular multiplexing with incoherent beams inorthogonal polarization states," Opt. Lett.35,3519-3521(2010)
[87]. S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168-102(2006).
[88]. T. R. Hillman, T. Gutzler, S. A. Alexandrov, and D. D. Sampson,“High-resolution, wide-field object reconstruction with synthetic apertureFourier holographic optical microscopy,” Opt. Express17,7873-7892(2009).
[89]. J. Maycock, B. M. Hennelly, J. B. McDonald, Y. Frauel, A. Castro, B. Javidi,and T. J. Naughton,“Reduction of speckle in digital holography by discreteFourier filtering,” J. Opt. Soc. Am. A24,1617-1622(2007).
[90]. J. Garcia-Sucerquia, J. H. Ramírez, and R. Castaneda,“Incoherent recovering ofthe spatial resolution in digital holography,” Opt. Commun.260,62–67(2006).
[91]. D. Kim,“Reduction of coherent artifacts in dynamic holographicthree-dimensional displays by diffractionspecific pseudorandom diffusion,” Opt.Lett.29,611–613(2004).
[92]. N. Bertaux, Y. Frauel, P. Réfrégier, and B. Javidi,“Speckle removal using amaximum-likelihood technique with isoline gray-level regularization,” J. Opt.Soc. Am. A21,2283–2291(2004).
[93]. J. C. Dainty and W. T. Welford,“Reduction of speckle in image plane hologramreconstruction by use of a moving pupil,” Opt. Commun.3,289–294(1971).
[94]. P. Hariharan and Z. S. Hegedus,“Reduction of speckle in coherent imaging byspatial frequency sampling,” Opt. Acta21,345–356(1974).
[95]. P. Ferraro, G. Coppola, S. D. Nicola, A. Finizio, and G. Pierattini,“Digitalholographic microscope with automatic focus tracking by detecting sampledisplacement in real time,” Opt. Lett.28,1257-1259(2003).
[96]. P. Langehanenberg, B. Kemper, D. Dirksen, and G. Bally,“Autofocusing indigital holographic phase contrast microscopy on pure phase objects for live cellimaging,” Appl. Opt.47, D176-D182(2008).
[97]. F. Dubois, C. Schockaert, N. Callens, and C. Yourassowsky,"Focus plane detection criteria in digital holography microscopy by amplitude analysis," Opt. Express14,5895-5908(2006).
[98]. M. Antkowiak, N. Callens, C. Yourassowsky, and F. Dubois,"Extended focused imaging of a microparticle field with digital holographic microscopy," Opt. Lett.33,1626-1628(2008).
[99].王华英,刘景波,王大勇,赵洁,“显微数字全息数值再现中的自动聚焦,”光学学报28,343-347(2008).
[100]. J. Kuhn, T. Colomb, F. Montfort, F. Charriere, Y. Emery, E. Cuche, P. Marquet and C. Depeursinge,"Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition," Opt. Express15,7231-7242(2007).
[101]. M. T. Rinehart, N. T. Shaked, N. J. Jenness, R. L. Clark, and A. Wax,"Simultaneous two-wavelength transmission quantitative phase microscopy with a color camera," Opt. Lett.35,2612-2614(2010).
[102]. A. Wada, M. Kato, and Y. Ishii,"Multiple-wavelength digital holographic interferometry using tunable laser diodes," Appl. Opt.47,2053-2060(2008).
[103]. S. Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P. Ferraro,"Recovering correct phase information in multiwavelength digital holographic microscopy by compensation for chromatic aberrations," Opt. Lett.30,2706-2708(2005).
[104]. T. Colomb, F. Montfort, J. Kuhn, N. Aspert, E. Cuche, A. Marian, F. Charriere, S. Bourquin, P. Marquet, and C. Depeursinge,"Numerical parametric lens for shifting, magnification, and complete aberration compensation in digital holographic microscopy," J. Opt. Soc. Am. A.23,3177-3190(2006).
[1] T. H. Barnes,“Heterodyne Fizeau interferometer for testing flat surfaces,” Appl.Opt.26,2804-2809(1987).
[2] B. W. Bell and C. L. Koliopoulos,“Moire topography, sampling theorycharged-coupled devices,” Opt. Lett.9,171-173(1984).
[3] D. A. Bone, H. A. Bachor, and R. J. Sandeman,“Fringe pattern analysis using a2-D Fourier transform,” Appl. Opt.25,1653-1660(1986).
[4] C. P. Brophy,“Effect of intensity error correlation on the computed phase ofphase-shifting interferometry, JOSA A7,537-541(1990).
[5] M. Takeda, H. Ina, and S. Kobayashi,"Fourier-transform method offringe-pattern analysis for computer-based topography and interferometry," J.Opt. Soc. Am.72,156-160(1982).
[6] D. J. Bone, H.-A. Bachor, and R. J. Sandeman,"Fringe-pattern analysis using a2-D Fourier transform," Appl. Opt.25,1653-1660(1986).
[7] J. A. Ferrari and E. M. Frins,“Multiple phase-shifted interferograms obtainedfrom a single interferogarm with linear carrier,” Opt. commun.271,59-64(2007).
[8] P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,“Phase and amplitudereconstruction from a single carrier-frequency interferogram,” Appl. Opt.47,2760-2766(2008).
[9] P. Carre′“Installation et utilisation du comparateur photoe′lectrigue etInterferentiel du Bureau International des Poids ek Measures,” Metrologia,1,13-23(1966).
[10] R. Crane.,‘‘Interference Phase Measurement,’’ Appl. Opt.,8,538(1969).
[11] J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, andD. J. Brangaccio,‘‘Digital wavefront measuring interferometer for testingoptical surfaces, lenses,’’ Appl. Opt.,13,2693(1974).
[12] J. C. Wyant,“Use of an ac heterodyne lateral shear interferometer with real-timewavefront correction systems,” Appl. Opt.,14,2622(1975).
[13] Johannes Schwider, Oliver Falkenst rfer, Horst Schreiber, Andreas Z ller,Norbert Streibl,“New compensating four-phase algorithm for phase-shiftinterferometry,” Opt., Eng.,32,1883-1885(1993)
[14] J. Schmit and K. Creath,“Extended averaging technique for derivation oferror-compensating algorithms in phase-shifting interferometry,” Appl. Opt.34,3610-3619(1995).
[15] H. Bi, Y. Zhang, K. V. Link, and C. Wen,“Class of4+1phase algorithum witherror compensation,”Appl. Opt.43,4199-4207(2004).
[16]N. T. Shaked, M. T. Rinehart, and A. Wax,“Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[17] N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,“Two-step onlyphase-shifting interferometry with optimized camera bandwidth for microscopyof live cells,” Opt. Express17,15585–15591(2009).
[18] N. Pavillon, C. Arfire, I. Bergo nd, and C. Depeursinge,"Iterative method forzero-order suppression in off-axis digital holography," Opt. Express18,15318-15331(2010)
[19] X. Meng, L. Cai, X.Xu, X. Yang, X. Shen, G. Dong, and Y. Wang,“Two-stepphase-shifting interferometry and its application in image encryption,” Opt. Lett.31,1414-1416(2006).
[20]Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, andO. Matoba,“Parallel two-step phase-shifting digital holography,” Appl. Opt.47,D183-D189(2008).
[21]T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,“Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography,” Opt. Express18,9555-9560(2010).
[22]J. Liu and T. Poon,“Two-step-only quadrature phase-shifting digitalholography,” Opt. Lett.34,250-252(2009).
[23] J. E. Greivenkamp,“Generalized Data Reduction for HeterodyneInterferometry,” Opt. Eng.,23,350(1984).
[24] J. Schwider, R. Burow, K. E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel,“Digital wave-front measuring interferometry: some systematic error sources,”Appl. Opt.,22,3421-3432(1983).
[25] Z. Wang and B. Han,"Advancediterative algorithm for phase extraction ofrandomly phase-shifted interferograms," Opt. Lett.29,1671-1673(2004).
[26] C. Guo, L. Zhang, H. Wang, J. Liao, and Y. Y. Zhu,"Phase-shifting error and itselimination in phase-shifting digital holography," Opt. Lett.27,1687-1689(2002).
[27] X. F. Xu, L. Z. Cai, X. F. Meng, G. Y. Dong, and X. X. Shen,"Fast blindextraction of arbitrary unknown phase shifts by an iterative tangent approach ingeneralized phase-shifting interferometry," Opt. Lett.31,1966-1968(2006).
[28]L. Z. Cai, Q. Liu, and X. L. Yang,“Generalized phase-shifting interferometrywith arbitrary unknown phase steps for diffraction objects,” Opt. Lett.29,183-185(2004).
[29] X. Xu, L. Cai, Y. Wang, X. Meng, W. Sun, H. Zhang, X. Cheng, G. Dong, andX. Shen,“Simple direct extraction of unknown phase shift and wavefrontreconstruction in generalized phase-shifting interferometry: algorithm andexperiments,” Opt. Lett.33,776-778(2008).
[30] X. Xu, L. Cai, Y. Wang, X. Yang, X. Meng,G. Dong, X. Shen, and H. Zhang,“Generalized phase-shifting interferometry with arbitrary unknown phase shifts:Direct wave-front reconstruction by blind phase shift extraction and itsexperimental verification”Appl. Phys. Lett.90,121-124(2007).
[31] Peng Gao, Baoli Yao, Norbert Lindlein, Klaus Mantel, Irina Harder, and EduardGeist,"Phase-shift extraction for generalized phase-shifting interferometry," Opt.Lett.34,3553-3555(2009).
[32]F. Charrière, J. Kühn, T. Colomb, F. Montfort, E. Cuche, Y. Emery, K. Weible, P.Marquet, and C. Depeursinge,“Characterization of microlenses by digitalholographic microscopy,” Appl. Opt.45,829-835(2006).
[33]P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,"Phase reconstruction from three interferograms based on integral of phase gradient," J. Mod. Opt.55,2233-2242(2008).
[34]C. Dennis. and A. R. Louis "Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A11,107-117(1994).
[35]A. Baldi,"Two-dimensional phase unwrapping by quad-tree decomposition," Appl. Opt.40,1187-1194(2001).
[36]Y. Shi,"Robust phase unwrapping by spinning iteration," Opt. Express15,8059-8064(2007).
[37]K. Itoh,"Analysis of the Phase Unwrapping Algorithm," Appl. Opt.1982,21,2470-2470.
[38]L. Aiello, D. Riccio, P. Ferraro, S. Grilli, L. Sansone, G. Coppola, S. Nicola, and A.Finizio,"Green's formulation for robust phase unwrapping in digital holography," Opt. commun.45,750-755(2007).
[39]G. Abdul-Rahman, M. deisat, D. R. Burton, M. J. Lalor, F. Lilley, and C. J. Moore,"Fast and robust three-dimentional best path phase unwrapping algorithm," Appl. Opt.46,6623-6635(2007).
[40]G. Paez, and M. Strojnik,"Fringe Analysis and Phase Reconstruction from Modulated Intensity Patterns," Opt. Lett.22,1969-1971(1997).
[41]G. Paez, and M. Strojnik,"Phase-Shifted Interferometry Without Phase Unwrapping:Reconstruction of a Decent Wave Front," J. Opt. Soc, Am. A16,475-480(1999).
[42]D. C. Ghiglia and L. A. Romero,"Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods," J. Opt. Soc. Am. A,11,107-117(1994).
[43]M. D. Pritt, J. S. Shipman,"Least-Squares Two-Dimensional Phase Unwrapping Using FFT's," IEEE Trans, on GRS32(3):706-708(1994)
[44]惠梅,王东生等,“基于离散泊松方程解的相位展开方法[J],”光学学报23(10),1245-1249(2003).
[45]钱克矛,伍小平.“基于调制度分析的加权最小二乘相位展开方法[J],”光子学报,30(5),585-588(2001).
[46]钱晓凡,张永安,李新宇,马惠.“基于掩膜和最小二乘迭代的相位解包裹方法,”光学学报30(2),440-444(2010).
[47]Junhe Han, Baoli Yao, Peng Gao, Liju Chen, Yingli Wang, Ming Lei, Application of bacteriorhodopsin film for polarization phase-shifting interferometry, J. Mod. Opt.2008,55:2215-2222.
[48]Peng Gao, Baoli Yao, Junhe Han, Liju Chen, Yingli Wang, Ming Lei,"Phase reconstruction from three interferograms based on integral of phase gradient," J. Mod. Opt.,2008,55(14)2233-2242.
[1] K. Bhattacharya,“Generation of Phase-Modulated Periodic Optical Signals by useof a Polarization Interferometer,” Appl. Opt.40,261-267(2001).
[2] Q. Kemao, W. Xiaoping, and A. Asundi,“Grating-based real-time polarizationphase-shifting interferometry: error analysis,” Appl. Opt.41,2448-2453(2002).
[3] R. Smythe and R. Moore,“Instantaneous phase measuring interferometry,” Opt.Eng.23,361–364(1984).
[4] C. Koliopoulos,“Simultaneous phase shift interferometer,” Proc. SPIE.1531,119–127(1991).
[5] N. R. Sivakumar, W. K. Hui, K. Venkatakrishnan, and B. K. A. Ngoi,“Largesurface profile measurement with instantaneous phase-shifting intferometry,” Opt.Eng.42,367-372(2003).
[6] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysisof a micropolarizer array-based simultaneous phase-shifting interferometer,” Appl.Opt.44,6861-6868(2005).
[7] Y. Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O.Matoba,“Parallel two-step phase-shifting digital holography,” Appl. Opt.47,D183-D189(2008).
[8] Y. Awatsuji, A. Fujii, T. Kubota, and O. Matoba,"Parallel three-step phase-shiftingdigital holography," Appl. Opt.45,2995-3002(2006)
[9] T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,“Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography,” Opt. Express18,9555-9560(2010).
[10] T. Kakue, T. Tahara, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T. Kubota,and O. Matoba,"Parallel phase-shifting color digital holography using two phaseshifts," Appl. Opt.48, H244-H250(2009).
[11] G. Rodriguez-Zurita, C. Meneses-Fabian, N. Toto-Arellano, J. Vazquez-Castillo, C.Robledo-Sánchez,“One-shot phase-shifting phase-grating interferometry withmodulation of polarization: case of four interferograms,” Opt. Express16,7806-7817(2008).
[12] G. Rodriguez-Zurita, C. Meneses-Fabian, N.-I. Toto-Arellano, J. F.Vázquez-Castillo, and C. Robledo-Sánchez,“One-Shot Phase-ShiftingPhase-Grating Interferometry with Modulation of Polarization: case of fourinterferograms,” Opt. Express16,7806-7817(2008).
[13] N.-I. Toto-Arellano, G. Rodriguez-Zurita, C. Meneses-Fabian, and J.Vazquez-Castillo,"Phase shifts in the Fourier spectra of phase gratings and phasegrids: an application for one-shot phase-shifting interferometry," Opt. Express16,19330-19341(2008).
[14] C. Meneses-Fabian, G. Rodriguez-Zurita, M. Encarnacion-Gutierrez, N.-I.Toto-Arellano,“Phase-shifting interferometry with four interferograms using linearpolarization modulation and a Ronchi grating displaced by only a small unknownamount,” Opt. Commun.28230633068(2009).
[15] G. Rodriguez-Zurita, N.-I. Toto-Arellano, C. Meneses-Fabian, and J. F.Vázquez-Castillo,“One-shot phase-shifting interferometry: five, seven, and nineinterferograms,” Opt. Lett.33,2788-2790(2008).
[16] Cruz Meneses-Fabian and Gustavo Rodriguez-Zurita,“Optical tomography oftransparent objects with phase-shifting interferometry and stepwise-shifted Ronchiruling,” J. Opt. Soc. Am. A23,298–305(2006).
[17] N. Toto-Arellano, G. Rodriguez-Zurita, C. Meneses-Fabian, and J. Vazquez-Castillo,“Phase shifts in the Fourier spectra of phase gratings and phase grids: an applicationfor one-shot phase-shifting interferometry,” Opt. Express16,19330-19341(2008).
[18] T. Kiire, S. Nakadate, and M. Shibuya,“Simultaneous formation of four fringes byusing a polarization quadrature phase-shifting interferometer with wave plates and adiffraction grating,” Appl. Opt.47,4787-4792(2008).
[19] N. T. Shaked, M. T. Rinehart, and A. Wax,“Dual-interference-channelquantitative-phase microscopy of live cell dynamics,” Opt. Lett.34,767-769(2009).
[20] N. Shaked, T. Newpher, M. Ehlers, and A. Wax,“Parallel on-axis holographic phasemicroscopy of biological cells and unicellular microorganism dynamics,” Appl. Opt.49,2872-2878(2010).
[21] M. Kujawinska and D. Robinson,“Multichannel phase-stepped holographicinterferometry,” Appl. Opt.27,312-320(1988).
[22]L. Chen, S. Yeh, A. Tapilouw, and J. Chang,"3-D surface profilometry using simultaneous phase-shifting interferometry," Opt. Commn.283,3376-3382(2010).
[23]B. Garcia, A. Moore, C. Perez-Lopez, L. Wang, and T. Tschudi,"Transient Deformation Measurement with Electronic Speckle Pattern Interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping," Appl. Opt.38,5944.5947(1999).
[24]左芬,陈磊,徐春生,“基于二维光栅分光的同步移相干涉测量技术,”光学学报27(4),663-667(2007).
[25]E. Ribak and S. Lipson,"Complex spatial coherence function:its measurement by means of a phase-modulated shearing interferometer," Appl. Opt.20,1102-1106(1981).
[26]M. Santarsiero and R. Borghi,"Measuring spatial coherence by using a reversed-wavefront Young interferometer," Opt. Lett.31,861-863(2006).
[27]J. Ferrari and E. Frins,"Single-element interferometer," Opt. Commun.279,235-239(2007).
[28]W. Qu, Y Yu, C. Chee, and A. Asundi,"Digital holographic microscopy with physical phase compensation," Opt. Lett.34,1276-1278(2009).
[29]V. Ronchi,"On the phase grating interferometer,",Appl. Opt.4,1041-1042(1965).
[30]G. Vogl,"A phase grating interferometer,",Appl. Opt.3,1089-1089(1964).
[31]P. Ferraro, S. De Nicola, A. Finizio, G Coppola, S. Grilli, C. Magro, and G Pierattini,"Compensation of the Inherent Wave Front Curvature in Digital Holographic Coherent Microscopy for Quantitative Phase-Contrast Imaging," Appl. Opt.42,1938-1946(2003).
[32]E. Cuche, P. Marquet, and C. Depeursinge,"Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms," Appl. Opt.38,6994-7001(1999).
[33]X. Meng, L. Cai, X. Xu, X. Yang, X. Shen, G Dong, and Y Wang,"Two-step phase-shifting interferometry and its application in image encryption," Opt. Lett.31,1414-1416(2006).
[34]Y Awatsuji, T. Tahara, A. Kaneko, T. Koyama, K. Nishio, S. Ura, T. Kubota, and O. Matoba,"Parallel two-step phase-shifting digital holography," Appl. Opt.47,D183-D189(2008).
[35] T. Kakue, Y. Moritani, K. Ito, Y. Shimozato, Y. Awatsuji, K. Nishio, S. Ura, T.Kubota, and O. Matoba,"Image quality improvement of parallel four-stepphase-shifting digital holography by using the algorithm of parallel two-stepphase-shifting digital holography," Opt. Express18,9555-9560(2010).
[36] J.-P. Liu and T.-C. Poon,“Two-step-only quadrature phase-shifting digitalholography,” Opt. Lett.34,250-252(2009).
[37] N. T. Shaked, Y. Zhu, M. T. Rinehart, and A. Wax,“Two-step only phase-shiftinginterferometry with optimized camera bandwidth for microscopy of live cells,” Opt.Express17,15585–15591(2009).
[38] P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao,“Phase-shiftingpoint-diffraction interferometry with common-path and in-line configuration formicroscopy,” Opt. Lett.35,712-714(2010).
[39] P. Gao, B. Yao, J. Min, R. Guo, J. Zheng, T. Ye, I. Harder, V. Nercissian, K. Mantel,“Parallel two-step phase-shifting point-diffraction interferometry for microscopybased on a pair of cube beamsplitters,” Opt. Express,19,1930-1935(2011).
[1] F. Zernike,“Phase contrast, a new method for the microscopic observation oftransparent objects,” Physica9, Part I,686–698, Part II,974–986(1942).
[2] F. Zernike,“Phasecontrast, a new method for the microscopic observation oftransparent objects. Part II.,” Physica (Utrecht)9,974–986(1942).
[3] F. Zernike,“How I discovered phase contrast,” Science121,345–349(1955).
[4] C. S. Anderson,“Fringe visibility, irradiance, and accuracy in common pathinterferometers for visualization of phase disturbances,” Appl. Opt.34,7474-7485(1995).
[5] H. Kadono, M. Ogusu, S. Toyooka,“Phase shifting common path interferometerusing a liquid-crystal phase modulator,” Opt. Commun.110,391-400(1994).
[6] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld,“Fourier phase microscopy for investigation of biologicalstructures and dynamics,” Opt. Lett.29,2503-2505(2004).
[7] N. Lue, W. Choi, G. Popescu, T. Ikeda, R. R. Dasari, K. Badizadegan, and M. S.Feld,“Quantitative phase imaging of live cells using fast Fourier phasemicroscopy,” Appl. Opt.46,1836-1842(2007).
[8] J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[9] V. Daria, J. Glückstad, P. C. Mogensen, R. L. Eriksen, and S. Sinzinger,“Implementing the generalized phase-contrast method in a planar-integratedmicro-optics platform,” Opt. Lett.27,945-947(2002).
[10] M. Teschke and S. Sinzinger,“Phase contrast imaging: a generalizedperspective,” J. Opt. Soc. Am. A26,1015-1021(2009).
[11] S. Wolfling, E. Lanzmann, M. Israeli, N. Ben-Yosef, and Y. Arieli,“Spatialphase-shift interferometry—a wavefront analysis technique forthree-dimensional topometry,” J. Opt. Soc. Am. A22,2498-2509(2005).
[12] R. Liang, J. K. Erwin, and M. Mansuripur,“Variation on Zernike’sphase-contrast microscope,” Appl. Opt.39,2152-2158(2000).
[13] T. Otaki,“Artifact Halo reduction in Phase Contrast microscopy usingApodization,” Opt. Rev.7,119-122(2000).
[14] C. Maurer, A. Jesacher, S. Bernet, and M. Ritsch-Marte,“Phase contrastmicroscopy with full numerical aperture illumination,” Opt. Express16,19821-19829(2008).
[15] A. Y. M. NG, C. W. See and M. G. Somekh,“Quantitative optical microscopewith enhanced resolution using a pixelated liquid crystal spatial lightmodulator,” J. Microscopy214,334–340(2004).
[16] H. H. Hopkins and P.M. Barham,“The Influence of the Condenser onMicroscopic Resolution,” Proc. Phys. Soc. London Sect. B63,737-744(1950).
[17] V. Mico, Z. Zalevsky, and J. García,“Superresolution optical system bycommon-path interferometry,” Opt. Express14,5168-5177(2006).
[18] S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168-102(2006).
[19] T. R. Hillman, T. Gutzler, S. A. Alexandrov, and D. D. Sampson,“High-resolution, wide-field object reconstruction with synthetic apertureFourier holographic optical microscopy,” Opt. Express17,7873-7892(2009)
[20] J. W. Goodman,“Speckle Phenomena in Optics,”(Roberts,2007).
[21] G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,“Diffraction phasemicroscopy for quantifying cell structure and dynamics,” Opt. Lett.31,775-777(2006).
[22] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysis of a micropolarizer array-based simultaneous phase-shiftinginterferometer,” Appl. Opt.44,6861-6868(2005).
[1] D. Malacara,“Optical Shop Testing (John Wiley&Sons, Inc,2007).”
[2] W. Linnik,“Simple Interferometer to Test Optical Systems,” Comptes Radnusde l’Acade′mie des Sciences d l’U.R.SS.1,208(1933). Abstract in Z.Instrumentenkd.,54,463(1934).
[3] R. N. Smartt and J. Strong,“Point-Diffraction Interferometer,” J. Opt. Soc. Am.,62,737(1972).
[4] R. N Smartt and W. H. Steel,“Theory and application of point-differenceinterferometers,” Proceedings of the ICO Conference on Optical Methods inScientific and Industrial Measurements, Tokyo,1974; Jpn. J. Appl. Phys.,14,Suppl.1,351(1975).
[5] R. N. Smartt and W. H. Steel,“Point Diffraction Interferometer,” Appl. Opt.,24,1402(1985).
[6] J. Millerd, N. Brock, J. Hayes, M. Morris, M. Novak and J. Wyant,“PixelatedPhase-Mask Dynamic Interferometer,” Interferometry XII: Techniques andAnalysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).
[7] M. Novak, J. Millerd, N. Brock, M. North-Morris, J. Hayes, and J. Wyant,“Analysis of a micropolarizer array-based simultaneous phase-shiftinginterferometer,” Appl. Opt.44,6861-6868(2005).
[8] J. E. Millerd, N. J. Brock, J. B. Hayes and J. C. Wyant,“Instantaneousphase-shift, point-diffraction interferometer,” Interferometry XII: Techniquesand Analysis, edited by Katherine Creath, Joanna Schmit, Proceedings of SPIEVol.5531254-272(SPIE, Bellingham, WA,2004).
[9] M. A. Jensen and G.P. Nordin,“Finite-aperture wire grid polarizers,” J. Opt. Soc.Am. A,17,2000.
[10] B. Stenkamp, M. Abraham, W. Ehrfeld, E. Knapek, M. Hintermaier, M.T. Gale,R. Morf,"Grid polarizer for the visible spectral region", SPHi Proc. Vol.2213, p.288-296(1994).
[11] E.-B. Kley, B. Schnabel, H. Hübner, U.-D. Zeitner,"Application of metallicsubwavelength gratings for polarization devices", SPIE Proc. Vol.2863, P.166-174(1996).
[12] V. Ronchi,“On the phase grating interferometer,” Appl. Opt.4,1041(1965).
[13] G. Vogl,“A phase grating interferometer,” Appl. Opt.3,1089(1964).
[14] F. Zernike,“Das Phasenkontrastverfahren bei der mikroskopischenBeobachtung, Z. Techn. Phys.16,454–457(1935).
[15] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld, Fourier phase microscopy for investigation of biologicalstructures and dynamics, Opt. Lett.29,2503-2505(2004).
[16] H. Kadono, M. Ogusu, and S. Toyooka,“Phase-shifting common-pathinterferometer using a liquid-crystal modulator,” Opt. Commun.110,391–400(1994).
[17] N. Lue, W. Choi, G. Popescu, T. Ikeda, R. R. Dasari, K. Badizadegan, and M. S.Feld, Quantitative phase imaging of live cells using fast Fourier phasemicroscopy, Appl. Opt.46,1836-1842(2007).
[18] J. Glückstad and P. C. Mogensen,“Optimal Phase Contrast in Common-PathInterferometry,” Appl. Opt.40,268-282(2001).
[19] C. S. Yelleswarapu, M. Tipping, S. Kothapalli, A. Veraksa, and D. V. G. L. N.Rao,“Common-path multimodal optical microscopy,” Opt. Lett.34,1243-1245(2009).
[20] G. Popescu, T. Ikeda, R. R. Dasari, and M. S. Feld,“Diffraction phasemicroscopy for quantifying cell structure and dynamics,” Opt. Lett.31,775-777(2006).
[21] Y. Park, G. Popescu, K. Badizadegan, R. R. Dasari, and M. S. Feld,“Diffractionphase and fluorescence microscopy,” Opt. Express14,8263-8268(2006).
[22] P. Gao, I. Harder, V. Nercissian, K. Mantel, and B. Yao,"Phase-shiftingpoint-diffraction interferometry with common-path and in-line configuration formicroscopy," Opt. Lett.35,712-714(2010)
[23] V. Mico, Z. Zalevsky, and J. García,“Superresolution optical system bycommon-path interferometry,” Opt. Express14,5168-5177(2006).
[24] V. Mico, Z. Zalevsky, and J. García,“Common-path phase-shifting digitalholographic microscopy: A way to quantitative phase imaging andsuperresolution,” Opt. Commun.281,4273-4281(2008).
[25] I. Yamaguchi and T. Zhang,“Phase-shifting digital holography,” Opt. Lett.22,1268-1270(1997).
[26] P. Gao, B. Yao, J. Han, L. Chen, Y. Wang, and M. Lei,“Phase reconstructionfrom three interferograms based on integral of phase gradient,” J. Mod. Opt.55,2233-2242(2008).
[27] J. Schwider,“Continuous lateral shearing interferometer,” Appl. Opt.23,4403-4409(1984).
[1] F. Zernike,“Phase contrast, a new method for the microscopic observation oftransparent objects,” Physica9, Part I,686–698, Part II,974–986(1942).
[2] C. S. Anderson,“Fringe visibility, irradiance, and accuracy in common pathinterferometers for visualization of phase disturbances,” Appl. Opt.34,7474-7485(1995).
[3] H. Kadono, M. Ogusu, and S. Toyooka,“Phase shifting common pathinterferometer using a liquid-crystal phase modulator,” Opt. Commun.110,391-400(1994).
[4] G. Popescu, L. P. Deflores, J. C. Vaughan, K. Badizadegan, H. Iwai, R. R. Dasari,and M. S. Feld,“Fourier phase microscopy for investigation of biologicalstructures and dynamics,” Opt. Lett.29,2503-2505(2004).
[5] H. Dupoisot, A. Poletaeff, G. Daury and P. de Vernejoul,“Off-axis recording andsynthetic aperture imaging in light microscopy,” Opt. commun.72,42-46(1989).
[6] P. Almoro, G. Pedrini and W. Osten,“Aperture synthesis in phase retrievalusing a volume-speckle field,” Opt. Lett.32,733-735(2007).
[7] G. Maire, F. Drsek, J. Girard, H. Giovannini, A. Talneau, D. Konan, K. Belkebir,P. C. Chaumet, and A. Sentenac,“Experimental Demonstration of QuantitativeImaging beyond Abbe’s Limit with Optical Diffraction Tomography,” Phys. Rev.Lett.102,213905(2009).
[8] S. A. Alexandrov, T. R. Hillman, T. Gutzler, and D. D. Sampson,“SyntheticAperture Fourier Holographic Optical Microscopy,” Phys. Rev. Lett.97,168102(2006).
[9] J. Zhao, X. Yan, W. Sun, and J. Di,“Resolution improvement of digitalholographic images based on angular multiplexing with incoherent beams inorthogonal polarization states,” Opt. Lett.35,3519-3521(2010).
[10] J. Gass, A. Dakoff, and M. K. Kim,“Phase imaging without2pi ambiguity bymultiwavelength digital holography,” Opt. Lett.28,1141-1143(2003).
[11] J. Kuhn, T. Colomb, F. Montfort, F. Charriere, Y. Emery, E. Cuche, P. Marquetand C. Depeursinge,“Real-time dual-wavelength digital holographicmicroscopy with a single hologram acquisition,” Opt. Express15,7231-7242(2007).
[12] M. T. Rinehart, N. T. Shaked, N. J. Jenness, R. L. Clark, and A. Wax,“Simultaneous two-wavelength transmission quantitative phase microscopy witha color camera,” Opt. Lett.35,2612-2614(2010).
[13] A. Wada, M. Kato, and Y. Ishii,“Multiple-wavelength digital holographicinterferometry using tunable laser diodes,” Appl. Opt.47,2053-2060(2008).
[14] C. J. Mann, P. R. Bingham, V. C. Paquit and K. W. Tobin,“Quantitative phaseimaging by three-wavelength digital holography,” Opt. Express16,9753-9764(2008).
[15] S. Nicola, A. Finizio, G. Pierattini, D. Alfieri, S. Grilli, L. Sansone, and P.Ferraro,“Recovering correct phase information in multiwavelength digitalholographic microscopy by compensation for chromatic aberrations,” Opt. Lett.30,2706–2708(2005).
[16] T. Colomb, F. Montfort, J. Kühn, N. Aspert, E. Cuche, A. Marian, F. Charrière, S.Bourquin, P. Marquet, and C. Depeursinge,“Numerical parametric lens forshifting, magnification, and complete aberration compensation in digitalholographic microscopy,” J. Opt. Soc. Am. A.23,3177–3190(2006).
[17].K. Choi, H. Kim, and B. Lee,“Full-colour autostereoscopic3D display systemusing colour-dispersion-compensated synthetic phase holograms,” Opt. Express12,5229–5236(2004).
[18] J. Millerd, N. Brock, J. Hayes, M. North-Morris, M. Novak and J. Wyant,“Pixelated Phase-Mask Dynamic Interferometer,” Interferometry XII:Techniques and Analysis, edited by Katherine Creath, Joanna Schmit,Proceedings of SPIE Vol.5531304-314(SPIE, Bellingham, WA,2004).