Development of a speckle-based portable device for in situ metrology of synchrotron X-ray mirrors

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• 作者：Yogesh Kashyap ; Hongchang Wang and Kawal Sawhney
• 关键词：speckle ; X-ray optics ; metrology
• 刊名：Journal of Synchrotron Radiation
• 出版年：2016
• 出版时间：September 2016
• 年：2016
• 卷：23
• 期：5
• 页码：1131-1136
• 全文大小：843K
• ISSN：1600-5775

文摘

A portable device for in situ metrology of synchrotron X-ray mirrors based on the near-field speckle scanning technique has been developed. Ultra-high angular sensitivity is achieved by scanning a piece of abrasive paper or filter membrane in the X-ray beam. In addition to the compact setup and ease of implementation, a user-friendly graphical user interface has been developed to ensure that optimizing active X-ray mirrors is simple and fast. The functionality and feasibility of this device have been demonstrated by characterizing and optimizing X-ray mirrors.