High-Temperature Dielectric Relaxation Behaviors of Relaxer-Like PbZrO3-SrTiO3 Ceramics for Energy-Storage Applications

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• 作者：Dr. Tian-Fu Zhang ; Prof. Xin-Gui Tang ; Dr. Xian-Xiong Huang ; Prof. Qiu-Xiang Liu ; Prof. Yan-Ping Jiang and Prof. Qi-Fa Zhou
• 刊名：Energy Technology
• 出版年：2016
• 出版时间：May 2016
• 年：2016
• 卷：4
• 期：5
• 页码：633-640
• 全文大小：1913K
• ISSN：2194-4296

文摘

(1−x)PbZrO₃–xSrTiO₃ (x: 10, 20, and 30 mol %) ceramics were prepared by a conventional mixed-oxide solid-state reaction method. The relaxer behaviors of the PbZrO₃–SrTiO₃ ceramics were examined in the temperature range of 120–523 K. A broad dielectric maximum that shifted to higher temperature with increasing frequency signified the relaxer-type behaviors of these ceramics. The value of the relaxation parameter of γ=1.73, estimated from the linear fit of the modified Curie–Weiss law, indicated the relaxer nature. High-temperature dielectric relaxation phenomena were found in the temperature region of 600-850 K. The activation energy, calculated from impedance measurements of samples, suggested that the dielectric relaxation was a result of oxygen vacancies generated during the sintering process. The energy-storage density calculated from hysteresis loops reached about 0.46 J cm⁻³ for the PSZT30 ceramic at room temperature.