Defect classification using PEC respones based on power spectral density analysis combined with EMD and EEMD
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- 作者：Ying PengAuthor Vitae ; Xuanbing Qiu ; qiuxuanbing@163.com" class="auth_mail" title="E-mail the corresponding author ; qiuxb@tyust.edu.cn" class="auth_mail" title="E-mail the corresponding authorAuthor Vitae ; Jilin WeiAuthor Vitae ; Chuanliang LiAuthor Vitae ; Xiaochao CuiAuthor Vitae
- 关键词：Pulsed eddy current ; Empirical mode decomposition ; Ensemble empirical mode decomposition ; Power spectrum density analysis ; Defect classification
- 刊名：NDT and E International
- 出版年：2016
- 出版时间：March 2016
- 年：2016
- 卷：78
- 期：Complete
- 页码：37-51
- 全文大小：1169 K
文摘
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A new PEC feature (PSD of the IMFs) is investigated.
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The PSD distributions from EMD and EEMD transform are analyzed.
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The classifiers including PCA-LDA and PCA-Bayes are employed for defect classification.
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The multi-resolution IMFs provide an alternative to acquire more classifying features.
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