Main magnetic focus ion source: Basic principles, theoretical predictions and experimental confirmations

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• 作者：V.P. Ovsyannikov^a ; ; A.V. Nefiodov^b ; ^{anef@thd.pnpi.spb.ru" class="auth_mail" title="E-mail the corresponding author}
• 关键词：Highly charged ions ; Ion source ; Magnetic focus ; Rippled electron beam ; Local ion trap
• 刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
• 出版年：2016
• 出版时间：1 March 2016
• 年：2016
• 卷：370
• 期：Complete
• 页码：32-41
• 全文大小：2739 K

文摘

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, extremely high electron current densities can be attained on short length of the ion trap. The design of very compact ion sources of the new generation is presented. The computer simulations predict that for such ions as, for example, Ne⁸⁺ and Xe⁴⁴⁺, the intensities of about e9" title="Click to view the MathML source">10⁹iner hidden">${10}^9$ and 10⁶iner hidden">${10}^6$ ions per second, respectively, can be obtained. The experiments with pilot example of the ion source confirm efficiency of the suggested method. The X-ray emission from Ir⁵⁹⁺, Xe⁴⁴⁺ and Ar¹⁶⁺ ions was detected. The control over depth of the local ion trap is shown to be feasible.