Microstructure and magnetic properties of Ti/Co/Ti films

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• 作者：Shunzhen FENG ; Yujie ZHANG ; Hanwei ZHANG ; Huiyuan SUN
• 关键词：perpendicular magnetic recording ; coercivity ; Ti/Co/Ti thin films
• 刊名：Rare Metals
• 出版年：2006
• 出版时间：October 2006
• 年：2006
• 卷：25
• 期：6, Supplement 1
• 页码：450-453
• 全文大小：533 K

文摘

The two series of asdeposited and annealed Ti/Co/Ti thin films were deposited by magnetron sputtering onto glass substrates at room temperature. The structural and magnetic properties of the films at room temperature were investigated as function of Co layer thickness. X-ray diffraction (XRD) profiles show Co nanograins are formed as the hexagonal-close-packed (hcp) structure. The perpendicular coercivity of the Ti(15 nm)/Co(30 nm)/Ti(15 nm) film annealed at 450 °C for 30 min is about 288 kA·m⁻¹.