Soft error evaluation and vulnerability analysis in Xilinx Zynq-7010 system-on chip

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• 作者：Xuecheng Du ; Chaohui He ; Shuhuan Liu ; ^{liushuhuan@mail.xjtu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Yao Zhang ; Yonghong Li ; Ceng Xiong ; Pengkang Tan
• 关键词：System on Chip (SoC) ; Soft error rate ; Fault tree analysis ; Reliability
• 刊名：Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
• 出版年：2016
• 出版时间：21 September 2016
• 年：2016
• 卷：831
• 期：Complete
• 页码：344-348
• 全文大小：1018 K

文摘

Radiation-induced soft errors are an increasingly important threat to the reliability of modern electronic systems. In order to evaluate system-on chip's reliability and soft error, the fault tree analysis method was used in this work. The system fault tree was constructed based on Xilinx Zynq-7010 All Programmable SoC. Moreover, the soft error rates of different components in Zynq-7010 SoC were tested by americium-241 alpha radiation source. Furthermore, some parameters that used to evaluate the system's reliability and safety were calculated using Isograph Reliability Workbench 11.0, such as failure rate, unavailability and mean time to failure (MTTF). According to fault tree analysis for system-on chip, the critical blocks and system reliability were evaluated through the qualitative and quantitative analysis.