Surface potential investigation on interdigitated back contact solar cells by Scanning Electron Microscopy and Kelvin Probe Force Microscopy: Effect of electrical bias

详细信息    查看全文

• 作者：Paul Narchi^a ; ^b ; ^{paul.narchi@polytechnique.edu} ; Vladimir Neplokh^c ; Valerio Piazza^c ; Twan Bearda^d ; Fabien Bayle^c ; Martin Foldyna^b ; Chiara Toccafondi^b ; Patricia Prod&rsquo ; homme^a ; Maria Tchernycheva^c ; Pere Roca i Cabarrocas^b
• 关键词：AFM ; Atomic Force Microscopy ; a-Si ; H ; hydrogenated amorphous silicon ; IBC ; Interdigitated Back Contact Solar Cell ; ITO ; Indium Tin Oxide ; J(V) ; current density &ndash ; voltage ; KPFM ; Kelvin Probe Force Microscopy ; SE ; Secondary Electrons ; SEM ; Scanning Electron Microscopy
• 刊名：Solar Energy Materials and Solar Cells
• 出版年：2017
• 出版时间：March 2017
• 年：2017
• 卷：161
• 期：Complete
• 页码：263-269
• 全文大小：846 K
• 卷排序：161

文摘

SEM and KPFM assess the effect of voltage on surface potential of IBC solar cells. KPFM enables to measure electrical bias changes value on IBC solar cells. Measurements under reverse bias can enable to reveal electrical defects. Measurements under forward biases can enable to locate zones of series resistance. Nano-identation is an effective technique for accurate repositioning at the nano-scale.