Characterization of thin film tandem solar cells by radiofrequency pulsed glow discharge - Time of flight mass spectrometry

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• 作者：Beatriz Fernandez^a ; ^{fernandezbeatriz@uniovi.es} ; Lara Lobo^a ; Nies Reininghaus^b ; Rosario Pereiro^a ; ^{mrpereiro@uniovi.es} ; Alfredo Sanz-Medel^a
• 关键词：Thin film solar cells ; Tandem-junctions solar cells ; Depth profiling analysis ; Glow discharge ; Time of flight mass spectrometry
• 刊名：Talanta
• 出版年：2017
• 出版时间：1 April 2017
• 年：2017
• 卷：165
• 期：Complete
• 页码：289-296
• 全文大小：861 K
• 卷排序：165

文摘

The recently commercialized rf-PGD-TOFMS has been investigated for state of the art silicon-based TFSCs characterization. Two configurations used in production of tandem-junctions solar cells were compared. Depth distribution of dopant elements was investigated using milli- and microsecond PGD regimes. The “low mass mode” available in the rf-PGD-TOFMS instrument was tested for dopants analysis. Cell power conversion efficiency was measured and related to depth profiles.