An almost knowledge-free approach to XPS intensity evaluation where use of atomic photoemission cross sections suffices for yielding material-specific inelastic background
刊名:Journal of Electron Spectroscopy and Related Phenomena
出版年:2017
出版时间:February 2017
年:2017
卷:215
期:Complete
页码:36-56
全文大小:6481 K
卷排序:215
文摘
Self-contained XPS background optimization based on the Tougaard’s formula. Consistent core and Auger intensities for Cu metal. Determination of intractable solid-state effects not required. Realistic result restorable without using sample’s characteristic properties. Estimation of IMFP from peak intensities and cross sections.