Nanoscale surface analysis that combines scanning probe microscopy and mass spectrometry: A critical review
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- 作者：Zhisen Lianga ; Zhibin Yina ; Hang Yanga ; Yuanfang Xiaoa ; Wei Hanga ; b ; weihang@xmu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Jianfeng Lia ; li@xmu.edu.cn" class="auth_mail" title="E-mail the corresponding author
- 关键词：Scanning probe microscopy ; Laser-assisted ionization ; Laser-induced near-field effect ; Atom probe ; Direct solid and surface analysis ; Localized thermal analysis ; Nanoscale lateral resolution ; Mass spectrometry
- 刊名：TrAC Trends in Analytical Chemistry
- 出版年：2016
- 出版时间：January 2016
- 年：2016
- 卷：75
- 期：Complete
- 页码：24-34
- 全文大小：1025 K
文摘
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The principles of combination systems of scanning probe microscopy (SPM) and mass spectrometry (MS) have been described.
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The applications of SPM–MS have been reviewed.
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The strengths and the limitations of SPM–MS have been discussed.
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Future development trends of SPM–MS have been predicted.
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