Rear passivation of commercial multi-crystalline PERC solar cell by PECVD Al₂O₃

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• 作者：Suxiang Zhao ; Qi Qiao ; Song Zhang ; Jingjia Ji ; Zhengrong Shi ; Guohua Li
• 关键词：Rear passivation ; Degradation ; Screen-printed ; Local rear contact ; Mc-Si PERC ; Al2O3
• 刊名：Applied Surface Science
• 出版年：30 January, 2014
• 年：2014
• 卷：290
• 期：Complete
• 页码：66-70
• 全文大小：1148 K

文摘

Low-cost high-efficiency solar cells are the key to achieve grid parity with photovoltaic devices. Multi-crystalline silicon (mc-Si) solar cells are low-cost but low-efficiency. High-quality rear passivation is essential for the achievement of this goal. This dielectric stack, in conjunction with a local back surface field, produced mc-Si passivated emitter and rear cell (PERC) which efficiency exceeded 18.6%. The peak efficiency of 18.63% was achieved with J_sc of 37.44 mA/cm² and V_oc of 638 mV on commercial grade mc-Si wafers. Detailed characterization and modeling revealed that the increase in V_oc and J_sc is the result of increased back surface reflectance from 74.8% to 90.7% and reduced back surface recombination velocity from 1800 to 260 cm/s. It was observed that the efficiency of mc-Si PERC solar cells decreased in degradation experiment.