Structural and Electrical Conductivity studies of Spinel LiMn₂O₄ Cathode films grown by RF Sputtering

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• 作者：K. Hari Prasad^a ; S. Vinoth^b ; A. Ratnakar^b ; M. Venkateswarlu^c ; N. Satyanarayana^a ; ^{nallanis2011@gmail.com}
• 关键词：LiMn2O4 thin films ; RF Sputtering ; X-ray diffraction ; Raman ; SEM ; Impedance ; Electrical Conductivity
• 刊名：Materials Today: Proceedings
• 出版年：2016
• 出版时间：2016
• 年：2016
• 卷：3
• 期：10
• 页码：4046-4051
• 全文大小：593 K
• 卷排序：3

文摘

The present paper investigates the structural and electrical conductivity studies of spinel LiMn2O4 cathode films grown by RF magnetron sputtering. The crystallinity, structure and morphology of the LiMn2O4 cathode films of as- deposited and annealed at 500 °C were investigated by X-ray diffraction (XRD), Raman spectroscopy (RS) and scanning electron microscopy (SEM) respectively. The XRD and Raman spectroscopy results revealed the formation of crystalline phase pure spinel structured LiMn2O4 cathode films annealed at 500 °C temperature. The SEM micrographs of the LiMn2O4 cathode films showed the formation of spherical shape of nano size particles. The impedance measurements on the spinel LiMn2O4 cathode film annealed at 500 °C were carried out at wide range of temperature and obtained the conductivity at each temperature by analyzing the measured impedance spectra. The conductivity of the LiMn2O4 cathode film annealed at 500 °C is found to increases with temperature.