Surface profile gradient in amorphous Ta₂O₅ semi conductive layers regulates nanoscale electric current stability

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• 作者：A.C. Cefalas^a ; ^{ccefalas@eie.gr} ; Z. Kollia^a ; N. Spyropoulos-Antonakakis^a ; V. Gavriil^a ; D. Christofilos^c ; G. Kourouklis^c ; V.V. Semashko^b ; V. Pavlov^b ; E. Sarantopoulou^a ; ^b
• 关键词：Amorphous semiconductors ; Current stability ; Surface morphology and electric properties of Ta2O5 ; Scanning thermal microscopy ; Electrostatic force microscopy ; Conductive atomic force microscopy
• 刊名：Applied Surface Science
• 出版年：2017
• 出版时间：28 February 2017
• 年：2017
• 卷：396
• 期：Complete
• 页码：1000-1019
• 全文大小：11455 K
• 卷排序：396

文摘

The work links the surface morphology of amorphous semiconductors with both their electric-thermal properties and current stability at the nanoscale (<1 μm). Measured high correlation value between surface morphological spatial gradient and conductive electron energy spatial gradient or thermal gradient. Unidirectional current stability is associated with asymmetric nanodomains along nanosize conductive paths. Bidirectional current stability is inherent with either long conductive paths or nanosize conductive paths along symmetric nanodomains. Conclusion: Surface design improves current stability across nanoelectonic junctions.