Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Silica Solutions

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• 作者：Cedric J. Gommes ; Jean-Paul Pirard ; Bart Goderis
• 刊名：Journal of Physical Chemistry C
• 出版年：2010
• 出版时间：October 21, 2010
• 年：2010
• 卷：114
• 期：41
• 页码：17350-17357
• 全文大小：341K
• 年卷期：v.114,no.41(October 21, 2010)
• ISSN：1932-7455

文摘

We propose a mathematical modeling of the total small-angle X-ray scattering (SAXS) intensity in silica sol−gel processes in terms of hydrolysis and condensation reactions as well as of microsyneresis. The results are used to rationalize previously published SAXS data of tetraethoxysilane solutions reacting with organically modified trialkoxysilanes. We notably show that the decrease in SAXS intensity reported for these samples at the end of gelation is a consequence of condensation reactions. The release of water by the latter reactions contributes to reduce the electron density difference between the silica and the solvent phases of the gels.