Charge Trapping and Storage by Composite P3HT/PC60BM Nanoparticles Investigated by Fluorescence-Voltage/Single Particle Spectroscopy

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• 作者：Zhongjian Hu ; Andre J. Gesquiere
• 刊名：Journal of the American Chemical Society
• 出版年：2011
• 出版时间：December 28, 2011
• 年：2011
• 卷：133
• 期：51
• 页码：20850-20856
• 全文大小：869K
• 年卷期：v.133,no.51(December 28, 2011)
• ISSN：1520-5126

文摘

Fluorescence-voltage/single particle spectroscopy (F-V/SPS) was employed to study exciton鈥揾ole polaron interactions and interfacial charge transfer processes for pure poly(3-hexylthiophene) (P3HT) nanoparticles (NPs) and composite P3HT/PC₆₀BM NPs in functioning hole-injection devices. F-V/SPS data collected on a particle-by-particle basis reveal an apparent bistability in the fluorescence-voltage modulation curves for composite NPs of P3HT and [6,6]-phenyl-C₆₁-butyric acid methyl ester (PC₆₀BM) that is absent for pure P3HT NPs. A pronounced deep trapping of free electrons photogenerated from the composite P3HT/PC₆₀BM NPs at the NP/dielectric interface and hole trapping by fullerene anions in composite P3HT/PC₆₀BM NPs under photoexcitation lies at the basis of this finding. The deep electron trapping effect reported here for composite conjugated polymer/fullerene NPs presents an opportunity for future application of these NPs in nanoscale memory and imaging devices.