High-Resolution Electrochemical and Topographical Imaging Using Batch-Fabricated Cantilever Probes

详细信息    查看全文

• 作者：Andrew J. Wain ; Andrew J. Pollard ; Christoph Richter
• 刊名：Analytical Chemistry
• 出版年：2014
• 出版时间：May 20, 2014
• 年：2014
• 卷：86
• 期：10
• 页码：5143-5149
• 全文大小：396K
• 年卷期：v.86,no.10(May 20, 2014)
• ISSN：1520-6882

文摘

New cantilever probes for combined scanning electrochemical microscopy鈥揳tomic force microscopy (SECM-AFM) have been batch-fabricated, and their application to high resolution electrochemical-topographical imaging has been demonstrated. The conical probes yield outstanding quality Faradaic current maps alongside subnm level topographical information as exemplified by the electrochemical imaging of exfoliated graphene and graphite samples. Current mapping reveals significant heterogeneities in the electroactivity of these carbon surfaces that do not directly correlate to topographical features, suggesting the presence of adsorbed chemical contaminants or intrinsic impurities.