Spinodal Dewetting of Thin Films with Large Interfacial Slip: Implications from the Dispersion Relation

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• 作者：Markus Rauscher ; Ralf Blossey ; Andreas Mü ; nch ; Barbara Wagner
• 刊名：Langmuir
• 出版年：2008
• 出版时间：November 4, 2008
• 年：2008
• 卷：24
• 期：21
• 页码：12290-12294
• 全文大小：160K
• 年卷期：v.24,no.21(November 4, 2008)
• ISSN：1520-5827

文摘

We compare the dispersion relations for spinodally dewetting thin liquid films for increasing magnitude of interfacial slip length in the lubrication limit. While the shape of the dispersion relation, in particular the position of the maximum, are equal for no-slip up to moderate-slip lengths, the position of the maximum shifts to much larger wavelengths for large slip lengths. Here, we discuss the implications of this fact for recently developed methods to assess the disjoining pressure in spinodally unstable thin films by measuring the shape of the roughness power spectrum. For polystyrene (PS) films on octadecyltrichlorosilane (OTS) covered Si wafers (with slip length b ≈ 1 μm), we predict a 20% shift of the position of the maximum of the power spectrum which should be detectable in experiments.