Measurement and Correlation of Saturated Vapor Pressure of Ethylphenyldimethoxysilane and Ethylphenyldiethoxysilane

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• 作者：Xia Wu ; Hong Dong ; Xinliang Wang ; Zhenghao Zeng ; Chuan Wu
• 刊名：Journal of Chemical & Engineering Data
• 出版年：2015
• 出版时间：November 12, 2015
• 年：2015
• 卷：60
• 期：11
• 页码：3106-3112
• 全文大小：315K
• ISSN：1520-5134

文摘

The saturated temperatures of ethylphenyldimethoxysilane (EPDMOS) and ethylphenyldiethoxysilane (EPDEOS) were determined using an inclined ebulliometer from 2.035 to 64.0 kPa. The experimental data were fitted with the Antoine and Clarke鈥揋lew equations by a weighted least-squares regression method, which yielded Antoine parameters (A = 9.1280, B = 1590.18, C = 鈭?00.39 K and A = 9.1049, B = 1678.64, C = 鈭?02.84 K) and standard vaporization enthalpies (螖_l^gH_m⁰(298.15 K) = 62.52 kJ路mol^鈥? and 螖_l^gH_m⁰(298.15 K) = 65.19 kJ路mol^鈥?) for EPDMOS and EPDEOS, respectively. The critical properties of EPDMOS and EPDEOS, such as critical temperature, pressure, and volume, were estimated by the group contribution method introduced by Nannoolal et al. The acentric factors of EPDMOS and EPDEOS were estimated from these critical parameters and the reduced saturated vapor pressures calculated from either the Clarke鈥揋lew equation or the Antoine equation.