Mechanical and Electrical Anisotropy of Few-Layer Black Phosphorus

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• 作者：Jin Tao ; Wanfu Shen ; Sen Wu ; Lu Liu ; Zhihong Feng ; Chao Wang ; Chunguang Hu ; Pei Yao ; Hao Zhang ; Wei Pang ; Xuexin Duan ; Jing Liu ; Chongwu Zhou ; Daihua Zhang
• 刊名：ACS Nano
• 出版年：2015
• 出版时间：November 24, 2015
• 年：2015
• 卷：9
• 期：11
• 页码：11362-11370
• 全文大小：618K
• ISSN：1936-086X

文摘

We combined reflection difference microscopy, electron transport measurements, and atomic force microscopy to characterize the mechanical and electrical anisotropy of few-layer black phosphorus. We were able to identify the lattice orientations of the two-dimensional material and construct suspended structures aligned with specific crystal axes. The approach allowed us to probe the anisotropic mechanical and electrical properties along each lattice axis in separate measurements. We measured the Young鈥檚 modulus of few-layer black phosphorus to be 58.6 卤 11.7 and 27.2 卤 4.1 GPa in zigzag and armchair directions. The breaking stress scaled almost linearly with the Young鈥檚 modulus and was measured to be 4.79 卤 1.43 and 2.31 卤 0.71 GPa in the two directions. We have also observed highly anisotropic transport behavior in black phosphorus and derived the conductance anisotropy to be 63.7%. The test results agreed well with theoretical predictions. Our work provided very valuable experimental data and suggested an effective characterization means for future studies on black phosphorus and anisotropic two-dimensional nanomaterials in general.