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Unconventional Electronic Properties of Mg2Si Thermoelectrics Revealed by Fast-Neutron-Irradiation Doping
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In this work, we systematically investigated the electrical resistivity, Hall, and magnetoresistance effects of Al-doped Mg2Si thermoelectrics, irradiated with a fluence of fast neutrons and consequently isochronally annealed at moderate high temperatures up to 500 °C. We found that the fast-neutron bombardment itself only slightly modified the electronic properties. Meanwhile, a series of the postirradiation high-temperature anneals affected the properties dramatically. Thus, after annealing at temperatures of 275–325 °C, Mg2Si:Al showed pronounced jumps in both the electrical resistivity and the Hall constant values by several orders of magnitude. This unexpected electronic transition corresponded to a significant variation in the carrier concentration. We proposed that this unusual electronic transition may be related to temperature-assisted chemical bonding of the radiation defects that can involve free charge carriers in the sample, thereby tuning dramatically its transport properties. We proposed a simple model for Mg2Si:Al thermoelectrics, which links the chemical bonding of the interstitial Mg ions with the electronic properties of this material. This finding suggests a new avenue to tuning of electronic properties and unconventional electronic transitions in materials with a high concentration of defects.

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