Highly Sensitive Detection of the Lattice Distortion in Single Bent ZnO Nanowires by Second-Harmonic Generation Microscopy

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• 作者：Xiaobo Han ; Kai Wang ; Hua Long ; Hongbo Hu ; Jiawei Chen ; Bing Wang ; Peixiang Lu
• 刊名：ACS Photonics
• 出版年：2016
• 出版时间：July 20, 2016
• 年：2016
• 卷：3
• 期：7
• 页码：1308-1314
• 全文大小：610K
• 年卷期：0
• ISSN：2330-4022

文摘

We demonstrate a highly sensitive detection of the lattice distortion in single bent ZnO nanowires (NWs) by second-harmonic generation (SHG) microscopy. As the curvature of the single bent ZnO NW increases to 21 mm^–1 (<4% bending distortion), it shows a significant decrease (∼70%) in the SHG intensity ratio between perpendicular and parallel excitation polarization with respect to c-axis of ZnO NWs. A high detection sensitivity of 10^–3 nm on the bending distortion is obtained in our experiment. Importantly, the extraordinary nonaxisymmetrical SHG polarimetric patterns are also observed, indicating the twisting distortion around c-axis of ZnO NWs. Thus, SHG microscopy provides a sensitive all-optical and noninvasive method for in situ detecting the lattice distortion under various circumstances.