用户名： 密码： 验证码：
Effect of Annealing on Microstructure and Thermoelectric Properties of Sb-Doped Mg2Si0.5Sn0.5 Solid Solution
详细信息    查看全文
  • 作者：Ji-Wei Liu ; Minghui Song ; Masaki Takeguchi…
  • 关键词：Mg2Si0.5Sn0.5 ; doping ; annealing ; microstructure ; thermoelectric properties
  • 刊名：Journal of Electronic Materials
  • 出版年：2016
  • 出版时间：January 2016
  • 年：2016
  • 卷：45
  • 期：1
  • 页码：602-614
  • 全文大小：3,498 KB
  • 参考文献：1.L.E. Bell, Science 321, 1457 (2008).CrossRef
    2.G.J. Snyder and E.S. Toberer, Nat. Mater. 7, 105 (2008).CrossRef
    3.J.R. Szczech, J.M. Higgins, and S. Jin, J. Mater. Chem. 21, 4037 (2011).CrossRef
    4.W. Liu, X.F. Tang, H. Li, J. Sharp, X.Y. Zhou, and C. Uher, Chem. Mater. 23, 5256 (2011).CrossRef
    5.L.X. Chen, G.Y. Jiang, Y. Chen, Z.L. Du, X.B. Zhao, T.J. Zhu, J. He, and T.M. Tritt, J. Mater. Res. 26, 3038 (2011).CrossRef
    6.W.J. Luo, M.J. Yang, F. Chen, Q. Shen, H.Y. Jiang, and L.M. Zhang, Mater. Trans. 51, 288 (2010).CrossRef
    7.H.L. Gao, X.X. Liu, T.J. Zhu, S.H. Yang, and X.B. Zhao, J. Electron. Mater. 40, 830 (2011).CrossRef
    8.Z.L. Du, T.J. Zhu, and X.B. Zhao, Mater. Lett. 66, 76 (2012).CrossRef
    9.W. Liu, X.F. Tang, H. Li, K. Yin, J. Sharp, X.Y. Zhou, and C. Uher, J. Mater. Chem. 22, 13653 (2012).CrossRef
    10.A.U. Khan, N. Vlachos, and T. Kyratsi, Scripta Mater. 69, 606 (2013).CrossRef
    11.Y. Isoda, M. Held, S. Tada, and Y. Shinohara, J. Electron. Mater. 43, 2053 (2014).CrossRef
    12.X. Zhang, H.L. Liu, S.H. Li, F.P. Zhang, Q.M. Lu, and J.X. Zhang, Mater. Lett. 123, 31 (2014).CrossRef
    13.Y.C. Lan, A.J. Minnich, G. Chen, and Z.F. Ren, Adv. Funct. Mater. 20, 357 (2010).CrossRef
    14.V.K. Zaitsev, M.I. Fedorov, E.A. Gurieva, I.S. Eremin, P.P. Konstantinov, A.Y. Samunin, and M.V. Vedernikov, Phys. Rev. B 74, 045207 (2006).CrossRef
    15.Y. Isoda, N. Shioda, H. Fujiu, Y. Imai, and Y. Shinohara, Proceedings of the 25th International Conference on Thermoelectrics (2006), p.406.
    16.B. Poudel, Q. Hao, Y. Ma, Y.C. Lan, A. Minnich, B. Yu, X.A. Yan, D.Z. Wang, A. Muto, D. Vashaee, X.Y. Chen, J.M. Liu, M.S. Dresselhaus, G. Chen, and Z.F. Ren, Science 320, 634 (2008).CrossRef
    17.C.J. Vineis, A. Shakouri, A. Majumdar, and M.G. Kanatzidis, Adv. Mater. 22, 3970 (2010).CrossRef
    18.J.Q. He, J. Androulakis, M.G. Kanatzidis, and V.P. Dravid, Nano Lett. 12, 343 (2012).CrossRef
    19.J.Q. He, L.D. Zhao, J.C. Zheng, J.W. Doak, H.J. Wu, H.Q. Wang, Y. Lee, C. Wolverton, M.G. Kanatzidis, and V.P. Dravid, J. Am. Chem. Soc. 135, 4624 (2013).CrossRef
    20.J.J. Pulikkotil, D.J. Singh, S. Auluck, M. Saravanan, D.K. Misra, A. Dhar, and R.C. Budhani, Phys. Rev. B 86, 155204 (2012).CrossRef
    21.S. Tada, Y. Isoda, H. Udono, H. Fujiu, S. Kumagai, and Y. Shinohara, J. Electron. Mater. 43, 1580 (2014).CrossRef
    22.J.W. Liu, M. Song, M. Takeguchi, N. Tsujii, and Y. Isoda, J. Electron. Mater. 44, 407 (2015).CrossRef
    23.L.X. Chen, G.Y. Jiang, Y. Chen, Z.L. Du, X.B. Zhao, T.J. Zhu, J. He, and T.M. Tritt, J. Mater. Res. 26, 3038 (2011).CrossRef
    24.O.L. Krivanek, M.F. Chisholm, V. Nicolosi, T.J. Pennycook, G.J. Corbin, N. Dellby, M.F. Murfitt, C.S. Own, Z.S. Szilagyi, M.P. Oxley, S.T. Pantelides, and S.J. Pennycook, Nature 464, 571 (2010).CrossRef
    25.D.A. Muller, Nat. Mater. 8, 263 (2009).CrossRef
    26.G.S. Nolas, D. Wang, and M. Beekman, Phys. Rev. B 76, 235204 (2007).CrossRef
    27.G.Y. Jiang, J. He, T.J. Zhu, C.G. Fu, X.H. Liu, L.P. Hu, and X.B. Zhao, Adv. Funct. Mater. 24, 3776 (2014).CrossRef
    28.A. Kato, T. Yagi, and N. Fukusako, J. Phys. 21, 205801 (2009).
    29.Z.L. Du, T.J. Zhu, Y. Chen, J. He, H.L. Gao, G.Y. Jiang, T.M. Tritt, and X.B. Zhao, J. Mater. Chem. 22, 6838 (2012).CrossRef
    30.L.D. Zhao, S.H. Lo, J.Q. He, H. Li, K. Biswas, J. Androulakis, C.I. Wu, T.P. Hogan, D.Y. Chung, V.P. Dravid, and M.G. Kanatzidis, J. Am. Chem. Soc. 133, 20476 (2011).CrossRef
    31.S. Wang and N. Mingo, Appl. Phys. Lett. 94, 203109 (2009).CrossRef
    32.X.B. Zhao, S.H. Yang, Y.Q. Cao, J.L. Mi, Q. Zhang, and T.J. Zhu, J. Electron. Mater. 38, 1017 (2009).CrossRef
    33.Z.L. Du, G.Y. Jiang, Y. Chen, H.L. Gao, T.J. Zhu, and X.B. Zhao, J. Electron. Mater. 41, 1222 (2012).CrossRef
    34.X.J. Tan, W. Liu, H.J. Liu, J. Shi, X.F. Tang, and C. Uher, Phys. Rev. B 85, 205212 (2012).CrossRef
    35.D.A. Pshenai-Severin, M.I. Fedorov, and A.Y. Samunin, J. Electron. Mater. 42, 1707 (2013).CrossRef
  • 作者单位：Ji-Wei Liu (1)
    Minghui Song (1)
    Masaki Takeguchi (1)
    Naohito Tsujii (2)
    Yukihiro Isoda (3)

    1. Nanocharacterization Group, Transmission Electron Microscopy Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
    2. Neutron Scattering Group, Quantum Beam Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
    3. Eco-energy Group, Battery Materials Unit, NIMS, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047, Japan
  • 刊物类别：Chemistry and Materials Science
  • 刊物主题：Chemistry
    Optical and Electronic Materials
    Characterization and Evaluation Materials
    Electronics, Microelectronics and Instrumentation
    Solid State Physics and Spectroscopy
  • 出版者：Springer Boston
  • ISSN：1543-186X
文摘

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址：北京市海淀区学院路29号 邮编：100083

电话：办公室：(+86 10)66554848；文献借阅、咨询服务、科技查新：66554700