Electric admittance analysis of quartz crystal resonator in thickness-shear mode induced by array of surface viscoelastic micro-beams

详细信息    查看全文

• 作者：Jiemin Xie ; Yuantai Hu
• 关键词：quartz crystal resonator (QCR) ; thickness ; shear mode (TSM) ; electrical admittance ; shear deformation
• 刊名：Applied Mathematics and Mechanics
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：38
• 期：1
• 页码：29-38
• 全文大小：
• 刊物类别：Mathematics and Statistics
• 刊物主题：Applications of Mathematics; Classical Mechanics; Mathematical Modeling and Industrial Mathematics;
• 出版者：Shanghai University
• ISSN：1573-2754
• 卷排序：38

文摘

The electric admittance of a compound system composed of a thicknessshear mode (TSM) quartz crystal resonator (QCR) and an array of surface viscoelastic micro-beams (MBs) is studied. The governing equations of the MBs are derived from the Timoshenko-beam theory in consideration of shear deformation. The electrical admittance is described directly in terms of the physical properties of the surface epoxy resin (SU-8) MBs from an electrically forced vibration analysis. It is found that both the inertia effect and the constraint effect of the MBs produce competitive influence on the resonant frequency and admittance of the compound QCR system. By further comparing the numerical results calculated from the Timoshenko-beam model with those from the Euler-beam model, the shear deformation is found to lead to some deviation of an admittance spectrum. The deviations are revealed to be evident around the admittance peak(s) and reach the maximum when a natural frequency of the MBs is identical to the fundamental frequency of the QCR. Besides, a higher order vibration mode of the MBs corresponds to a larger deviation at the resonance.