Strategies for Quantification of Light Elements in Minerals by SIMS: H, B and F

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• 作者：Luisa Ottolini ; Fernando Cámara and Frank C. Hawthorne
• 关键词：Key words ; SIMS ; calibration procedures ; crystallographic orientation ; light and volatile elements ; silicates.
• 刊名：Microchimica Acta
• 出版年：2006
• 出版时间：September, 2006
• 年：2006
• 卷：155
• 期：1-2
• 页码：229-233
• 全文大小：60 KB
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Analytical Chemistry
  Inorganic Chemistry
  Physical Chemistry
  Characterization and Evaluation Materials
  Monitoring, Environmental Analysis and Environmental Ecotoxicology
  
• 出版者：Springer Wien
• ISSN：1436-5073

文摘

Using a large set of silicate crystals, characterized by Structure REFinement (SREF), Electron Probe Micro-Analysis (EPMA) and Secondary Ion Mass Spectrometry (SIMS), and mounted with known crystallographic orientation [1], we propose a new SIMS quantification for H, B and F (from ppm level to several wt.%), using 27Al+ and 44Ca+, in turn, as the reference isotope for the matrix, and propose suitable calibration standards to obtain accurate results. The final SIMS data are then compared to those obtained using Si as the reference element, with those available from EMPA (B and F), and with the crystallographic constraints derived from SREF investigation. The results of this study can be extended to the measurement of light elements in complex silicate or non-silicate samples.