三模冗余反馈纠错技术在星载电路加固设计中的应用与实现

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英文篇名：Design and Implementation of TMR and Feedback Correction Technology in Satellite's Radiation-hardened Circuits 作者：杨玉辰 ; 周国昌 ; 巨艇 ; 王健 ; 张国霞 英文作者：YANG Yu-chen;ZHOU Guo-chang;JU Ting;WANG Jian;ZHANG Guo-xia;China Academy of Space Technology (Xi'an); 关键词：空间环境 ; 星载电路 ; 辐射加固设计 英文关键词：Space environment;;Satellite's circuit;;Radiation-hardened design 中文刊名：KJDZ 英文刊名：Space Electronic Technology 机构：中国空间技术研究院西安分院; 出版日期：2017-04-25 出版单位：空间电子技术 年：2017 期：v.14;No.170 语种：中文; 页：KJDZ201702008 页数：4 CN：02 ISSN：61-1420/TN 分类号：37-40

摘要

空间环境中的高能粒子会使器件发生辐射效应,特别是单粒子效应,严重威胁器件可靠性。现有的三模冗余及刷新技术的应用在一定程度上提高了星载电路的可靠性,但对于已经发生的错误,三模冗余只能容错,不能纠错,当两路数据出错时,三模冗余的防护就会失效。为了达到更好的防护效果,通过进一步研究,分析电路特性,提取电路中的关键敏感点,设计实现了具有一定通用性的抗辐射代码级电路加固技术——三模冗余反馈纠错技术。并在viterbi译码电路中应用该防护技术,通过仿真验证和故障注入实验,验证了该方法的有效性,在轨预估翻转率为9.97×10~(-7)次/(器件·天)。
        The radiation effects of the particles in the space environment,especially single event effects,threaten to the reliability of CMOS device. After researching for years,we have already using scrubbing and TMR technology to protect circuits.TMR need sufficient resources,and it can't correct errors.In this paper,we implemented a developed method to enhance circuits' reliability-TMR and Feedback Correction technology. First,extract the sensitive point in circuits,and then applying the technology in these points.We have already applied this technology in several designs.As a result,we verified the protecting effect through simulation and fault injection,SEU<9.97×10~(-7)per day(90% Adams worst case GEO).

引文

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