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质量损失函数与测量系统校准研究
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摘要
现代质量管理重在结果,同时也关注过程。产品质量改进的基础是首先要对质量水平有个客观的评价,这就涉及到两个问题:一是评价质量水平的方法是否全面准确而有效;二是获取的用来评价质量的数据是否可靠,也就是基于测量系统获取的数据的质量优劣。解决第一个问题可以借助于质量损失函数相关理论,第二个问题则首先要确保有精准的测量系统,其次要对测量系统设计合理的校准周期和校准方法,还要通过测量误差损失函数来衡量测量质量水平。测量质量损失函数以及测量系统校准方法是田口测量质量工程学的重要内容之一,在表征测量质量优劣、测量系统校准、评价和改进产品质量、质量控制系统设计等方面具有极其广泛的应用。因此,本文对质量损失函数、测量误差损失函数、反馈控制系统和校准系统损失函数、非线性测量系统校准方法的研究具有很高的理论研究价值和极其深远的现实意义。
     作者在前期研究中发现测量质量损失函数等相关理论本身还存在一些不完善之处,致使从田口方法诞生起,就在学术界引起广泛争议,这也在一定程度上影响了工业企业使用田口方法的积极性。本文在对相关理论进行研究的基础上,找出存在的问题,进而提出相应改进的质量损失函数以及非线性测量系统的校准方法。本文的研究内容包括:
     (1)质量损失函数的改进。目前,田口质量损失函数只用一个二次项表示的,既略去了一次项,又略去了高次项,这对于望小特性和望大特性情况是不妥当的。本文提出了改进的望小特性和望大特性的质量损失函数。同时,本文还分别从单个质量特性和多个质量特性两种情况研究了动态特性情况下的质量损失函数。
     (2)动态测量情况下测量误差损失函数。田口测量质量工程学对静态测量情况下测量误差损失函数进行了介绍,但实践中,被测量往往是动态变化的,本文提出了动态测量情况下的测量误差损失函数,分别从己知信号因子和未知信号因子两方面研究了测量误差损失函数。
     (3)反馈控制系统损失函数的改进。田口先生在考虑测量费用、调整费用以及失控品损失的基础上设计了反馈控制系统损失函数,但田口先生所确定的反馈控制系统损失函数尚存在一些有待改善的地方,本文提出了改进的田口反馈控制系统损失函数。
     (4)基于改进的反馈控制系统损失函数的控制图设计。本文通过对改进的反馈控制系统损失函数中一些参数进行变换,从而设计出使经济损失最小的基于反馈控制系统损失函数的控制图。此外,还对控制图在测量系统稳定性和偏倚分析中如何应用进行了研究。
     (5)校准系统损失函数的改进。作者在找出田口校准系统损失函数存在问题的基础上,提出了改进的校准系统损失函数,并进行了实例分析。
     (6)线性测量系统校准周期和校准方法研究。本文以测量尺寸三坐标为例研究线性测量系统的校准周期和校准方法,在分析测量尺寸三坐标测量仪现行校准周期和校准方法的基础上,研究应用田口测量质量工程学的理论,确定测量尺寸三坐标测量仪的最佳校准周期以及具体的周期校准方法和日常校准方法。
     (7)非线性测量系统校准方法研究。绝大多数测量系统都是非线性的,尤其是含有传感器的测量系统以及测量各种流量的测量系统其非线性更加明显。对于非线性测量系统如果采用线性式关系进行处理就人为地增加了系统误差。本文通过借鉴田口测量质量工程学的理论研究了非线性测量系统校准方法,包括周期校准方法和日常校准方法。
Modern quality management emphasizes on results, while the results depend on process. The basis of product quality improvement is to objectively evaluate the quality level, which involves two problems:first, whether the method to evaluate the quality level is comprehensive, accurate and effective; Second, whether the data used to evaluate is reliable, in other words, the quality of the data from the measurement system is good or not. We can make use of some correlation theory of quality loss function to solve the first problem, while to the second, first of all, we must ensure a high quality of the measurement system, then, we ought to design the reasonable calibration cycle and calibration methods for the measurement system, what's more, we should describe the quality of measuring level through the measurement error loss function. Measuring quality loss function and the calibration methods of measuring system are the important aspect of the taguchi method, which have extremely extensive application in characterizing the quality of measuring level, determining the best calibration cycle of measuring system and the calibration method of the measurement system, evaluating and improving product quality, designing of quality control system, and so on. Thus, the study to the quality loss function, the measurement error loss function, the feedback control systems, the calibration system loss function and the calibration method of non-linear measurement system has an important value not only on theory but also on application.
     In previous studies, the author found that there were still some shortages in measuring quality loss function and related theory itself, which caused widespread controversy in academia since the taguchi method was born, and to some extent, it reduced the enthusiasm of industrial enterprise to use this method. Based on the study of the related theories, we found problems and put forward the calibration method of the loss function and non-linear measuring system after some corresponding improvement. This paper is organized as follows:
     (1) Improvement of quality loss function. At present, Taguchi quality loss function which without exception only by a quadratic term. It's unadvisable for the smaller the better and larger the better situations. This paper comes up with the improved quality loss function of smaller the better and larger the better characteristic. Then, this paper studies the form of dynamic quality characteristic loss function.
     (2) Forms of measurement error loss function in dynamic measurements. Taguchi measurement quality engineering introduces the measurement error loss function in static measurement. However, in the practice, the measured object is always changed dynamically. This paper comes up with the measurement loss function in dynamic measurements.
     (3) Improvement of feedback control system loss function. Taguchi designed the feedback control system loss function based on considering measuring cost, setup cost and loss of out-of-control product. But Taguchi's the feedback control system loss function still has rooms for improvement. This paper comes up with the improved Taguchi feedback control system loss function.
     (4) Designing of the control chart based on improved feedback control system loss function. This paper transforms some parameters which in improved feedback control system loss function so as to design the control chart based on feedback control system loss function which make the least economic loss. Then studies the control chart how to apply in measurement system stability and bias analysis.
     (5) Improvement of calibration system loss function. On the basis of finding out the problems which exist in Taguchi calibration system loss function, the author comes up with the improved calibration system loss function.
     (6) Study on the calibration cycle and calibration method of the linear measurement system. This paper takes the CMM using in measuring dimensions as case. On the basis of analyzing the current calibration cycle and calibration method of the CMM using in measuring dimensions, this paper put forward the optimum calibration cycle and calibration method of the CMM using in measuring dimensions based on Taguchi measurement quality engineering.
     (7) Study on the calibration method of non-linear measurement system. Most measurement systems are non-linear, especially the measurement systems which contains sensors and is used to measure various flow. For non-linear measurement system, it will increase system error artificially if processed by linear relation. This paper studies the non-linear calibration method of measurement system by referencing the theory in Taguchi measurement quality engineering.
引文
[1]韩之俊.三次设计[M].北京:机械工业出版社,1992.
    [2]韩之俊,章渭基.质量工程学[M].北京:科学出版社,1991.
    [3]韩之俊.质量工程学一线外、线内质量管理[M].北京:科学出版社,1991.
    [4]田口玄一著,缪以德译.计量管理设计手册[M].上海:上海翻译出版公司,1989.
    [5]田口玄一著.实验设计法概论[M].北京:兵器工业出版社,1992.
    [6]田口玄一.制造阶段的质量工程学[M].北京:兵器工业出版社,1992.
    [7]田口玄一.品质工学的目的[J].标准化与品质管理,1997,50(8):74-78.
    [8]田口玄一著.开发、设计阶段的质量工程学[M].北京:兵器工业出版社,1986.
    [9]韩之俊,靳京民.测量质量工程学[M].北京:中国计量出版社,2000.
    [10]郑称德,韩之俊.MTS设计原理及其设计模型[J].管理工程学报,2000,(3):43-45.
    [11]朱立锋,薛跃,韩之俊.基于质量损失函数的仪器最佳校准周期的确定[J].电子工程师,2005,31(8):15-17.
    [12]张斌,韩之俊,汤阳.基于质量损失函数的最优过程均值和质量投资决策[J].统计与决策,2008,18:33-34.
    [13]陈湘来,韩之俊,张斌.非对称损失函数的质量特性值优化选择[J].工业工程,2008,11(3):24-26.
    [14]朱立峰,韩之俊,赵宇.用田口方法推断仪器的校准公式及测量不确定度研究[J].测试技术与应用,2003.7:46-48.
    [15]宋华明,韩之俊.应用田口方法诊治我国企业产品质量问题[J].科学管理研究,1999,17(2):42-44.
    [16]费业泰.误差理论与数据处理[M].北京:机械工业出版社,2000.
    [17]田口玄一著.魏锡禄,和福译.质量工程学概论[M].北京:中国对外出版翻译公司,1985.
    [18]赵宇,陈松涛.用田口方法推断校准仪器的测量不确定度[J].电子测量与仪器学报,2005,19(2):37-40.
    [19]薛跃,韩之俊等.田口式测量质量工程学与传统MSA的比较分析[J].系统工程理论与实践,2006,(8):76-80.
    [20]蒋钧钧,赵妙霞,郑玉巧.工序控制方法中工序的诊断调节及技术经济分析[J].甘肃科学学报,2005,17(3):72-75.
    [21]徐兰,韩之俊.基于质量损失函数的过程诊断周期的确定[J].工业工程,2007,10(6):138-140.
    [22]张月义,韩之俊,宋明顺.基于测量质量损失函数的控制图控制界限的优化[J].数理统计与管理,2008,(4):629-634.
    [23]张月义,韩之俊,汤阳.控制图在测量系统分析中的应用[J].中国质量,2008,(10):85-87.
    [24]魏世振,韩玉启.过程能力指数在质量损失研究中的应用[J].管理工程学报,2002,16(4):64-66.
    [25]田口玄一著,郭玉伟、李静译.测试技术的试验设计法[M].北京:机械工业出版社,1988.
    [26]Zhang Yue-yi.Han Zhi-jun.The Application of Control Chart in the Measurement System Analysis[J], International Journal of Business and Management,2009, (4):110-114.
    [27]Boeing Commercial Airplane Group:Advanced Quality System:Design and Analysis of Experiments, Segment 4,1991.
    [28]K. M. Tay, C. Butler. Methodologies for Experimental Design:A Survey. Comparison and Future Predictions[J].Quality Engineering,1999,11(3):343-356.
    [29]R. H. Myers. Response Surface Methodology-Current Status and Future Directi-ons[J]. Journal of Quality Technology.1999.31(1):30-74.
    [30]A. C. Shoemaker, K. L. Tsui, C. F. J. Wu. Economical Experimentation Methods for Robust Design[J]. Techno metrics,1991,33:415-418.
    [31]赵众.田口的质量观及其质量工程学[J].江汉石油学院学报,1995,17(2):91-98.
    [32]陈学军.田口方法的思想与原理[J].电子产品可靠性与环境试验,1995,2:34-37.
    [33]苏强.田口质量理论及其在产品质量优化中的应用[J].标准化与质量管理,1998,(11):8-11.
    [34]何桢,张生虎,齐二石.结合RSM和田口方法改进产品/过程质量[J].管理工程学报,2001,15(1):22-25.
    [35]牛勇,袁泉,侯郁.田口方法近年来的发展——稳健性技术开发[J].农机化研究,2001,(1):33-37.
    [36]郑称德.质量工程学的新进展[J].科技进步与对策,2002,(2):101-103.
    [37]周亮,韩玉启,魏世振.田口方法与QFD的综合应用研究[J].科技进步与对策,2003,(2):24-25.
    [38]何桢,韩亚娟,李菊栋.马氏田口两种不同方法的比较研究[J].中国卫生统计,2007,24(5):531-535.
    [39]Derringer G.Suich R. Simultaneous optimization of several response variables[J]. Journal of Quality Technology,1980,12(4):214-219.
    [40]Pignatiello J J Jr. Strategies for robust multi-response quality engineering [J]. IEE Transaction,1993,25 (3):5-15.
    [41]Artiles-leon N. A pragmatic approach to multi-response problems using loss functions[J]. Quality Engineering,1996~1997,9(2):213-220.
    [42]A.Jeang. Tolerance chart optimization for quality and cost[J]. International Journal of Production Research,1998,36 (11):2969-2983.
    [43]R.Plante. Multivariate tolerance design for a quadratic design parameter model[J]. IEE Transactions,2002,34 (6):565-571.
    [44]徐济超,马义中.多指标稳健设计质量特性的度量[J].系统工程理论与实践,1999,(8):45-48.
    [45]马义中等.改进的多变量质量损失函数及其实证分析[J].系统工程,2002,20(4):54-58.
    [46]魏世振,韩玉启,陈传明.基于信噪比的多元质量损失函数研究[J].管理工程学报,2002,(4):4-7.
    [47]倪自银,魏世振,韩玉启.基于非对称损失的过程均值设计研究[J].运筹与管理,2004,13(3):126-131.
    [48]曹衍龙,杨将新,吴昭同等.模糊质量损失模型的建立与应用[J].农业机械学报,2004,35(4):132-135.
    [49]程岩,吴喜之.基于非对称损失函数的参数设计[J].应用概率统计,2005,21(4):443-448.
    [50]潘尔顺,李庆国.田口损失函数的改进及在最佳经济生产批量中应用[J].上海交通大学学报,2005,39(7):1119-1122.
    [51]王伯平,张会,景大英.分段曲线质量损失模型的研究[J].农业机构学报,2007,38(2):150-152.
    [52]王军平,陶华,李建军.一种建立多参数质量损失模型的数学方法[J].西北工业大学学报,2001,19(3):390-393.
    [53]张晶,黄美发,钏艳如等.基于信噪比多元质量损失和制造成本的并行公差设计[J].现代制造工程,2006,(1):10-13.
    [54]俞磊,孙学静,刘飞.基于反馈调整的自相关过程质量损失分析[J].控制工程,2008,15(3):273-278.
    [55]樊树海,肖田元,孙浩等.多元产品质量损失模型的建立与仿真[J].工业工程与管理,2008,(2):15-18.
    [56]李跃波,周树民.一种新的损失函数[J].武汉工业大学学报,1999,21(4):86-94.
    [57]徐兴忠.损失函数的选择[J].应用概率统计,1994,10(2):183-190.
    [58]王建军,张晟义.质量损失的成因分析及估算[J].青海大学学报(自然科学版), 1998,16(6):40-42.
    [59]Rahim M A, Al-Sultan K S. Joint determination of the target mean and variance of a process[J].Journal of Quality Maintenance Engineering.2000,6(3):192-199.
    [60]Linda Lee Ho. Roberto C Quinino. Optimum mean location in a poor-capability process[J]. Quality Engineering,2003,16(2):257-263.
    [61]Rahim M A, Shaibu A B. Economic selection of the mean and upper limit for a canning problem with limited capacity [J].Process Control and Quality.2000.11(5):369-381.
    [62]Jirarat Teeravaraprug, Byung Rae Cho. Designing the optimal process target levels for multiple quality characteristics[J]. International Journal of Production Research,2002,40(1): 37-54.
    [63]Chen C H. Chou C Y. Determining the optimum process mean of a one-sided specification limit[J]. International Journal of Advanced Manufacturing Technology, 2002,20:439-441.
    [64]Chen C H. Determining the optimum process mean of a one-sided specification limit with the linear quality loss function of product[J]. Journal of Applied Statistics,2004, 31(6):693-703.
    [65]Min-Koo Lee, Sang-Boo Kim, Hyuck-Moo Kwon. Economic selection of mean value for a filling process under quadratic quality loss[J]. International Journal of Reliability.Quality and Safety Engineering,2004.11(1):81-90.
    [66]林琳,吴成锋.基于田口质量损失函数的SEA模型研究[J].价值工程,2007,(7):96-98.
    [67]C.H.Chen, C.-Y. Chou, Determining the Optimum Manufacturing Target Based on an Asymmetric Quality Loss Function [J]. Int J Adv Manuf Technol,2003,(3):193-195.
    [68]Chung-ho Chen, Chao-Yu Chou, Set the Optimum Process Parameters Based on Asymmetric Quality Loss Function [J]. Quality & Quantity,2004,38:75-79.
    [69]Chung-ho Chen, Chao-Yu Chou, Determining a One-Sided Optimum Specification Limit under the Linear Quality Loss Function [J]. Quality & Quantity,2005,39:109-117.
    [70]YEN-CHANG CHANG, WEN-LIANG HUNG, LINEX Loss Functions with Applications to Determining the Optimum Process Parameters [J]. Quality & Quantity,2007, 41:291-301.
    [71]Wei-Ning Pi, Chinyao Low, Supplier evalution and selection using Taguchi loss functions [J]. Int J Adv Manuf Technol,2005,26:155-160.
    [72]Wei-Ning Pi, Chinyao Low, Supplier evaluation and selection via Taguchi loss functions and an AHP [J]. Int J Adv Manuf Technol,2006,27:625-630.
    [73]冯怡.质量损失理论在供应商选择中的应用[J].上海轻工业,2005,(3):24-26.
    [74]W.M.Chan. R.N.Ibrahim, Evaluating the quality level of a product with multiple quality characteristics,[J]. Int J Adv Manuf Technol,2004,24:738-742.
    [75]Chung-Ho Chen, Determining the optimum process mean for a mixed quality loss function [J]. Int J Adv Manuf Technol,2006,28:571-576.
    [76]M.F.Huang, Y.R.Zhong, Z.G.Xu, Concurent process tolerance design based on minimum product manufacturing cost and quality loss [J]. Int J Adv Manuf Technol.2005.25:714-722.
    [77]Byung Rae CHO, Michael D. PHILLIPS, Jami KOVACH, Designing the optimum configurations of circular and spherical product specifications for multiple quality characteristics [J]. Journal of Systems Science and Systems Engineering,2005,14(4): 385-399.
    [78]QIANMEI FENG, KAILASH C. KAPUR, Economic development of specifications for 100% inspection based on asymmetric quality loss functions [J]. IIE Transaction,38,2006: 659-669.
    [79]Derong Liu, Ying Cai, Taguchi Method for Solving the Economic Dispatch Problem With Nonsmooth Cost Functions [J].IEEE TRANSACTIONS ON POWER SYSTEMS,2005, 20(4):2006-2014.
    [80]CAO Yan-long, MAO Jian, YANG Jiang-xin, WU Zhao-tong, WU Li-qun, A Robust Tolerance Design Method Based on Fuzzy Quality Loss [J]. Front. Mech. Eng. China,2006, (1):101-105.
    [81]J. Antony, Simultaneous Optimisation of Multiple Quality Characteristics in Manufacturing Process Using Taguchi's Quality Loss [J]. Int J Adv Manuf Technol,2001,17: 134-138.
    [82]Yizhong MA, Fengyu ZHAO, An Improved Multivariate Loss Function Approach to Optimization [J]. Journal of Systems Science and Systems Engineering,2004,13(3):318-325.
    [83]W.M.Chan, R.N.Ibrahim, P.B.Lochert, Quality evaluation model using loss function for multiple S-type quality characteristics [J]. Int J Adv Manuf Technol,2005,26:98-101.
    [84]C.-Y. Chou, H.-R. Liu, C.-H. Chen, X.-R. Huang, Economic-Statistical Design of Multivariate Control Charts Using Quality Loss Function [J]. Int J Adv Manuf Technol,2002, 20:916-924.
    [85]Kun-Lin Hsieh, Lee-Ing Tong, Incorporating process capability index and quality loss function into analyzing the process capability for qualitative data [J]. Int J Adv Manuf Technol,2006,27:1217-1222.
    [86]Chun Chen, Liping Zhao, YiYong Yao, Research of Multi-operation Quality Control based on Minimum Quality Loss [C].IEEE. International Conference on Automation Science and Engineering,2006:437-441.
    [87]Nuland Y V. Do you have doubts about the measurement Result, too? [J]. Quality Engineering,1993,6 (1):99-133.
    [88]Abraham B. Control charts and measurement error [J]. ASQC Technical Conference Transactions,1977.31(2):370-374.
    [89]Kanazuka T. The effect of measurement error on the power of X-bar R charts [J]. Journal of Quality Technology,1986,18 (1):91-95.
    [90]Mittag H, Stemann D. Gauge imprecision effect on the performance of the X-bar S control chart[J].Journal of Applied Statistics,1998,25 (3):307-317.
    [91]Steiner S H. Statistical process control using two measurement systems [J].Technometrics,2000,42(2):179-187.
    [92]Taguchi G, Elsayed, Hsiang. On-line quality control for productive systems[M]. McGrow:Hill Book Company,1988.
    [93]Taguchi G.. off-line and On-line Quality Control System. International Conference on Quality Control.Tokyo, Japan,1978.
    [94]Taguchi G. and Wu Y. Introduction to Off-line Quality Control. Central Japan Quality Control Association, Japan,1979.
    [95]Taguchi G and Y. Wu. Introduction to off-line Quality Control. Central Japan Quality Association, Nagoya,Japan,1980.
    [96]Taguchi G. Quality Evaluation for Quality Assurance. American Supplier Institute,1984.
    [97]Taguchi G. On-line Quality Control during Production. Tokyo:Japanese Standards Association,1981.
    [98]Kackar R. N.. Off-line Quality Control, Parameter Design, and the Taguchi Methods [J].Journal of Quality Technology,1985,17(8):176-209.
    [99]Kapur K C. Signal-to-noise ratio development for quality engineering [J]. Quality and Reliability Engineering International,1998,9(4):133-141.
    [100]Kapur K C. Product and process design optimization by design of experiments using Taguchi methods. Earthmoving Industry Conference,USA,1980.
    [101]Taguchi G. Quality Engineering in Japan[J]. Communication in statistics-Theory and Methods,1985,14(10):2785-2801.
    [102]V.Hubka. Design for Quality and Design Methodology [J]. Journal of Engineering Design,1992,3(1):151-154.
    [103]Taguchi G. Introduction to Quality Engineering, Asian Productivity Organization, Tokyo,1986.
    [104]V. N. Nair. Taguchi's Parameter Design:A Panel Discussion, Technometrics,1992, 34(2):121-161.
    [105]R. H. Lochner. The Advantages of Taguchi Methods[J], Quality Engineering,1991, 13(4):537-539.
    [106]Pignatiello J. and Ramberg J.S. Discussion of Off line quality control, parameter design, and the Taguchi method' by kicker R. H.[J].Journal of Quality Technology,1985,17:198-206.
    [107]Pignatiello J.and Ramgerg J.S.(1991), Top ten triumphs and tragedies of Genichi Taguchi, quality Engineering,4(2):211-225.
    [108]Khattree R. Robust Parameter Design:A Response Surfbce Approach[J]. Journal of Quality Technology,1996,28(2):187-198.
    [109]Kusiak A. And Feng E. X. Robust Tolerance Design for Quality, Journal of Eng. For Industry,1996,118:166-169.
    [110]Belagunal A. D., Zhang S. Robust Mechanical Design Though Minimum Sensitivity. Trans. Of the ASME,Journal of Mech. Design,1992,114:213-217.
    [110]Emch G, Parkinson A. Robust Optimal Design for Worst-case Tolerances, thrans. Of the ASME, J. of Mech. Design,1994,116:1019-1025.
    [111]Maghsppdloo Saeed. The Exact Relation of Taguchi's Signal-to-Noise Ratio to His Quality Loss Function[J]. Journal of Quality Technology,1990,22(4):57-67.
    [112]BIPM、IEC、IFCC、ISO、IUPAC、IUPAP、OIML.Guide to the expression of uncertainty in measurement[M],corrected and reprinted,1995.
    [113]Shao Wei Gong, Weighted Monte-Carlo experimental measurement and integrated data treatment[J]Measurement,2004,36(2):143-153.
    [114]Peter M.Lee.Bayesian Statistics. An introduction[M], OxFord University Press.1996.
    [115]K. Weise and W. Woger. A Bayesian theory of measurement uncertainty [J], Measurement Science and Technology,1992,(3):1-11.
    [116]K. Weise and W. Woger. Removing model and data non-conformity in measurement evaluation[J], Measurement Science and Technology,2000,(11):1649-1658.
    [117]V. Tuninsky and W. Woger. Prior information in product-RATIO measurements [M].IMEKO,2000.
    [118]V. Tuninsky and W. Woger. Bayesian approach to recalibration[J]. Metrologia, 1997,34:459-465.
    [119]Ignacio Lira and W. Woger. Bayesian evaluation of the standard uncertainty and coverage probability in a simple measurement model[J]. Measurement Science and Technology,2001,(12):1-8.
    [120]Giulio D'Agostini. Bayesian reasoning in data analysis[J].World Scientific Publishing CO.,2003,(6):250-280.
    [121]C.Soize and H.Chebli. Random uncertainties model in dynamic substructuring using a nonparametric probabilistic model [J].Journal of Engineering Mechanics,2003,129 (4):449-457.
    [122]Lee Barford. Sequential Bayesian bit error rate measurement [J].IEEE Transactions on Instrumentation and Measurement,2004,53(4):947-954.
    [123]G A Kyriazis and M L R de Campos. Bayesian inference of linear sine-fitting parameters from integrating digital voltmeter data[J]. Measurement Science and Technology,2004,15(2):347-352.
    [124]Raul R Cordero and Pedro Roth. Assigning probability density function in a context of information shortage[J].Metrologia,2004,41(4):122-125.
    [125]刘智敏.不确定度及其实践[M].北京:中国标准出版社,2000,6.
    [126]沙定国.误差分析与测量不确定度评定[M].北京:中国计量出版社,2003,8.
    [127]陶国智,卢荣胜,叶声华.动态测量误差的均方定义与组成成份分析[J].计量学报,2002,23(3):233-236.
    [128]陈晓怀.测量系统不确定度分析及其动态性研究[J].计量学报,2002,23(3):237-240.
    [129]殳伟群.动态测量不确定度问题初探[J].计量学报,2003,24(3):245-248.
    [130]王立吉.测量误差与不确定度表述中的若干问题[J].计量学报,1998,(2):79-82.
    [131]Hong S H, Elsayed E A. The optimum mean for processes with nomally distributed measurement error [J]. Journal of Quality Technology,1999,31(3):338-344.
    [132]Ken Stout. Quality Control in Automation, Kogan Page Ltd,1985.
    [133]Bertrand L. Hansen and P. M. Ghare. Quality Control and Application, Prentice-Hall, Inc.1987.
    [134]D. C. Montgomery. Introduction to Statistical Quality Control, Wiley,1991.
    [135]W. A. Shewhart. Economic Control of Quality and Manufactured Products[M], New York:Van Nostrand,1931.
    [136]S. W. Roberts. Control Chart Tests Based on Geometric Moving Averages[J], Technometrics,1959,(1):239-251.
    [137]J.S.Hunter.The Exponemtially Weighted Moving Averages[J], Journal of Quality Technology,1959,18:203-210.
    [138]Duncan A J. The economic design of x charts used to maintain current control of a process[J].Journal of the American Statistical Association,1956,51:228-242.
    [139]Montgomery D C. The economic design of control charts [J]. Journal of Quality Technology,1980,12:75-87.
    [140]Ho C, Case K E. Economic design of control charts:a literature review for 1981-1991 [J].Journal of Quality Technology,1994.26:1-78.
    [141]Alexander S M, Dillman M A, Usher J S, Damodaran B. Economic design of control charts using the Taguchi loss function[J].Computers and Industrial Engineering,1995, 28(3):671-679.
    [142]Saniga E M. Economic statistical control chart designs with an application to X and R charts[J].Technometrics,1989,31(3):313-320.
    [143]Montgomery D C, Woodall W H. A discussion on statistically based process monitoring and control[J]. Journal of Quality Technology,1997,29:121-162.
    [144]Bai D S, Choi I S.X and R control charts for skewed populations[J]. Journal of QualityTechnology,1995,27(2):120-131.
    [145]He Zhen, Qi Ershi, Liu Zixian, Quality Improvement Through SPC/DOE in SMT Manufacturing [J]. IEEE,2000,855-858.
    [146]Joel Dunsmore, New Methods & Non-Linear Measurements for Active Differential Devices, [J]. IEEE MTT-S Digest,2003,1655-1658.
    [147]Jianxin Roger Jiao, Petri T. Helo, Optimization design of a CUSUM control chart based on taguchi's loss function [J]. Int J Adv Manuf Technol,2008.35:1234-1243.
    [148]Gibra I N. Optimal control of processes subject to linear trends[J]. Journal of Industrial Engineering,1967,18(1):34-41.
    [149]Rahim M A, Banerjee P K. Optimal production run for a process with random linear drift[J]. Omega,1988,16(4):347-351.
    [150]Al-Sultan k S, Ell-Fawzan M A. An extxnsion of Rahim and Banerjee's model for a process with upper specification limits[J]. International Journal Production Economics,1997, 53(3):265-280.
    [151]A1-Sultan K S,.Ell-Fawzan M A. Variance reduction in a process with random linear drift[J]. International Journal of Production Research,1997,35(6):1523-1533.
    [152]Chen S L, Chung K J. Determination of the optimal production run and the most profitable process mean for a production process[J]. International Journal of Production Research,1996,34(7):2051-2058.
    [153]Drezner Z, Wesolowsky G O. Optimal control of a linear trend process wity quadratic loss[J]. ⅡE Transactions,1989,21(1):66-72.
    [154]彭美春,张宗胜.基于预防的工序质量控制方法的研究[J].工业工程,2003,6(1):59-61.
    [155]于涛,沈荣芳.工序质量控制系统的设计与开发[J].工业工程,2001,4(3):1-5.
    [156]于涛.在线质量控制系统实施研究[J].机械设计与制造,2001,(2):26-28.
    [157]Richard K. Burdick, You-Jin Park, Douglas C. Montgomery. Confidence Intervals for Misclassification Rates in a Gauge R&R Study[J].Journal of Quality Technology 2005,37(4):294-303.
    [158]Burdick,R.K, Borror. C.M, Montgomery. D.C.A Review of Methods for Measurement Systems Capability Analysis [J].Journal of Quality Technology,2003,35:342-354.
    [159]Richard K.Burdick, Greg A.Elizabeth Allen, Greg A.Larsen. Comparing Variability of Two Measurement Processes Using R&R Studies[J]. Journal of Quality Technology, 2002.34(1):97-105.
    [160]Van Den Heuvel E.R, Trip A. Evaluation of Measurement System with a Small Number of Observers[J].Quality Engineering.2002.15:323-331.
    [161]Mader D.P, Prins J, Lampe R.E. The Economic Impact of Measurement Error[J]. Quality Engineering,1999,(11):563-574.
    [162]Vardeman,VanValkenburg. Two Way Random Analysis and Gauge R&R Studies[J].Technometric.1999.41:202-211.
    [163]Cox M, Dainton M, Harris P, Ridler N. The Evaluation of Uncertainties in the Analysis of Calibration Data[J]. Instrumentation and Measurement Technology Conference, 1999,(2):1093-1098.
    [164]R.V. Leon and R.W. Mee, Blocking multiple sources of error in small analytic studies[J]. Quality Engineering,2000,(12):497-501.
    [165]Stuckman B E, Perttunen C D, Usher J S, et al. Stochastic Modeling of Calibration Drift in Electrical Meters[C].Instrumentation and Measurement Technology Conference, 1991:530-536.
    [166]Morris A S. Measurement and Calibration for Quality Assurance [M]. Englewood Cliffs, NJ:Prentice-Hall,1991.
    [167]Bobbio A, Tavella P, Montefusco A, et al. Monitoring the Calibration Status of a Measuring Instrument by a Stochastic Model [J].IEEE Transactions on Instrumentation and Measurement,1997,46 (4):747-751.
    [168]余学锋,钱成,文海.测量仪器校准间隔的确定及其模型[J].计量学报,2002,23(1):74-77.
    [169]刘书庆,唐家驹.计量器具检定周期定量确定方法的探讨[J].计量技术,1994,(1):27-29.
    [170]Carbone P. Performance of simple response method for the establishment and adjustment of calibration intervals [J]. Instrumentation and Measurement.2004, 53(3):730-735.
    [171]Kuo Huang Lin,Bin Da Liu. A Gray System Modeling Approach to the Prediction of Calibration Intervals [J]. Instrumentation and Measurement,2005,54 (1):297-304.
    [172]孙群,孟晓风,王国华.基于等维新息灰色马尔可夫模型的校准间隔预测[J].传感技术学报,2007,20(5):1095-1099.
    [173]孙群,赵颖,孟晓风.基于新陈代谢GM(1,1)模型的校准间隔预测[J]测试技术学报,2007,21(3):232-235.
    [174]赵瑞贤,孟晓风,王国华.基于灰色马尔柯夫预测的测量仪器校准间隔动态优化[J].计量学报,2007,28(2):184-187.
    [175]李华超,陈春俊.截尾漂移曲线法调整非强制计量器具的检定周期[J].计量技术,2007,(10):52-54.
    [176]苏海涛,杨世元,董华等.计量器具检定周期灰色动态模型及应用研究[J].应用科学学报,2007,25(1):81-84.
    [177]Jenny Wirandi, Wlodek Kulesza, Alexander Lauber, Human factor validation in an industrial measurement system [J]. ScienceDirect, measurement,2008,41:705-718.
    [178]Hua Liang, Weixing Song, Improved estimation in multiple linear regression models with measurement error and general constraint [J]. Journal of Multivariate Analysis, 2008,8(3):1-16.
    [179]Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens, Why are Nonlinear Microwave Systems Measurements so Involved [J]. IEEE Transactions on Instrumentation and Measurement,2004,53(3):726-729.
    [180]K. Milicevic, D. Pelin, I. Flegar, Measurement system for model verification of nonautonomous second-order nonlinear systems [J]. ScienceDirect Chaos Solitons and Fractals,2008,38:939-948.
    [181]Pu Xiong-Zhu, Zhu Ming-Wu, Dynamic Response of Nonlinear Measurement systems [J].IEEE,1994:1147-1150.
    [182]Claudio De, Stefano De Falco, Annalisa Liccardo and Rosario Morello, A Technique Based on Uncertainty Analysis to Qualify the Design of Measurement Systems [J]. IEEE, 2005, (4):97-102.
    [183]P.Arpaia, Experimental optimization of flexible measurement systems [J]. IEE Proc.-Sci, Meas. Technol.,1996,14(2):77-84.
    [184]Lara J. Martin, John Frei, Application of Statistical Tools and Methods for High Density Substrate Process Development [C]. Electronic Components and Technology Conference, 2002:690-699.
    [185]李家文,李佳,陈宇航等.AFM非线性测量的影响因素分析[J].电子显微学报,2009,(2):42-45.
    [186]孙海燕,于晶晶.一类非线性测量误差模型的保形法曲率及其局部影响[J].统计与决策,2007,23:8-11.
    [187]宗序平,孟国明,王海斌等.非线性测量误差模型的影响分析[J].应用概率统计,2003,(1):33-41.
    [188]F.E. Grubbs, Errors of measurement, precision, accuracy and the statistical comparison of measuring instruments [J].Technometrics,1973,15:53-66.
    [189]F.E. Grubbs, Grubbs estimators (Precision and accuracy of measurement)[J]. Encyclopedia of Statistical Sciences,1983, (3):542-549.
    [190]L.G. Blackwood and E.L. Bradley, An omnibus test for comparing two measuring devices[J]. Journal of Quality Technology,1991,23:12-16.
    [191]D.M. Roche, Robust statistical analysis of inter-laboratory studies. Biometrica,1983, (10):273-277.
    [192]T. Deutler, Grubbs-type estimators for reproducibility variances in an interlaboratory test study [J]. Journal of Quality Technology,1991, (4):324-335.
    [193]J.S. Hunter. Measurement error[J].Encyclopedia of Statistical Sciences,1985,(5):378-380.
    [194]H.R. Singh. Producer and consumer risks for asymmetrical test and specification[J]. JASA,1966.61:505-513.
    [195]N. Doganaksoy, Assessment of impact of measurement variability in the presence of multiple sources of product variability [J]. Quality Engineering,2001,13(2):83-89.
    [196]Zdenek Matyas and Martti Aro. HV Impulse Measuring Systems Analysis and Qualification by Estimation of Measurement Errors via FFT, Convolution, and IFFT[J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT.2005,54(5):2013-2019.
    [197]C. Ciofi, M. De Marinis and B. Neri, Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits[J]. IEEE Trans. Instr. Meas.,1997.46:798-793.
    [198]C. Ciofi, M. De Marinis and B. Neri, Wafer level measurement system for SARF characterization of metal lines[J].Microelectron. Reliab.,1996,36:1851-1855.
    [200]M. Macucci and B. Pellegrini, Very sensitive measurement method of electron device current noise[J], IEEE Trans. Instrum. Meas.,1991,40:7-12.
    [201]M. Sampietro, L. Fasoli and G. Ferrari. Spectrum analyzer with noise reduction by cross correlation technique on two channels[J], Rev. Sci. Instrum..1999,70:2520-2525.
    [202]E. Rubiola and V. Giordano, A correlation-based noise measurement scheme showing sensitivity below the thermal floor, Proceedings of International Conference on Noise in Physical Systems and 1/f Fluctuations, Hong Kong,1999:483-486.
    [203]C. Ciofi, F. Crupi and C. Pace, A new method for high sensitivity noise measurements[J], IEEE Trans. Instr. Meas..2002,51:656-659.
    [204]A. M. Yassine and C. T. Chen, Electromigration noise measurements using a novel AC/DC wafer-level noise measurement system[J].IEEE Trans. Elect. Dev.,1997,44:180-184.
    [205]K. Daniel, H. Morten, and L. Sture, Wide area system monitoring and control[J]. IEEE Power and Energy Magazine.2004,(2):68-76.
    [206]T. G. Jiang, H. L. Gao, and B. X. Liu, Study on Communication Scheme for Wide Area Measurement Systems[J]. Proceedings of the EPSA.2004.16(3):57-60.
    [207]J. S.Thorp, A. G.Phadke, and K. J. Karimi, Real Time Voltage-phasor Measurements for Static State Estimation[J].IEEE Transactions on Power Apparatus and Systems,1985,10:3098-3107.
    [208]H. Z. Cheng, Q. S. Yuan, and Y. H. Wang, et al.A State Estimation Method of Power Systems Based on Equivalent Current Measurement Transformation[J]. Automation of Electric Power System,2000,24(14):25-29.
    [209]Mohan P. Rao.A performance measurement system using a profit-linked multi-factor measurement model[J]. Industrial Management & Data Systems,2006,106(3):362-379.
    [210]ZHANLUE ZHAO, X.RONG LI. VESSELIN P.JILKOV, Best linear unbiased filtering with nonlinear measurements for target tracking [J]. IEEE Trans. on Aerospace And Eelectronic Systems,2004,40(4):1324-1336.
    [211]Ignacio Vidal, Pilar Iglesias, Comparison between a measurement error model and a linear model without measurement error [J]. Computational Statistics and Data Analysis, 2008,53:92-102.
    [212]Ori Davidov, Vladimir Griskin, A note on constrained estimation in the simple linear measurement error model [J]. ScienceDirect,Statistics&Probability Letters,2008,78: 508-517.
    [213]Kimmo Vehkalahti, Simo Puntanen, Lauri Tarkkonen, Effects of measurement errors in predictor selection of linear regression model [J]. ScienceDirect, Computational Statistics&Data analysis,2007,52:1183-1195.
    [214]Sansli Senol, Measurement system analysis using designed experiments with minimum α—β Risks and n [J]. measurement,2004,36:132-141.
    [215]B.J.P.Roset. W.P.M.H.Heemels, M.Lazar.H.Nijmeijer. On robustness of constrained discrete-time systems to state measurement errors [J]. automatica,2008,44:1162-1165.
    [216]Hira L.Koul, Weixing Song, Regression model checking with Berkson measurement errors [J]. Journal of Statistical Planning and Infernce,2008,138:1615-1628.
    [217]Shalabh. Gaurav Garg. Neeraj Misra. Restricted regression estimation in measurement error models [J]. Computational Statistics & Data Analysis,2007,52:1149-1166.
    [218]W.M.Chan.R.N.Ibrahim.P.B.Lochert, Evaluating the product quality level under multiple L-type quality characteristics [J]. Int Adv Manuf Technol,2005,27:90-95.
    [219]JJF 1064-2004,坐标测量机校准规范,中华人民共和国国家计量技术规范.
    [220]董双财.测量系统分析——理论、方法和应用[M].北京:中国计量出版社,2006.
    [221]L.Joyd S. Nelson.Monitoring reduction in variation with a range chart [J]. Journal of Quality Technology,1990,22(2):163-165.

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