搜索页_ Y.Mu@student.liverpool.ac.uk class= auth_mail title= E-mail the corresponding author

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Elsevier电子期刊(2)

在“Elsevier电子期刊”中，命中：2条，耗时：0.1519287 秒

在所有数据库中总计命中：2条

1.Effects of rapid thermal annealing on structural, chemical, and electrical characteristics of atomic-layer deposited lanthanum doped zirconium dioxide thin film on 4H-SiC substrate

作者：Way Foong Lim^a ; ^b ; ^{wayfoong317@yahoo.com.sg" class="auth_mail" title="E-mail the corresponding author} ; Hock Jin Quah^a ; ^b ; ^{jinquah1st@hotmail.com" class="auth_mail" title="E-mail the corresponding author} ; Qifeng Lu^c ; ^{Qifeng@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Yifei Mu^c ; ^{Y.mu@student.liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Wan Azli Wan Ismail^d ; ^{azli.ismail@mimos.my" class="auth_mail" title="E-mail the corresponding author} ; Bazura Abdul Rahim^d ; ^{bazura@mimos.my" class="auth_mail" title="E-mail the corresponding author} ; Siti Rahmah Esa^d ; ^{rahmah.esa@mimos.my" class="auth_mail" title="E-mail the corresponding author} ; Yeh Yee Kee^d ; ^{yy.kee@mimos.my" class="auth_mail" title="E-mail the corresponding author} ; Ce Zhou Zhao^c ; ^e ; ^{cezhou.zhao@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Zainuriah Hassan^a ; ^b ; ^{zai@usm.my" class="auth_mail" title="E-mail the corresponding author} ; Kuan Yew Cheong^a ; ^f ; ^{srcheong@usm.my" class="auth_mail" title="E-mail the corresponding author} ; ^{ckuanyew@yahoo.com" class="auth_mail" title="E-mail the corresponding author}

关键词：Lanthanum doped zirconium oxide ; Atomic layer deposition ; Rapid thermal annealing ; X-ray photoelectron spectroscopy ; Time-of-flight secondary ion mass spectrometry

刊名：Applied Surface Science

出版年：2016

2.Real-time and on-site γ-ray radiation response testing system for semiconductor devices and its applications

作者：Yifei Mu^a ; ^{Y.Mu@student.liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Ce Zhou Zhao^b ; ^{cezhou.zhao@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Yanfei Qi^b ; ^{yanfei.qi01@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Sang Lam^b ; ^{s.lam@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Chun Zhao^c ; ^{garyzhao@ust.hk" class="auth_mail" title="E-mail the corresponding author} ; Qifeng Lu^a ; ^{qifeng@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Yutao Cai^b ; ^{yutao.cai@xjtlu.edu.cn" class="auth_mail" title="E-mail the corresponding author} ; Ivona Z. Mitrovic^a ; ^{ivona@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Stephen Taylor^a ; ^{s.taylor@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author} ; Paul R. Chalker^d ; ^{pchalker@liverpool.ac.uk" class="auth_mail" title="E-mail the corresponding author}

关键词：On-site radiation response ; Real-time I&ndash ; V/C&ndash ; V test ; High-κ dielectrics ; Total-dose induced defects ; HfO2

刊名：Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

出版年：2016

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